a and 1b are schematic views illustrating a convention method for dicing a wafer.
a to 2c are schematic views illustrating the method for dicing a wafer according to the present invention.
a and 4b are the enlarged pictures of the dice that are diced from wafers in the conventional methods.
c is the enlarged picture of the die that is diced from a wafer in the method of the present invention.
Number | Date | Country | Kind |
---|---|---|---|
095109779 | Mar 2006 | TW | national |