This application claims priority of Taiwanese Application No. 102133470, filed on Sep. 16, 2013.
This invention relates to a metal-electrodeposited insulator substrate and a method of making the same, such as a method of making a metal-electrodeposited insulator substrate that includes forming sacrificial portions of a conductor stack.
Housings of electronic devices may be formed with electrodeposited metal elements at different regions for purposes, such as to form circuits, decoration, protection elements, all by way of non-limiting example. The housings may be formed of an insulator material, such as a polymer resin, glass, a ceramic material or a composite material. Simultaneous formation of the electrodeposited metal elements on different regions of an insulator housing may be conducted using electroplating techniques. However, when the regions to be electrodeposited have different areas, the electrodeposited metal element formed on the region having a larger area may have a thickness larger than that of the electrodeposited metal element formed on the region having a smaller area. The difference between the thicknesses of the electrodeposited metal elements formed on the regions may be undesirably large when the difference between the areas of the regions is large.
According to certain embodiments of the invention, there may be provided a metal-electrodeposited insulator substrate and a method of making the same that can overcome the aforesaid drawback associated with the prior art.
According to one embodiment of this invention, there may be provided a method of making a metal-electrodeposited insulator substrate. Such a method may include: forming a patterned conductive base layer on a pattern-forming surface of an insulator substrate, such that the patterned conductive base layer has a first continuous conductor part and a second continuous conductor part that is spaced apart from the first continuous conductor part, each of the first and second continuous conductor parts having an electroplating surface, the first continuous conductor part having a target portion and at least one sacrificial portion that extends from the target portion; subjecting an assembly of the patterned conductive base layer and the insulator substrate to electroplating so as to simultaneously form first and second electroplating parts of a patterned electroplating layer on the patterned conductive base layer, such that the first electroplating part is formed on and overlaps entirely the electroplating surface of the first continuous conductor part, and that the second electroplating part is formed on and overlaps entirely the electroplating surface of the second continuous conductor part, the first electroplating part having at least one sacrificial portion that overlaps the sacrificial portion of the first continuous conductor part; and removing the sacrificial portion of the first continuous conductor part and the sacrificial portion of the first electroplating part from the insulator substrate.
According to another embodiment of the present invention, there may be provided a metal-electrodeposited insulator substrate that includes: an insulator substrate having a pattern-forming surface, the pattern-forming surface having first and second roughened regions and first and second non-roughened regions, the second non-roughened region extending from the first roughened region, the first non-roughened region surrounding the first and second roughened regions and the second non-roughened region and separating the first roughened region and the second non-roughened region apart from the second roughened region, each of the first and second roughened regions and the second non-roughened region having a peripheral edge, the pattern-forming surface being formed with first and second cut slits, the first cut slit surrounding and approximating the peripheral edges of the first roughened region and the second non-roughened region, the second cut slit surrounding and approximating the peripheral edge of the second roughened region, an entire area of the second roughened region being substantially equal to a total area of the first roughened region and the second non-roughened region; a first multi-layer conductor stack formed on and overlapping an entire area of the first roughened region and surrounded by the first cut slit; and a second multi-layer conductor stack formed on and overlapping an entire area of the second roughened region and surrounded by the second cut slit.
In drawings:
The consecutive steps of a method according to an embodiment of the present invention are as follows.
First, an insulator substrate 9 are prepared (see
As shown in
Then, a stack of the active metal-containing layer 10 and the electroless plating seed layer 11 are cut through into the insulator substrate 9 (see
Thereafter, the excess conductor part 16 is removed from the first non-roughened region 93 of the pattern-forming surface 90 of the insulator substrate 9 (see
An assembly of the patterned conductive base layer 15 and the insulator substrate 9 are further subjected to electroplating (see
Thereafter, the sacrificial portion 151b of the first continuous conductor part 151 and the sacrificial portion 21b of the first electroplating part 21 are removed from the insulator substrate 9 (see
In certain embodiments of the present invention, the first and second roughened regions 91, 92 of the pattern-forming surface 90 of the insulator substrate 9 may be roughened using laser ablation techniques, for example.
The insulator substrate 9 maybe made from an insulative material. Suitable insulative material may include glass, ceramics, a polymer resin, and composites, for example.
Formation of the active metal-containing layer 10 on the pattern-forming surface 90 of the insulator substrate 9 may be conducted in a conventional manner, such as by immersing the insulator substrate 9 into an active metal-containing solution for a predetermined amount of time to allow attachment of active metal ions in the active metal-containing solution to the pattern-forming surface 90 of the insulator substrate 9, followed by reducing the attached active metal ions. The active metal ions contained in the active metal-containing solution may be any suitable metal, such as Pd, Pt, Rh, Ir, Os, Au, Ni, and Fe, all by way of non-limiting example.
Formation of the electroless plating seed layer 11 on the active metal-containing layer 10 may be conducted using any conventional manner.
Cutting of the active metal-containing layer 10, the electroless plating seed layer 11 and the insulator substrate 9 may be conducted by conventional cutting techniques, such as laser cutting or water jet cutting, both by way of non-limiting example. The cutting results in physical separation of the first and second continuous conductor parts 151, 152 and the excess conductor part 16, thereby facilitating subsequent removal of the excess conductor part 16 from the first non-roughened region 93.
Since the attachment strength of the excess conductor part 16 to the first non-roughened region 93 is much weaker as compared to that of the patterned conductive base layer 15 to the first and second roughened regions 91, 92, removal of the excess conductor part 16 from the first non-roughened region 93 may be conducted in a conventional manner by immersing an assembly of the insulator substrate 9 and the stack of the active metal-containing layer 10 and the electroless plating seed layer 11 into a chemical solution to chemically etch the active metal-containing layer 10 at the first non-roughened region 93. Conventional chemical etching techniques may be used.
In certain embodiments of the invention, the first and second cut slits 96, 97 may have a sufficient depth and width to physically isolate the first and second continuous conductor parts 151, 152 from one-another when the first multi-layer conductor stack 31 and the second multi-layer conductor stack 32 serve as contacts or electrical trace lines of a circuit and are disposed adjacent (or substantially adjacent) to each other.
With the inclusion of the sacrificial portion 151b in the first continuous conductor part 151 so that the electroplating surfaces 1513, 1523 of the first and second continuous conductor parts 151, 152 have substantially the same area for electroplating, the stack thicknesses of the first and second multi-layer conductor stacks 31, 32 thus formed maybe substantially the same.
While embodiments of the present invention have been described in connection with what is considered the most practical embodiment, it is understood that this invention is not limited to the disclosed embodiment but is intended to cover various arrangements included within the spirit and scope of the broadest interpretation and equivalent arrangements.
Number | Date | Country | Kind |
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102133470 | Sep 2013 | TW | national |