The present invention relates to the field of Quantum Electronics, and more particularly to the elemental basis of laser technology, and can be used to develop tunable mid-infrared (mid-IR) solid state lasers.
Primarily, the invention can be used in cases where monochromatic laser emissions tunable in the middle-infrared spectral region are required for solving problems in various fields of science and technology, such as laser spectroscopy, trace gas analysis, photo 15 chemistry, photo biology, medicine, and wavelength specific military applications, among others.
There is a growing demand for affordable mid-infrared sources for use in a variety of applications including atmospheric sensing (global wind sensing and low altitude wind shear detection), eye-safe medical laser sources for non-invasive medical diagnostics, eye-safe laser radar and remote sensing of atmospheric constituents, optical communication, and numerous military applications such as target designation, obstacle avoidance and infrared counter measures. These applications rely on the existence of “spectroscopic fingerprints” of numerous organic molecules in the mid-IR range.
Recent research advances have spurred considerable effort in the development of practical mid-IR sources. This work has included direct generation in semiconductors using InAsSbP/InAsSb/InAs,1 and quantum cascade lasers2. Mid-IR wavelengths have also been generated using nonlinearities in Optical Parametric Oscillators3 and difference frequency generators.4,5 All of these approaches yield tunable sources in the mid-IR and all suffer some fundamental problems that limit their use as robust low cost mid-IR source. Furthermore, to date, all of these sources have limited output powers that preclude their use in higher power applications such as remote sensing.
In contrast to the relatively large body of work using the approaches described above, there has been relatively little investigation of the potential for direct oscillation from divalent transitional metal ions (TM2+) placed in the asymmetric (Td) lattice sites of the wide bandgap binary and mixed ternary II-VI semiconductor crystals. The lack of work on direct emission of chromium doped (or other transitional metal doped) sources in the mid-IR has one primary cause. Long wavelength TM emissions are quenched by multi-photon processes in conventional laser host media such as oxide and fluoride crystals, resulting in extremely low room-temperature quantum efficiency of fluorescence.
Recently, mid-IR laser activity near 2-4 gm was reported for Cr:ZnS6,7,8,9,10, Cr:ZnSe6,7,11,12,13,14,15,16,17,18, Cr:Cd1-xMnxTe19, Cr:CdSe20, and Fe2+:ZnSe21 crystals. These TM doped II-VI compounds have a wide bandgap and possess several important features that distinguish them from other oxide and fluoride laser crystals. First is the existence of chemically stable divalent TM dopant ions, which substitute Zn2+ or Cd2+ host ions, with no need for charge compensation. An additional feature of the II-VI compounds is their tendency to crystallize in tetrahedrally coordinated structures. As opposed to the typical octahedral coordination at the dopant site, tetrahedral coordination gives smaller crystal field splitting, placing the dopant transitions further into the IR. Finally, a key feature of these materials is a poor phonon spectrum that makes them transparent in a wide spectral region, decreases the efficiency of non-radiative decay and gives promise to a high yield of fluorescence at room temperature.
In terms of merit for high average power applications, it is known that some of chalcogenides (e.g. ZnS and ZnSe) feature excellent thermo-mechanical properties, having thermal shock resistance values comparable to and coefficient of thermal conductivity better than such thermo-mechanically robust materials as YAG crystals. Given the attractive thermo-mechanical, spectroscopic properties of TM2+, and nice overlap of the Cr2+ absorption and emission Er and Tm fiber lasers as well as of stained layer InGaAsP/InP and, theoretically, InGaNAs/GaAs diode lasers, directly fiber or diode-pumped wide band semiconductor crystals doped with TM ions can be considered as very promising and effective systems for medicine, remote sensing, trace gas analysis, and high power wavelength specific military applications.
The studies of TM2+ doped II-VI materials showed that in terms of spectroscopic and laser characteristics these media are very close mid-IR analogues of the titanium-doped sapphire (Ti—S). It is anticipated that, similarly to the Ti—S laser, TM2+ doped chalcogenides will be lasing in the near future with a great variety of possible regimes of oscillations, but with an additional significant advantage of being directly pumpable with radiation of InGaAsP or InGaNAs diode arrays.
During the last 2-7 years several groups, including the inventors, have actively explored analogues TM2+ crystal hosts for tunable lasing in CW, free-running long pulse, Q-switched and mode-locked regimes of operation. So far the most impressive results—room temperature operation, >60% lasing efficiency, 3.7 W of output power, more than 1000 nm range of tunability—have been obtained using Cr2+:ZnSe crystals. Based on these results, it appears that Cr doped ZnS and ZnSe crystals possess a unique combination of technological, thermo-mechanical, spectroscopic, and laser characteristics that make them potentially low cost, affordable mid-IR laser sources.
However, in these spectroscopic and laser studies of TM2+:II-VI materials there was no indication that microchip lasers and chip-scaled integrated lasers could be designed on the basis of TM doped II-VI hosts. Microchip lasing requires several specific factors in addition to standard factors required for any laser media. These additional factors are high optical density and high gain of thin layers (usually <1-2 mm) of active material, which is translated into high cross sections of absorption and emission, combined with a high doping levels of active ions at which there is still no concentration quenching of fluorescence and no degradation of the optical quality of the host material.
Also unknown in the prior art is a design of “spatially dispersive” cavities for realization of flexible laser modules easily reprogrammable from monochromatic to ultrabroadband and multiline regimes of operation.
U.S. Pat. Nos. 5,461,635 and 6,236,666 taught the approach of superbroadband (SBL) or multiwavelength system22,23,24,25 based on spatial separation of different wavelengths in a single laser cavity. The optical components of the cavity maintain distinct gain channels in the active zone of semiconductor chip, reduce cross talk, suppress mode competition, and force each channel to lase at a specific stabilized wavelength. By designing this cavity structure appropriately, the system creates its own microcavities each lasing at different wavelengths across the complete gain spectrum of the active material. The system is ideal from the point of view of control of laser wavelengths generated in a common laser cavity and allows the obtaining of very small and controllable wavelength spacing. This approach allows the construction of a laser that emits a plurality of narrow spectral lines that can be easily tailored to any pre-assigned spectral composition within the amplification spectrum of the gain medium. This approach has been demonstrated for the emission of thirty lines in laboratory conditions and the stability and line width measurements are extremely promising. Conventional tunable laser systems used for remote sensing are appropriate only for single element analysis. Proposed simple, flexible and easily reprogrammable laser modules open new opportunities for simultaneous multi-element gas tracing analysis. It appears that TM doped II-VI hosts and, specifically, chromium doped ZnS and ZnSe crystals featuring broad amplification spectra are ideal active media for superbroadband and multiline lasing.
Finally, the prior art has not taught utilization of acousto-optic, electro-optic, photorefractive and birefringent properties of II-VI crystals in one integrated microchip system combining active medium, acousto- or electro-optic modulator, filter, other passive components of the cavity such as waveguide grating, or birefringent filter.
The present invention contemplates a new class of middle-infrared microchip lasers based on transitional metal (TM2+=Ti, V, Cr, Mn, Fe, Co, Ni, and Cu) doped binary II-VI crystals having formula MeZ, where Me being Zn, Cd, Ca, Mg, Sr, Ba, Hg, Pb and Z being S, Se, Te, O and their mixtures as well as mixed ternary chalcogenide matrixes having formula MeX2Z4 with X being Ga, In, Al. A particular embodiment of this invention is microchip laser based on Cr2+ doped ZnS, ZnSe, CdS, and CdSe crystals. The microchip laser is the most compact and simplest diode or fiber laser pumped solid state laser with a typical dimension of 0.5-1 mm3. The main advantages of the proposed microchip lasers will be the ability to be fabricated with collective fabrication processes allowing low cost mass production with good reproducibility and reliability as well as simplicity, allowing its utilization without any optical alignment and maintenance.
The following steps are germane to the practice of the invention. Growing (Chemical, Physical Vapor Transport or other methods) or purchasing II-VI host crystal materials from commercial vendors followed by cutting them into polished wafers of thickness 0.1-3 mm.
Introducing transitional metal (e.g. Cr) thin film of controllable thickness on the crystal facets at the stage after crystal growing by means of pulse laser deposition, plasma sputtering, cathode arc deposition, or other methods,
Thermal annealing of the crystals under simultaneous action of electric field for effective thermal diffusion of the dopant into the crystal volume with a temperature and exposition time providing highest concentration of the dopant in the volume without degrading laser performance due to scattering and concentration quenching,
Polishing Microchip Facets,
Formation of microchip laser by means of direct deposition of mirrors on flat and parallel polished facets of a thin TM:II-VI wafer.
The microchip laser thus fabricated can utilize direct diode or fiber laser pumping with a level of power density providing formation of positive lens and corresponding cavity stabilization as well as threshold population inversion in the laser material.
stabilization as well as threshold population inversion in the laser material.
The present invention by taking advantage of acousto-optic, electro-optic, photorefractive and birefringent properties of II-VI crystals also contemplates an integrated microchip system combining active medium, acousto- or electro-optic modulator, filter, other passive components of the cavity such as waveguide grating, or birefringent filter.
The present invention further contemplates microchip lasers integrated into “spatially dispersive” cavities for realization of flexible laser modules easily reprogrammable from monochromatic to ultrabroadband and multiline regimes of operation.
The advantages of the present invention will be further appreciated from the drawings and from the detailed description provided below.
The herein described features of the present invention, as well as others which will become apparent, are attained and can be understood in more detail by reference to the following description and appended drawings, which form a part of this specification. It is to be noted, however, that the appended drawings illustrate only exemplary embodiments of the invention and therefore not be considered limiting of its scope, for the invention may admit other equally effective embodiments.
In the preferred embodiment, the Cr2+:ZnS crystals are prepared by a three-stage method according to a flow chart depicted in
At the second stage and third stages, introduction of chromium (or other transitional metal) into the crystalline host is performed by thermal diffusion (third stage) from a then film deposited, preferably, by the pulse laser deposition method (second stage). Plasma spluttering or other thin-film deposition methods could also be sued. Thermal annealing can be carried out in sealed ampoules under a pressure of, preferably, approximately 10−5 torr and temperature of approximately 830° to approximately 1100° C. over 3 to 20 days. In some cases to provide more effective thermo-diffusion it was performed under simultaneous action of electric field of 1-30 kV/cm magnitude with positive terminal being applied to Cr film and negative—to the Ag electrode deposited on the opposite surface of the wafer. Polished samples of 1-3 mm thickness and up to 5 mm aperture can then be produced.
The room-temperature absorption and fluorescence spectra of the studied Cr2+:ZnS and Cr2+:ZnSe crystals are given in cross section units in
The luminescence kinetics of the crystals were measured at 1950, 2100, 2400, and 2600 nm across a broad temperature range using D2 and H2 Raman-shifted Nd:YAG laser excitation at 1560 and 1907 nm. Within the 0.4 μs accuracy of measurements there was no difference in the lifetime of luminescence for different wavelengths of excitation and registration.
The spontaneous-emission cross-sections σem(λ) (
where A is the spontaneous emission probability from the upper laser level, and n is the index of refraction.
To derive the absorption cross-section magnitude from the “absorption spectrum, one needs to know the Cr2+ concentration. Unfortunately, the absolute dopant concentration is neither uniform nor accurately known in the case of diffusion doping. We therefore used the reciprocity method for the broadband transition:
In conjunction with measured absorption spectra to calculate the absorption cross-section in
Similar graphs of room temperature absorption and emission spectra of Cr2+:CdS (A) and Cr2+:CdSe (C) crystals prepared according to the invention, measured at 300K, and plotted in cross-sectional units, and corresponding emission lifetime temperature dependences (B, D) are displayed in
One of the important potential applications of TM:II_-VI crystals is the passive Q-switching of the resonators of solid state lasers (e.g. Cr2+: ZnS crystals for passive Q-switching of Er:glass lasers). Experiments on saturation of Cr2+:ZnS absorption were performed under 1.56 μm excitation. The radiation of a D2-Raman-shifted YAG:Nd laser with a pulse duration of 5 ns and pulse energy of up to 20 mJ and repetition rate of 10 Hz was used. Saturation experiments utilized a 2.5 mm thick Cr2+:ZnS crystal with initial transmission of T=0.43 at 1.56 μm. The pump radiation was focused on the sample by a 26.5 cm lens and the dependence of the crystal transmission as a function of pumping energy density was measured by means of the sample Z-scanning. Spatial energy distributions of the pump radiation were determined by a standard knife-edge method. The effective radius of the pumping beam was measured at the 0.5 level of maximum pump intensity of radiation.
As one can see from
where z=Wσab, To-initial crystal transition at W=0, and σabs-absorption cross section (cm2). Equation (3) was solved numerically, and from the best fit to the experimental results (
The Cr2+ concentration in the crystal was 3.5×1018 cm−3. This satisfactory agreement of abs values determined from spectroscopic and saturation measurements indicates negligible excited state absorption losses for Cr2+:ZnS at 1.56 μm and the wavelength of Er: glass laser oscillation (1.54 μm). Hence, Cr2+: ZnS crystals feature a relatively high cross section of absorption 0.7×10−18 cm2 at 1.56 μm compared with 7×10−21 cm2 for Er: glass. This value is practically two times larger than 0.27×10−18 cm2 cross section value for Cr2+:ZnSe known in the prior art and in conjunction with negligible excited state absorption losses reveal possible application of Cr2+:ZnS crystals as a promising saturable absorber for resonators of Er: glass lasers. In addition to this it is advantageous to utilize for solid state laser Q switching and mode-locking Cr2+:ZnS crystals with dichroic mirrors deposited on their faces. These mirrors are supposed to be transparent at the wavelength of solid state laser (e.g. Er-glass laser) oscillation and reflective in the region of Cr2+:ZnS lasing. In this coupled cavity configuration Cr2+:ZnS element will serve simultaneously as passive Q-switch or mode-locker, as a load for solid state laser, and as an active element. Due to stimulated processes in Cr2+:ZnS one can expect that the effective time of depopulation of Cr2+:ZnS excited levels will be much faster than for regular arrangement without coupled cavity. It will result in a shorter pulsed duration in a Q-switch regime and even possibility of mode-locked operation.
A block-diagram of experimental nonselective hemispherical cavity used for Cr2+:ZnS gain switched lasing is depicted in
Room temperature laser operation was realized with a threshold of 170 μJ and slope efficiency of 9.5% with respect to the pump energy when output coupler R2.360 μm=90% was utilized. The laser had an output linewidth of approximately 90 nm (FWHM), centered at 2.24 μm and maximum output energy reached 100 μJ. A graph of output-input energies of Cr2+:ZnS gain switched laser in hemispherical cavity is depicted in
With the R2.360 μm=80% mirror laser operation was obtained with a threshold of 250 μJ. This allowed a Findlay-Clay calculation of the losses within the cavity29. With the crystal length of 1.7 mm and σabs=0.8×10−18 cm2 the losses in the cavity were calculated to be 14.7%. It is felt that this can also be improved by the optimization of the crystal preparation techniques.
In the wavelength tuning experiment, depicted in
The pump source was operating at 1.5607 μm with the pulse energy of about 600 μJ and 5 ns pulse duration in a TEM00 mode. This pump energy was about three times larger than the threshold pump energy level. The Cr2+:ZnS laser output was directed through a CaF2 lens to a 0.3 m “SpectraPro” monochromator with a PbS detector for wavelength measurements.
The output of the chromium laser oscillation had a linewidth of approximately 30 nm (FWHM). The peak efficiency of the tunable output was centered at 2.25 μm. The tuning limits were due to coatings of the cavity optics and not the emission spectrum of Cr2+:ZnS crystal. The use of proper broadband coatings could potentially increase the tuning range to 1.85-2.7 μm.
The laser output linewidth could be further narrowed by means of a Littrow or Littman configured grating tuned cavity.
A block diagram of experimental set-up for Cr2+:ZnS CW lasing under Er fiber laser excitation in external hemispherical cavity is depicted in
The minimum threshold values were measured to be 100 mW and 200 mW of absorbed pump power for output couplers with 2% and 20% transmission, respectively. An output power of 63 mW near 2370 nm at an absorbed pump power of 0.6W was demonstrated with an output coupler with 2% transmission for maximum output power adjustment. The maximum slope efficiency “η” if with respect to the absorbed pump power was 18% in this experiment. The round trip passive losses “Ld” in the cavity were estimated to be of 3.7% from the Findley-Clay analysis. The limiting slope efficiency of studied crystal was estimated to be 51% from a Caird analysis of inverse slope efficiency versus inverse output coupling using equation
where η is the slope efficiency, ηo is the limiting slope efficiency, and T is the mirror transmission. This value is close to the quantum defect of 65% for the studied crystal.
A block diagram of Cr2+:ZnS and Cr2+:ZnSe gain switched microchip lasers with no mirrors deposited on the crystal facets is depicted in
A block diagram of experimental set-up for Cr2+:ZnS and Cr2+:ZnSe CW lasing under Er fiber laser excitation in microchip configuration is displayed in
In a focused pump beam arrangement a laser threshold of 120 mW and a slope efficiency of 53% with respect to the absorbed pump power were realized for Cr2+:ZnS microchip laser. High, close to theoretical limit of 65%, slope efficiency of the microchip laser indicates a good quality of the used crystal. The maximum output power of optimized Cr2+:ZnS microchip laser reached 150 mW as demonstrated in
In the case of ZnSe microchip lasing in a focused pump beam arrangement a laser threshold of 190 mW and a slope efficiency of 20% with respect to the absorbed pump power were demonstrated. The maximum output power reached 100 mW.
For the second pump arrangement, when the microchip lasers were directly coupled to the fiber tip laser thresholds of 150 mW and 240 mW and slope efficiencies of 36 and 14% with respect to the absorbed pump power were realized for Cr2+:ZnS and Cr2+:ZnSe microchip lasers, respectively. The maximum output power of the Cr2+:ZnS microchip laser was practically unchanged while it dropped for Cr2+:ZnSe by a factor of 1.6 in comparison to the focused pump arrangement. This can be explained by the excessive length and corresponding mismatch in the mode size and pump beam profile of the ZnSe microchip.
The output spectrum in free-running laser operation covered the spectrum range from 2280 to 2360 and from 2480 to 2590 for ZnS and ZnSe microchip lasers, respectively. At maximum pump power the output spectrum of the Cr2+:ZnSe laser consisted of more than 100 axial modes with a free spectral range Δv=0.8 cm−1. The typical output spectra of the microchip lasers are depicted in the “A” traces of
The proposed approach of superbroadband/multiwavelength (SBML) system is based on spatial separation of different wavelengths in a single laser cavity. In that regard the teachings of U.S. Pat. Nos. 5,461,635 and 6,236,666 are incorporated herein by reference. The basic optical scheme of the laser transmitter is shown in
The laser operates as follows. Emission from the spatially separated channels of the active medium passes through the intracavity lens into the off-axis mode suppression element, aperture A, which together with the spatially filtered pump radiation divides active zone of the gain waveguide into a number of channels and separates from the amplified emission of individual channel only part of it that is spread parallel to the resonator axis. This separated radiation is diffracted on the diffraction grating. The Littrow mount grating works as a retroreflector in the auto-collimating regime in the first order of diffraction and returns part of radiation back to the aperture. The off-axis mode suppression element, aperture, in turn extracts from the diffracted radiation only the radiation of the main laser modes. Secondary laser modes, which diverge from the optical axes, are expelled from the process of generation. Hence, the aperture should simultaneously select the fundamental transverse modes for all existing channels in the cavity. The radiation of the main laser modes, each with a distinct wavelength, is collimated by the focusing lens and directed back to the active medium. As
There are different schemes that can provide single longitudinal mode operation of Ii-VI microchip laser coupled to external etalon cavity in combination with narrowband output coupler, fiber grating butt-coupling, external grating, hybridly coupled phase array demultiplexer, and waveguide grating mirror.
There are many other possible schemes of utilization of acousto-optic, electro-optic, photorefractive and birefringent properties of II-VI crystals in one integrated microchip system combining active medium, acousto- or electro-optic modulator, filter, other passive components of the cavity.
While our invention has been disclosed in various forms, this disclosure is not to be construed as limiting the invention solely to these forms, rather the invention is limited solely by the breadth of the claims appended hereto.
This patent application is a divisional of U.S. patent application Ser. No. 14/321,553, filed Jul. 1, 2014, which is a divisional of U.S. patent application Ser. No. 13/309,496, filed Dec. 1, 2011, now U.S. Pat. No. 8,767,789, which is a continuation of U.S. patent application Ser. No. 12/485,826, filed Jun. 16, 2009, now abandoned, which is a continuation of U.S. patent application Ser. No. 11/140,271, filed May 27, 2005, now issued U.S. Pat. No. 7,548,571, which is a divisional of U.S. patent application Ser. No. 10/247,272, filed Sep. 19, 2002, now U.S. Pat. No. 6,960,486, which claims priority to U.S. Patent Application No. 60/323,551, filed Sep. 20, 2001, the entire disclosures of which are hereby incorporated by reference in their entireties for all purpose.
Number | Date | Country | |
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60323551 | Sep 2001 | US |
Number | Date | Country | |
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Parent | 14321553 | Jul 2014 | US |
Child | 15884271 | US | |
Parent | 13309496 | Dec 2011 | US |
Child | 14321553 | US | |
Parent | 10247272 | Sep 2002 | US |
Child | 11140271 | US |
Number | Date | Country | |
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Parent | 12485826 | Jun 2009 | US |
Child | 13309496 | US | |
Parent | 11140271 | May 2005 | US |
Child | 12485826 | US |