Y.Eutani et al., “Standard developer available ArF resist and performance” Proceedings of the Spie—The International Society for Optical engineering, vol. 3333, No. 1, Feb. 25, 1998, pp. 546-533, XP002179487 USA. |
Jim-Baek Kim et al., “Chemically amplified resist based on the norbornene copolymers with steroid derivatives” Proceedings of the Spie—The International Society for Optical Engineering, vol. 3578, No. 1, Mar. 17, 1999, pp. 36-43, XP002179488 USA. |
M. Rahman et al, “Cycloolefin/maleic anhydride copolymers for 193 nm resist compositions”, Proceedings of the Spie—The International Society for Optical Engineering, vol. 3678, No. 2, Mar. 17, 1999, pp. 1193-1200, XP002179489 USA. |
D. Pasini et al., “Carbon-rich cyclopolymers: their synthesis, etch resistance, and application to 193 nm microlithography” Proceedings of the Spie—The International Society for Optical Engineering, vol. 3678, No. 1, Mar. 17, 1999, pp. 94-101, XP00219486 USA. |
Dario Pasini et al., “Carbon-Rich Cyclopolymers: Their Synthesis, Etch Resistance, and Application to 193 nm Microlithogrphy”, SPIE Conference on Advances in Resist Technology and Processing XVI, March 1999, SPIE vol. 3678, pp. 94-101. |