Number | Name | Date | Kind |
---|---|---|---|
4085377 | Turski et al. | Apr 1978 | |
4719369 | Asano et al. | Jan 1988 | |
4783697 | Benenati et al. | Nov 1988 | |
4803110 | Ahn et al. | Feb 1989 | |
5029284 | Feldbaumer et al. | Jul 1991 | |
5134311 | Biber et al. | Jul 1992 | |
5227677 | Furman | Jul 1993 | |
5324999 | Hunley et al. | Jun 1994 | |
5341039 | Fukumoto | Aug 1994 |
Entry |
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Journal of Electronic Testing: Theory and Applications, vol. 2, 1991--Article entitled "IEEE Standard 1149.1-1990 on Boundary Scan: History, Literature . . . Status", by R. Bennetrs and A. Osseyran, pp. 11-25. |
IBM Journal of Search and Development, vol. 34, No. 2/3, Mar./May 1990, article entitled "Boundary-Scan Design Principles For Efficient LSSD ASIC Testing" by R. W. Bassett et al, pp. 339-354. |