Number | Name | Date | Kind |
---|---|---|---|
RE33931 | Witney | May 1992 | |
4639073 | Yip et al. | Jan 1987 | |
4778233 | Christenson et al. | Oct 1988 | |
4796038 | Allen et al. | Jan 1989 | |
4797696 | Allen et al. | Jan 1989 | |
4956650 | Allen et al. | Sep 1990 |
Entry |
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Michael L. Rieger, James A. Schoeffel, Paul A. Warkentin, 1988 SPIE Santa Clara Symposium Conference 922-Optical Microlithography VII, Image Quality Enhancements for Raster Scan Lithography, 10 pages. |