Claims
- 1. A system for preparing precision polymeric molds, comprising:
a plurality of process solutions, at least one of said solutions a developer solution for dissolving an exposed photoresist, and at least another of said solutions an intermediate rinse solution for assisting in removing, and for preventing recrystallization of, said dissolved photoresist; and high frequency agitation means for agitating at least said developer solution.
- 2. The system of claim 1, wherein the high frequency agitation means is applied to both of said developer solution and said intermediate rinse solution.
- 3. The system of claim 1, wherein the high frequency agitation means is applied to each of the plurality of process solutions.
- 4. The system of claim 1, further including means for controlling the temperature of said plurality of solutions.
- 5. The system of claim 1, further including filtration means for separately filtering each of said process solutions.
- 6. The system of claim 1, wherein the high frequency agitation means generates sonic vibrations above 500 kHz.
- 7. The system of claim 6, wherein the high frequency agitation means preferably generates sonic vibrations at about 750 kHz.
- 8. The system of claim 1, further including means for orienting said exposed photoresist with respect to said agitation means thereby optimizing dissolution of said photoresist.
- 9. The system of claim 4, wherein said temperature control means includes a means for maintaining said solution temperature between about 20° C. to 35° C. to within a range of 3° C.
- 10. The system of claim 1, wherein the intermediate solution comprises an aqueous solution of di(ethylene glycol) butyl ether.
- 11. The system of claim 10, wherein the intermediate solution consists essentially of 80w/o di(ethylene glycol) butyl ether in water.
- 12. The system of claim 5, wherein the filtration means includes a 0.2 micron polytetrafluoroethylene filter.
- 13. The system of claim 1, further including an enclosure, said enclosure for housing said system, said enclosure having an exhaust means for establishing and maintaining an atmospheric flow over said solutions, said flow discharged through an exhaust stack thereby maintaining separation between said enclosure and a surrounding working environment housing said enclosure.
- 14. The system of claim 1, further including containment means for containing the developer and intermediate rinse solutions, said means comprising chemically inert, non-corrosive materials.
- 15. A holder for retaining an exposed patterned wafer vertically or horizontally.
- 16. The holder of claim 15, wherein the holder for the exposed patterned wafer is constructed of a housing having slits formed therein for retaining peripheral edges of the wafer, and a handle attached to the housing to enable quickly moving said housing and said wafer from one tank to another tank.
- 17. A polymeric mold for producing a micro-scale part comprising:
a mold substrate, said substrate having an intermediate adhesion layer; one or more polymer layers on said intermediate layer, said one or more layers having a thickness of about 50 microns greater than a thickness of a part to be produced; and features within said one or more layers having dimensions of up to three orders of magnitude smaller than said part thickness or said part diameter or length.
- 18. The mold of claim 17, wherein the photoresist layer further comprises PMMA.
- 19. The mold of claim 17, wherein the mold substrate is selected from the group of materials consisting of silicon, metals, or ceramics, and combinations thereof.
- 20. A method for preparing a polymeric mold for producing a micro-scale part comprising the steps of:
a) introducing a substrate having a photoresist layer into a developer solution, a portion of said layer having been exposed to a source of radiation, said developer solution for dissolving said exposed portion; b) applying a source of high frequency sonic agitation to said solution and to said layer for a period of minutes; c) removing said substrate and said layer from said developer solution and immediately introducing said substrate and said layer into an intermediate rinse solution, said intermediate rinse solution for assisting in further removing, and for preventing recrystallization of, said dissolved photoresist; d) applying a source of high frequency sonic agitation to said solution and to said layer for a period of minutes; and e) removing said substrate and said layer from said intermediate solution and immediately introducing said substrate and said layer into a water rinse, said rinse for removing traces of said intermediate rinse solution.
Government Interests
[0001] The United States Government has rights in this invention pursuant to Contract No. DE-AC04-94AL85000 between the United States Department of Energy and the Sandia Corporation for the operation of the Sandia National Laboratories.
Provisional Applications (1)
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Number |
Date |
Country |
|
60177929 |
Jan 2000 |
US |
Divisions (1)
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Number |
Date |
Country |
Parent |
09493926 |
Jan 2000 |
US |
Child |
10217690 |
Aug 2002 |
US |