This is a continuation of application Ser. No. 07/807,925, filed Dec. 16, 1991.
Number | Name | Date | Kind |
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3586930 | Das et al. | Jun 1971 | |
4058822 | Awane et al. | Nov 1977 | |
4288802 | Ronen | Sep 1981 | |
5144389 | Nakamura et al. | Sep 1992 |
Entry |
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"Threshold-Voltage Instability in MOSFET's Due to Channel Hot-Hole Emission", Richard B. Fair, Robert C. Sun, IEEE Transactions on Electron Devices, vol. ED-28, No. 1, Jan. 1981, pp. 83-94. |
Number | Date | Country | |
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Parent | 807925 | Dec 1991 |