Text handed out in a seminar entitled “Environmental Issues and Cost Problems Confronting Semiconductor Plants (cost reductions to fight for the survival of 64M Shrink, ver/256MDRAM)” held on Jun. 25, 1998 at Yurakucho Asahi Square, Tokyo, Japan (w/English translation (1) of cover page; (2) Article 4-3—“Emissions from the Etching Process and Measures in Response” by Mr. Masato Fujino, Toshiba Corporation; (3) Article 4-6—“Collection and Reproduction of PFC (Perfluoro Compound)” by Mr. Makoto Nagashima, Daido Air Products Electronics, Inc.; and (4) last two pages showing details of the seminar). |