Claims
- 1. A down hole fluorescence spectrometer apparatus comprising:
a sonde for traversing a well bore; a sample cell for holding a formation sample during testing, the sample cell further comprising a first and window for passage of light into a sample in the sample cell and a second window for passage of light from the sample in the sample cell; a ultraviolet light source for illuminating the sample in the sample cell; a mounting device for holding the ultraviolet light source in place; an optically clear ultraviolet light coupler between and in contact with both one outer face of the fluid containment system and with mounting device; and a photo detector for measuring fluorescent spectra for the sample.
- 2. The fluorescence spectrometer of claim 1, wherein the light coupler and the first window are made of the same material.
- 3. The fluorescence spectrometer of claim 1, further comprising:
a faceted mirror reflector at the UV light source to maximize the UV light concentrated in the optical coupler to maximize light intensity incident on the fluid sample.
- 4. The fluorescence spectrometer of claim 1, wherein the fluid containment system is made of sapphire.
- 5. The fluorescence spectrometer of claim 1, further comprising:
a photo diode for monitoring the intensity of the ultra violet light source; and a normalizing component for adjusting measured fluorescent spectra to a change in intensity of the ultra violet light source measured by the photo diode monitoring the intensity of the ultra violet light source.
- 6. The fluorescence spectrometer of claim 1, further comprising:
an alternating polarity striking voltage applied to the ultra violet light source.
- 7. The fluorescence spectrometer of claim 1, further comprising:
a striking voltage pulse having a rise time of less than 500 milliseconds.
- 8. The fluorescence spectrometer of claim 1, further comprising:
a neural network for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 9. The fluorescence spectrometer of claim 1, further comprising:
a chemometric calculation component for determining a percentage of at least one of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 10. The fluorescence spectrometer of claim 1, further comprising:
a fluorescence ratio model for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 11. The fluorescence spectrometer of claim 1, further comprising:
calculation components comprising a neural network for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample, a chemometric calculation component for determining a percentage of at least one of aromatics, olefins, saturates and contaminants present in the sample, a fluorescence ratio model for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample; and a figure of merit component for comparing outputs from two of the calculation components and assigning a figure or merit to the calculation components outputs.
- 12. The fluorescence spectrometer of claim 1, further comprising:
a figure of merit formula for calculating a figure of merit by subtracting from 1.0 the absolute value of the difference between two calculation components outputs.
- 13. A method for down hole fluorescence spectrometry comprising:
traversing a well bore with a sonde; holding a formation sample in a sample cell during testing; passing light to the sample from a light source through an optical coupler through a window in the sample cell; capturing light from the sample through a second window for passage of light from the sample in the sample cell; and measuring fluorescent spectra for the sample.
- 14. The method of claim 13, further comprising:
reflecting light at the UV light source; and maximizing the UV light concentrated in the optical coupler to maximize light intensity incident on the fluid sample.
- 15. The method of claim 13, further comprising:
monitoring the intensity of the ultra violet light source; and normalizing measured fluorescent spectra to a change in intensity of the ultra violet light source measured by the photo diode monitoring the intensity of the ultra violet light source.
- 16. The method of claim 13, further comprising:
alternating the polarity of the striking voltage applied to the ultra violet light source.
- 17. The method of claim 13, further comprising:
applying a striking voltage pulse at a rise time of less than 500 milliseconds.
- 18. The fluorescence spectrometer of claim 1, further comprising:
a neural network for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 19. The fluorescence spectrometer of claim 13, further comprising:
determining in a chemometric calculation component for a percentage of at least one of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 20. The fluorescence spectrometer of claim 13, further comprising:
determining in a fluorescence ratio model a percentage of aromatics, olefins, saturates and contaminants present in the sample from two or more fluorescent channel measurements.
- 21. The method of claim 1, further comprising:
determining a percentage of aromatics, olefins, saturates and contaminants present in the sample, in a chemometric calculation component for determining a percentage of at least one of aromatics, olefins, saturates and contaminants present in the sample, in a fluorescence ratio model for determining a percentage of aromatics, olefins, saturates and contaminants present in the sample; and comparing outputs from two of the calculation components; and calculating a figure or merit for the calculation components outputs.
- 22. The fluorescence spectrometer of claim 1, further comprising:
a figure of merit formula for calculating a figure of merit by subtracting from 1.0 the absolute value of the difference between two calculation components outputs.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This patent application takes priority from U.S. Provisional Patent Application serial No. 60/385,633 filed on Jun. 4, 2002 entitled “A Method and Apparatus for a Downhole Flourescence Spectrometer” by DiFoggio et al. This application is related to U.S. patent application Ser. No. 10/162,023, entitled “A Method and Apparatus for a High Resolution Downhole Spectrometer” by Rocco DiFoggio, Paul Bergen and Arnold Walkow, filed on Jun. 4, 2002 which is hereby incorporated herein by reference in its entirety. This application is related to U.S. patent application Ser. No. 10/162,030, entitled “A Method and Apparatus for a Derivative Spectrometer” by Rocco DiFoggio, Paul Bergen and Arnold Walkow, filed on Jun. 4, 2002 which is hereby incorporated herein by reference in its entirety. This application is related to the U.S. patent application Ser. No. 10/119,492 filed on Apr. 10, 2002 by Rocco DiFoggio et al., entitled “A Method and Apparatus for Downhole Refractometer And Attenuated Reflectance Spectrometer” which is hereby incorporated herein by reference in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60385633 |
Jun 2002 |
US |