The present disclosure relates to a manufacture method of a coil component, and a coil component.
A coil component is traditionally present that is described in JP 2012-248630. This coil component includes a substrate, spiral wirings disposed on both sides of the substrate, an insulating resin covering the substrate and the spiral wirings, and a magnetic resin covering the insulating resin.
The inventor found that a problem as below arose when the traditional coil component was actually manufactured and used. Because the insulating resin covered the substrate, a thermal stress was generated by a difference in the linear expansion coefficient between the substrate and the insulating resin caused by a thermal impulse or a load during reflowing. The thermal stress caused layer detachment between the substrate and the insulating resin.
The object of the present disclosure is to provide a manufacture method of a coil component whose layer detachment caused by the thermal stress is prevented, and a coil component.
To solve the problem, the manufacture method of the coil component of the present disclosure includes the steps of
bonding a dummy metal layer onto a mounting base,
stacking a base insulating resin on the dummy metal layer,
stacking a first spiral wiring and a first insulating resin in this order on the base insulating resin to cover the first spiral wiring with the first insulating resin and stacking a second spiral wiring and a second insulating resin in this order on the first insulating resin to cover the second spiral wiring with the second insulating resin, to thereby form a coil substrate,
detaching the mounting base from the dummy metal layer at a bonding face between the mounting base and the dummy metal layer,
removing the dummy metal layer from the coil substrate, and
covering the coil substrate with a magnetic resin.
According to the manufacture method of the coil component of the present disclosure, the insulating resin of the coil substrate is not in contact with the mounting base because the mounting base is detached from the coil substrate and the coil substrate is covered with the magnetic resin. Any layer detachment can therefore be prevented that is caused by the thermal stress generated by a difference in the linear expansion coefficient between the mounting base and the insulating resin due to a thermal impulse or a load during reflowing.
According to one embodiment of the manufacture method of the coil component, the mounting base includes an insulating substrate and a base metal layer that is disposed on the insulating substrate and that is bonded to the dummy metal layer.
According to the embodiment, the dummy metal layer is bonded to a smooth face of the base metal layer because the dummy metal layer is bonded to the base metal layer of the mounting base. The bonding force between the dummy metal layer and the base metal layer can therefore be weakened and the mounting base can therefore be easily detached from the dummy metal layer.
According to one embodiment of the manufacture method of a coil component, the step of forming the coil substrate includes the steps of
disposing an opening in the base insulating resin to expose the dummy metal layer,
disposing the first spiral wiring on the base insulating resin and disposing a first sacrificial electric conductor that corresponds to an inner flux path, on the dummy metal layer in the opening of the base insulating resin,
thickening the first spiral wiring using plating by directly or indirectly energizing the first spiral wiring and thickening the first sacrificial electric conductor connected to the dummy metal layer using plating by energizing the dummy metal layer,
covering the first spiral wiring and the first sacrificial electric conductor with the first insulating resin,
disposing an opening in the first insulating resin to thereby expose the first sacrificial electric conductor,
disposing the second spiral wiring on the first insulating resin and disposing a second sacrificial electric conductor that corresponds to an inner flux path, on the first sacrificial electric conductor in the opening of the first insulating resin,
thickening the second spiral wiring using plating by directly or indirectly energizing the second spiral wiring and thickening the second sacrificial electric conductor using plating through the first sacrificial electric conductor by energizing the dummy metal layer,
covering the second spiral wiring and the second sacrificial electric conductor with the second insulating resin,
disposing an opening in the second insulating resin to expose the second sacrificial electric conductor, and
removing the first sacrificial electric conductor and the second sacrificial electric conductor to form a hole that corresponds to an inner flux path, wherein
at the step of covering the coil substrate with the magnetic resin, the hole is filled with the magnetic resin to configure the inner flux path using the magnetic resin.
According to the embodiment, the first spiral wiring and the first sacrificial electric conductor are disposed at one step. The first spiral wiring and the first sacrificial electric conductor are both electric conductors and can therefore be formed at one step. The same is applied to the case where the second spiral wiring and the second sacrificial electric conductor are disposed. The total is thereby small of the tolerance of the position of the hole (the sacrificial electric conductor) for the inner flux path relative to the insulating resin and the tolerance of the position of the spiral wiring relative to the insulating resin. As a result, the cross-sectional area of the inner flux path can be set to be large and a higher inductance value can be acquired.
The first spiral wiring is thickened using plating by directly or indirectly energizing the first spiral wiring and the first sacrificial electric conductor connected to the dummy metal layer is thickened using plating by energizing the dummy metal layer. Any difference can thereby be avoided between the thickness of the first spiral wiring and the thickness of the first sacrificial electric conductor. The depth of the opening thereby becomes small and the formation of the opening becomes easy when the opening is disposed in the first insulating resin that covers the first spiral wiring and the first sacrificial electric conductor to expose the first sacrificial electric conductor. The depth of the opening becomes constant when the second spiral wiring and the second sacrificial electric conductor are disposed and the opening is disposed in the second insulating resin. Even when multiple layers are formed, the depth of the opening is constant and the formation of the opening is easy. The shapes of the sacrificial electric conductors disposed in the opening can be set to be same.
A coil component of the present disclosure includes
a base insulating resin,
a first spiral wiring stacked on the base insulating resin,
a first insulating resin that is stacked on the first spiral wiring and that covers the first spiral wiring,
a second spiral wiring that is stacked on the first insulating resin and that is connected to the first spiral wiring through a via wiring extending in the layer stacking direction,
a second insulating resin that is stacked on the second spiral wiring and that covers the second spiral wiring, and
a magnetic resin that covers the base insulating resin, the first insulating resin, and the second insulating resin.
According to the coil component of the present disclosure, no substrate is originally present on which the first and the second spiral wirings are stacked and the insulating resin is not in contact with any substrate because the first spiral wiring and the second spiral wiring are each stacked on the insulating resin. Any layer detachment can therefore be prevented that is caused by the thermal stress generated by a difference in the linear expansion coefficient between the substrate and the insulating resin due to a thermal impulse or a load during reflowing.
According to one embodiment of the coil component, the base insulating resin, the first insulating resin, and the second insulating resin include the same material.
According to the embodiment, because the base insulating resin, the first insulating resin, and the second insulating resin include the same material, any difference in the linear expansion coefficient among the insulating resins can be avoided and any layer detachment of the insulating resins due to a thermal impulse or a load during reflowing can be prevented.
According to one embodiment of the coil component, the cross-sectional shapes in the layer stacking direction of the first spiral wiring and the second spiral wiring are each a convex shape that protrudes in the same direction of the layer stacking direction and that has a curved side face.
According to the embodiment, the cross-sectional shapes in the layer stacking direction of the first spiral wiring and the second spiral wiring are each a convex shape that protrudes in the same direction of the layer stacking direction and that has a curved side face. The first and the second spiral wirings thereby become difficult to be bent against a force in the layer stacking direction and any detachment between the first and the second spiral wirings, and the insulating resins can be suppressed.
According to the manufacture method of a coil component of the present disclosure, any layer detachment caused by the thermal stress can be prevented because the mounting base is detached from the coil substrate.
According to the coil component of the present disclosure, any layer detachment caused by the thermal stress can be prevented because the first and the second spiral wirings are each stacked on the insulating resin.
The present disclosure will be described in detail with reference to depicted embodiments.
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A first to the fourth spiral wirings 21 to 24 are sequentially disposed from the lowest layer to the top layer. The first to the fourth spiral wirings 21 to 24 are each formed in a plane and in a spiral. The first to the fourth spiral wirings 21 to 24 each include a low-resistance metal such as, for example, Cu, Ag, or Au. Preferably, a low-resistance spiral wiring having a narrow pitch can be formed by using Cu plating formed by employing a semi-additive process.
The insulating resin body 35 includes a base insulating resin 30 and a first to a fourth insulating resins 31 to 34. The base insulating resin 30 and the first to the fourth insulating resins 31 to 34 are sequentially disposed from the lowest layer to the top layer. The material of the insulating resins 30 to 34 is, for example, an insulating material including a single material of organic insulating materials including an epoxy-based resin, a bismaleimide, a liquid crystal polymer, and a polyimide, or a combination of the single material and an inorganic filler material such as a silica filler or an organic filler including a rubber-based material. Preferably, all the insulating resins 30 to 34 include the same material. In the embodiment, all the insulating resins 30 to 34 include an epoxy resin that includes a silica filler.
The first spiral wiring 21 is stacked on the base insulating resin 30. The first insulating resin 31 is stacked on the first spiral wiring 21 to cover the first spiral wiring 21. The second spiral wiring 22 is stacked on the first insulating resin 31. The second insulating resin 32 is stacked on the second spiral wiring 22 to cover the second spiral wiring 22.
The third spiral wiring 23 is stacked on the second insulating resin 32. The third insulating resin 33 is stacked on the third spiral wiring 23 to cover the third spiral wiring 23. The fourth spiral wiring 24 is stacked on the third insulating resin 33. The fourth insulating resin 34 is stacked on the fourth spiral wiring 24 to cover the fourth spiral wiring 24.
The second spiral wiring 22 is connected to the first spiral wiring 21 through a via wiring 25 that extends in the layer stacking direction. The via wiring 25 is disposed in the first insulating resin 31. An inner circumferential end 21a of the first spiral wiring 21 and an inner circumferential end 22a of the second spiral wiring 22 are connected to each other through the via wiring 25. An outer circumferential end 21b of the first spiral wiring 21 is connected to an external electrode not depicted. An outer circumferential end 22b of the second spiral wiring 22 is connected to an external electrode not depicted.
The fourth spiral wiring 24 is connected to the third spiral wiring 23 through a via wiring 26 extending in the layer stacking direction. The via wiring 26 is disposed in the third insulating resin 33. An inner circumferential end 23a of the third spiral wiring 23 and an inner circumferential end 24a of the fourth spiral wiring 24 are connected to each other through the via wiring 26. An outer circumferential end 23b of the third spiral wiring 23 is connected to an external electrode not depicted. An outer circumferential end 24b of the fourth spiral wiring 24 is connected to an external electrode not depicted.
The first to the fourth spiral wirings 21 to 24 are arranged centering the same one axis. The first spiral wiring 21 and the second spiral wiring 22 are wound in the same direction, seen from the axis direction (the layer stacking direction). The third spiral wiring 23 and the fourth spiral wiring 24 are wound in the same direction, seen from the axis direction. The first and the second spiral wirings 21 and 22, and the third and the fourth spiral wirings 23 and 24 are each wound in the direction opposite to that of each other, seen from the axis direction.
The cross-sectional shapes in the layer stacking direction of the first to the fourth spiral wirings 21 to 24 are each a convex shape that protrudes in the same direction of the layer stacking direction. The convex shapes of the first to the fourth spiral wirings 21 to 24 respectively include curved side faces 21a to 24a.
Inner faces and outer faces of the first to the fourth spiral wirings 21 to 24 are covered with the insulating resin body 35. The insulating resin body 35 includes holes 35a that each center the same one axis of the first to the fourth spiral wirings 21 to 24.
The magnetic resin 40 covers the insulating resin body 35. The magnetic resin 40 includes inner portions 41 each disposed in a hole 35a of the insulating resin body 35, and an outer portion 42 disposed outside the insulating resin body 35 (on an outer circumferential face, and the upper and the lower end faces). The inner portions 41 each constitute the inner flux path of the coil component 2 and the outer portion 42 constitutes an outer flux path of the coil component 2.
The material of the magnetic resin 40 is, for example, a resin material that includes magnetic substance powder. The magnetic substance powder is a metal magnetic material such as, for example, Fe, Si, Cr, or the like. The resin material is a resin material such as, for example, epoxy. Preferably, the magnetic substance powder is included by 90 wt % or more to improve the properties (the L value and the superimposition property) of the coil component 2. More preferably, two or three types of magnetic substance powder having particle size distributions different from each other are mixed in to improve the filling property of the magnetic resin 40.
A manufacture method of the coil component 2 will be described.
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The base insulating resin 30 is stacked on the dummy metal layer 60 temporarily clamped on the mounting base 50. In this case, the base insulating resin 30 is stacked using a vacuum laminator and is thermally hardened.
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According to the manufacture method of the coil component 2, because the mounting base 50 is detached from the coil substrate 5 and the coil substrate 5 is covered with the magnetic resin 40, the insulating resins 30 to 34 of the coil substrate 5 are not in contact with the mounting base 50. Any layer detachment can therefore be prevented that is caused by the thermal stress generated by a difference in the linear expansion coefficient between the mounting base 50 and the insulating resins 30 to 34 due to a thermal impulse or a load during reflowing.
Because the coil substrate 5 is formed by stacking the insulating resins 30 to 34 and the spiral wirings 21 to 24 on the mounting base 50, thickening the mounting base 50 can reduce any processing strain generated by shrinking of the insulating resins 30 to 34 and the difference in the linear expansion coefficient between the mounting base 50 and the insulating resins 30 to 34. Especially, when the coil substrate 5 is configured to include the multiple layers, higher precision can be realized by effectively reducing the processing strain. Because the mounting base 50 is thereafter detached from the coil substrate 5, the thickness of the coil component 2 can be reduced. An increase of layers and the higher precision can therefore be concurrently established without increasing the thickness of the coil component 2.
Because the coil component 2 can be constituted by the insulating resins 30 to 34 and the spiral wirings 21 to 24, the density of the spiral wirings 21 to 24 can be increased. The L value can therefore be increased and Rdc can be reduced to facilitate enhancement of the performance.
According to the manufacture method of the coil component 2, because the dummy metal layer 60 is bonded to the base metal layer 52 of the mounting base 50, the dummy metal layer 60 is bonded to the smooth face of the base metal layer 52. The bonding force can therefore be weakened between the dummy metal layer 60 and the base metal layer 52, and the mounting base 50 can easily be detached from the dummy metal layer 60.
According to the coil component 2, because the spiral wirings 21 to 24 are respectively stacked on the insulating resins 30 to 34, any substrate on which the spiral wirings 21 to 24 are stacked is not originally present and the insulating resins 30 to 34 are not in contact with the substrate. Any layer detachment can therefore be prevented that is caused by the thermal stress generated by a difference in the linear expansion coefficient between the substrate and the insulating resins 30 to 34 due to a thermal impulse or a load during reflowing.
According to the coil component 2, because all the insulating resins 30 to 34 include the same material, any difference can be avoided in the linear expansion coefficient among the insulating resins 30 to 34 and any layer detachment of the insulating resins 30 to 34 can be prevented that is caused due to a thermal impulse or a load during reflowing.
According to the coil component 2, the cross-sectional shapes in the layer stacking direction of the spiral wirings 21 to 24 are the convex shapes that each protrudes in the same direction in the layer stacking direction and that respectively include the curved side faces 21a to 24a. The spiral wirings 21 to 24 thereby become difficult to be bent against a force in the layer stacking direction and any detachment can be suppressed between the spiral wirings 21 to 24 and the insulating resins 30 to 34.
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According to the manufacture method of the coil component 2A, the first spiral wiring 21 and the first sacrificial electric conductor 71 are disposed at one step. The first spiral wiring 21 and the first sacrificial electric conductor 71 are both electric conductors, and can therefore be formed at the one step. The same is applied to the case where the second to the fourth spiral wirings 22 to 24 and the second to the fourth sacrificial electric conductors 72 to 74 are disposed. The total is thereby less than the tolerance of the position of the hole 35a (the sacrificial electric conductors 71 to 74) for the inner flux path relative to the insulating resins 30 to 34 and the tolerance of the positions of the spiral wirings 21 to 24 relative to the insulating resins 30 to 34. As a result, the cross-sectional area of the inner flux path can be set to be large and a higher inductance value can be acquired.
In contrast, when the step of forming the hole for the inner flux path in the insulating resin and the step of forming the spiral wiring in the insulating resin are executed as separated steps, a degree of distance is necessary between the spiral wiring and the hole taking into consideration the total of the tolerance of the position of the hole relative to the insulating resin and the tolerance of the position of the spiral wiring relative to the insulating resin. The cross-sectional area of the hole is thereby reduced by an area corresponding to the tolerance of the position of the hole and the tolerance of the position of the spiral wiring. As a result, the cross-sectional area of the inner flux path is reduced and acquisition of any high inductance value is difficult.
The first spiral wiring 21 is thickened using plating by directly or indirectly energizing the first spiral wiring 21 and the first sacrificial electric conductor 71 connected to the dummy metal layer 60 is thickened using plating by energizing the dummy metal layer 60. The difference can thereby be avoided between the thickness of the first spiral wiring 21 and the thickness of the first sacrificial electric conductor 71. The depth of the opening 31a is therefore small and the formation of the opening 31a is easy when the opening 31a is disposed in the portion of the first insulating resin 31 covering the first spiral wiring 21 and the first sacrificial electric conductor 71 to expose the first sacrificial electric conductor 71. The depth of the opening 32a is constant when the second spiral wiring 22 and the second sacrificial electric conductor 72 are disposed and the opening 32a is disposed in the second insulating resin 32. Even when the multiple layers are formed, the depths of the openings 31a to 34a are constant and the formation of the openings 31a to 34a is easy. The shapes of the sacrificial electric conductors 71 to 74 disposed in the openings 31a to 34a can be set to be the same.
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The present disclosure is not limited to the disclosed embodiments, and changes can be made to the design thereof within the scope not departing from the gist of the present disclosure. For example, the features of the first embodiment and those of the second embodiment may variously be combined with each other.
In the embodiments, the coil component includes the spiral wirings in the four layers and the insulating resins in the five layers while the coil component only has to include at least the spiral wirings in the two layers (the first and the second spiral wirings) and at least the insulating resins in the three layers (the base insulating resin, and the first and the second insulating resins).
In the embodiments, the mounting base is set to include the insulating substrate and the base metal layer while the mounting base may include only the insulating substrate omitting the base metal layer.
In the embodiments, the coil substrate is formed on the one face of both faces of the mounting base while the coil substrate may be formed on each of both faces of the mounting base. High productivity can thereby be acquired.
Number | Date | Country | Kind |
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2015-126933 | Jun 2015 | JP | national |
This application is a Divisional Application of U.S. patent application Ser. No. 15/180,743 filed Jun. 13, 2016, which claims benefit of priority to Japanese Patent Application 2015-126933 filed Jun. 24, 2015, the entire content of which is incorporated herein by reference.
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Number | Date | Country | |
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20180233279 A1 | Aug 2018 | US |
Number | Date | Country | |
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Parent | 15180743 | Jun 2016 | US |
Child | 15950520 | US |