A. Jongepier, "Fast test method for serial A/D and D/A converters", European Test Conference, 1989, pp. 262-267. |
Chen-Yang Pan et al., "Pseudo-Random Testing and Signature Analysis for Mixed-Signal Circuits", IEEE 1995, ICCAD 95, 1063-6757/95, pp. 102-107. |
Chin-Long Wey, "Built-In Self-Test (BIST) Structure for Analog Circuit Fault Diagnosis", IEEE Transactions on Instrumentation and Measurement, vol. 39, No. 3, Jun. 1990, pp. 517-521. |
Naveena Nagi et al., "A Signature Analyzer for Analog and Mixed-Signal Circuits", Computer Engineering Research Center, University of Texas at Austin, Austin, TX (undated), 4 pgs. |
A.K. Lu et al., "An Analog Multi-Tone Signal Generator For Built-In-Self-Test Applications", International Test Conference, IEEE, 1994, O-7803-2102-2/94, Paper 27.3, pp. 650-659. |
S. Mir et al., "Built-in Self-Test and Fault Diagnosis of Fully Differential Analog Circuits", INPG/TIMA Laboratory, 38031 Grenoble, France, undated, 5 pgs. |
Michael J. Ohletz, "Hybrid Built-In Self-Test (HBIST) for Mixed Analog/Digital Integrated Circuits", Laboratorium fur Informationstechnologie, Universitat Hannover, Germany, undated, pp. 307-316. |
M.F. Toner et al., "A BIST Scheme for an SNR Test of a Sigma-Delta ADC", IEEE 1993, International Test Conference 1993, O-7803-1429-8/93, Paper 37.3, pp. 805-814. |
Karim Arabi et al., "A New Built-In Self-Test Approach for Digital-to-Analog and Analog-to-Digital Converters", Department of Electrical and Computer Engineering, Montreal, Quebec, Canada, 1994 ACM 0-89791-690-5/94/0011/0491, pp. 491-494. |
Eiichi Teraoka et al., "A Built-In Self-Test for ADC and DAC in a Single-Chip Speech CODEC", 1993 IEEE, International Test Conference 1993, O-7803-1429-8/93, Paper 37.1, pp. 791-796. |