| Number | Name | Date | Kind |
|---|---|---|---|
| RE33931 | Witney | May 1992 | |
| 4639073 | Yip et al. | Jan 1987 | |
| 4778233 | Christenson et al. | Oct 1988 | |
| 4796038 | Allen et al. | Jan 1989 | |
| 4797696 | Allen et al. | Jan 1989 | |
| 4956650 | Allen et al. | Sep 1990 |
| Entry |
|---|
| Michael L. Rieger, James A. Schoeffel, Paul A. Warkentin, 1988 SPIE Santa Clara Symposium Conference 922-Optical Microlithography VII, Image Quality Enhancements for Raster Scan Lithography, 10 pages. |