The present invention relates to an optical measuring device for measuring a plurality of surfaces of an object to be measured using a system of optical elements. The present invention further relates to a utilization of the optical measuring device as an objective for the object to be measured.
Interferometric systems are suited, inter alia, for the contact-free examination of surfaces of various objects to be measured. To detect the surface contour of an object to be examined, an object beam from a light source of the interferometer strikes the surface at the area to be measured. The object beam reflected by the surface is supplied to a detector of the interferometer and, together with a reference beam, forms an interference pattern, from which it is possible to derive the difference in path length of the two beams. This measured difference in the path length of the two beams corresponds to the change in the surface topography.
Particularly with a white-light interferometer, in which the light source emits a short-coherent radiation, it is also possible to scan the object to be measured with the aid of depth scanning. As explained, for instance, in the non-prepublished German Patent Application No. DE 103 25 443.9, in that case, the short-coherent radiation is split by a beam splitter into an object beam and a reference beam. The object surface to be measured is imaged via an objective onto an image recorder, e.g., a CCD camera (charge-coupled device camera), and superposed by the reference wave formed by the reference beam. The depth scanning may be implemented by moving a reference mirror reflecting the reference beam, or moving the object relative to the measuring device. When the object is moved, the image plane of the object and the reference plane are in the same plane. During depth scanning, the object remains fixed in the field of view of the CCD camera, and the object is only moved along the depth axis relative to the reference plane. In this manner, measurements of industrial surfaces may be conducted with a depth resolution in the range of a few nanometers. Technical fundamentals concerning this measuring method are also found in the “Three-Dimensional Sensing of Rough Surfaces by Coherence Radar”(T. Dresel, G. Häusler, H. Venzke, Appl. Opt. 31 (7), p. 919-925, 1992).
If, in this context, the measurement-object surface to be measured is not a uniform, level plane, then a special-purpose objective is necessary for measuring the object to be measured, for in each measuring procedure, care must be taken that, during scanning, the beams strike as perpendicularly as possible on the surfaces to be measured. For example, German Patent Application No. DE 101 31 778 describes a system of optical elements by which it is also possible to measure curved surfaces. Thus, for example, FIG. 1c from the cited document, reproduced herein as
Thus, it is not possible to measure the two surfaces using only one objective. A simple combination of the two exemplary embodiments having a deflection mirror (
Compared to the related art, the optical measuring device of the present invention has the advantage that it makes it possible to measure a plurality of hard-to-access surfaces of an object to be measured. Particularly advantageous, the different surfaces to be measured, such as conical surfaces and inner surfaces of a bore, may be measured quickly and without altering the measuring device. The optical measuring device may also be used as a special-purpose objective for the object to be measured in a measurement set-up of an interferometer, known per se, or in an autofocus sensor.
To permit the splitting of light beams 35 into first portion 30 and second portion 40, beam splitter 20 is semi-transparent to light, i.e., first portion 30 of light beams 35 is reflected at beam splitter 20, while second portion 40 penetrates beam splitter 20. In
The optical elements are usually disposed in a tube 45, especially in an exit region of tube 45. At the locations at which first portion 30 or second portion 40 of light beams 35 emerge from the tube or enter the tube again after the respective reflection, the tube is made of an optically transparent material, or the material is eliminated completely to form a cut-out. For reasons of clarity, the optically transparent material or the cut-out are not shown in the Figures.
Measuring device 1 is suited for utilization as a special-purpose objective for an object to be measured 15 in a measurement set-up of an interferometer, known per se, especially a white-light interferometer. A measurement set-up according to Michelson is shown in
During the measurement, a relative movement of measuring device 1 with respect to object to be measured 15 or vice versa is preferably to be avoided. Therefore, measuring device 1 is especially suitable as a special-purpose objective of an interferometer having an intermediate image. Such interferometers having the possibility for generating the intermediate image are known from the related art.
Incidentally, it is important when measuring first surface 5 and second surface 10 of object to be measured 15 that the two surfaces 5, 10 are not in the focus of image recorder 75 simultaneously. The beams reflected by the two surfaces 5, 10 and transferred into image recorder 75 would then be superimposed to form a joint interference image and thus invalidate the measurement values. Therefore, initially first surface 5 is scanned until it emerges from the interference region, before second surface 10 enters the interference region and is also scanned. Naturally, surfaces 5, 10 may also be scanned in reverse order. To avoid overlapping of first portion 30 and second portion 40 of light beams 35 in image recorder 75, care must be taken in the arrangement of the optical elements of measuring device 1 with respect to the coherence length of light beams 35. Understood by a coherence length of a wave train is the connection length, necessary for interference, for an overlap. Therefore, taking into account the overlap condition just described, the optical elements of measuring device 1 are arranged in such a way that the optical paths of first portion 30 and second portion 40 of incident light beams 35 differ at least in the order of magnitude of a coherence length of light beams 35. A typical value range of a coherence length when working with a white-light interferometer is approximately 2 to 14 μm, while in the case of a heterodyne interferometer with wavelengths of approximately 1570 μm employed, a coherence length of approximately 80 μm results.
Alternatively or in addition to the arrangement of measuring device 1 having different path lengths for first portion 30 and second portion 40 of light beams 35, an interfering overlap of the two beam components 30, 40 in image recorder 75 may be prevented, in that beam splitter 20, 20a is electrically or magnetically controllable in order to selectively vary its transmission and reflection properties. Thus, the light path of first portion 30 or second portion 40 of light beams 35 is blocked for a short period.
In this connection, it is advantageous to use an image recorder 75 having evaluation software for a double correlogram 80. Since, according to the present invention, optical measuring device 1 permits the measurement of a plurality of surfaces 5, 10 of an object to be measured 15, image recorder 75 must accordingly evaluate the beam components, reflected by different surfaces, separately. As
In summary, splitting light beams 35 into a first portion 30 and second portion 40 in measuring device 1 permits the measurement of a plurality of surfaces 5, 10 of an object to be measured 15. In particular, the arrangement of the optical elements allows the measurement of an inner surface of a cylinder and that of a cone-shaped surface using only one measuring device 1.
Number | Date | Country | Kind |
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10 2004 045 808 | Sep 2004 | DE | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP2005/053578 | 7/22/2005 | WO | 00 | 1/14/2008 |
Publishing Document | Publishing Date | Country | Kind |
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WO2006/032561 | 3/30/2006 | WO | A |
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4180322 | Farcinade | Dec 1979 | A |
4997281 | Stark | Mar 1991 | A |
6462815 | Drabarek et al. | Oct 2002 | B1 |
20040075842 | Dunn et al. | Apr 2004 | A1 |
Number | Date | Country |
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198 19 762 | Nov 1999 | DE |
10131778 | Jan 2003 | DE |
101 31 778 | May 2003 | DE |
102 04 136 | Aug 2003 | DE |
103 01 607 | Aug 2004 | DE |
103 25 443.9 | Dec 2004 | DE |
Number | Date | Country | |
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20080259346 A1 | Oct 2008 | US |