Patent Application
20120321781
The present invention relates to a surface finishing process in manufacture of printed circuit boards (PCB). The inventive process suppresses extraneous nickel plating on a substrate having a copper patterned surface after activation with an ionic palladium activator.
Surface finishing processes in the manufacture of printed circuit boards add bondable surfaces areas to a printed circuit board where active and passive components can be mechanically and electrically contacted to the PCB. Frequently applied surface finishing processes are the ENIG process (Electroless Nickel Immersion Gold) and Ni/Pd(/Au) processes. In both types of processes, a copper surface of a printed circuit board is activated with an activation composition containing a noble metal ion followed by electroless deposition of nickel.
An activation of a copper surface prior to electroless nickel plating is required because copper is classified as a non-catalytic metal for electroless deposition of for example nickel deposited from hypophosphite containing electrolytes (W. Riedel, Electroless Nickel Plating, ASM International, reprint 1998, p. 189). The purpose of the activation step is to deposit an immersion coating of a catalyst on the copper surface. The catalyst lowers the activation energy and allows the nickel to deposit on the copper surface. Examples of catalysts are palladium and ruthenium (Printed Circuits Handbook, Ed.: C. F. Coombs, Jr., McGraw-Hill, 2001, p. 32.3). Usually, a palladium seed layer is immersion plated onto the copper surface, wherein the palladium ions are deposited onto the copper surface, reduced by copper to metallic state palladium and copper ions are released into the immersion plating bath. The substrate surface areas are then composed of metallic palladium and serve as seeds for the following electroless nickel plating.
It is important to rinse the substrate carefully between activation of the copper surface and electroless nickel plating to remove all excessive noble metal ions. Otherwise precipitates formed of noble metal hydroxides can lead to extraneous (uncontrolled) nickel deposition around individual copper features on the substrate surface and surfaces made of plastic materials. The phrase ‘plastic materials’ comprises bare PCB laminates, solder masks and photoimageable resists such as dry film resists. The noble metal hydroxide precipitates serve as seeds for uncontrolled deposition of nickel. Typical phenomena of extraneous nickel plating are nickel bridges and nickel feet. Extraneous nickel plating can lead for example to circuit shorts, especially in high density circuits with line and space widths of 75 μm or less. Extraneous nickel deposits have a weak adhesion on laminate and solder mask surfaces and can fracture off the PCB and also cause circuit shorts at other locations of the PCB. Nickel bridges between individual copper bond pads or copper trenches can directly result in circuit shorts. Nickel feet around a copper bond pad in fine line circuits also can cause circuit shorts by bridging individual copper bond pads. In addition, palladium ions or precipitates formed thereof adsorbed onto the copper bond pads should not be removed during the activation pre-treatment before electroless nickel plating in order to prevent skip plating. Skip plating is a phenomenon wherein an incomplete nickel plating occurs on the copper bond pads which leads to failures during bonding.
The problem of extraneous plating of nickel is solved in the prior art by different approaches:
Watanabe et al. investigated ionic palladium activators containing ammonium chloride as a complexing agent and sodium dodecyl sulfate as a surfactant.
They claim a negatively charged palladium-chloro complex as the active component in their activator composition which is repulsed by the negatively charged surfactant preferably adsorbed on the dielectric surface areas surrounding the copper bond pads (K. Watanabe, T. Nishiwaki, H. Honma, International Society of Electrochemistry—55th Annual Meeting, Thessaloniki, 19-24 September 2004).
US 2001/0040047 teaches a method which reduces bridging that can occur during plating. Said method comprises the following steps: contacting a circuitized substrate with a swelling agent, treating the substrate with a composition of an alkaline permanganate, a chromate or chlorite salt followed by applying a metal layer on the treated circuitized portion of the substrate. The method is an alternative to the process according to the present invention as no palladium ion activation is applied.
The patent EP 0 707 093 discloses an activator which will selectively activate the copper surfaces for electroless nickel plating and thereby minimize or eliminate extraneous plating. Said activator composition comprises an imidazole compound and may further contain palladium ions.
Excess palladium ions during activation of a copper surface tend to hydrolyze in the rinse step(s) applied before electroless plating of nickel and form palladium-containing precipitates. Said precipitates can be adsorbed onto surface areas of a PCB that are made of polymeric materials or can be trapped in cavities formed between structural features made of copper and polymeric materials, e.g., laminate, photoresist and/or solder mask on a PCB surface (see
A rinse step after activation is required in order to remove all excess palladium ions before contacting the substrate with the electroless nickel plating composition. On the other hand, hydrolysis and precipitation of ionic palladium occurs preferably during such rinse steps. Therefore, at least one rinse step is done in a rinse solution consisting of diluted sulfuric acid. But in case of high density circuits the sulfuric acid rinse is not sufficient to remove the undesired palladium ions and palladium hydroxide precipitates. Extraneous nickel plating occurs during successive electroless nickel plating leading to circuit shorts.
It is an object of the present invention to provide a process for electroless deposition of nickel onto a copper surface of a PCB substrate which suppresses extraneous nickel plating.
The deposition of ionic palladium or precipitates formed thereof shall only occur on surface areas of the PCB substrate designated for nickel plating. This can be achieved by applying the inventive pre-treatment composition for electroless nickel plating. Said pre-treatment composition comprises at least two different types of acids wherein one type of acid is an amino carboxylic acid. The palladium ions and precipitates formed thereof can be easily rinsed off from the plastic material surface of the PCB substrate by contacting the PCB substrate after activation with the pre-treatment composition according to the invention. Extraneous nickel plating in areas of the PCB substrate surface not desired for nickel plating is then suppressed.
The process for deposition of electroless nickel according to the present invention comprises the following steps:
Compositions for activation of copper surfaces for electroless nickel plating are well known in the art (K. Johal, SMTA International, Chicago, October 2001, Proceedings of the Technical Program, 612-620). Acidic solutions of palladium ions are frequently applied for said purpose. Such solutions comprise at least one acid, at least one source of palladium ions and optionally a surfactant. The at least one acid is selected from the group comprising hydrochloric acid, sulfuric acid, toluene sulfonic acid and methane sulfonic acid. The concentration of the at least one acid preferably ranges from 25 g to 150 g/l, more preferred 50 g/l to 100 g/l. The at least one source of palladium ions preferably is selected from the group comprising palladium chloride, palladium sulphate and palladium acetate. The concentration of the at least one source of palladium ions ranges from 10 mg/l to 100 mg/l, more preferred from 30 mg/l to 70 mg/l. The PCB substrate is contacted with such an activator solution at a temperature in the range of 10° C. to 40° C., more preferred 20° C. to 30° C. for 30 s to 300 s, more preferred 60 s to 240 s.
The pre-treatment composition for electroless nickel plating comprises a mixture of at least two different types of acids, wherein one type of acid is an organic amino carboxylic acid.
In one embodiment of the invention, the at least one amino carboxylic acid is selected from compounds represented by formula 1 or formula 2:
wherein R11, R12, R21 and R22 are independently selected from the group consisting of H, C1-C4 alkyl, linear or branched; R31, R32, R33, R34 and R35 are independently selected from the group consisting of H, phenyl, benzyl, C1-C4 alkyl, linear or branched, substituted or unsubstituted, wherein the substituents are selected from the group consisting of —OH, —SH, —NH2, —COOH; R41 and R42 are independently selected from the group consisting of H, C1-C4 alkyl, linear or branched, or a suitable counter ion for example Na+, K+, NH4+.
Preferably R11, R12, R21 and R22 are selected from H, methyl and ethyl. Preferably R31, R32, R33, R34 and R35 are independently selected from the group consisting of H, methyl, ethyl, —CH2OH, —CH2NH2, —CH2COOH, —CH2CH2OH, —CH2CH2NH2, —CH2CH2COOH, —CH2SH, —CH2CH2SH and —CH2CONH2.
Preferred organic amino carboxylic acids are selected from the group consisting of alanine, asparagine, aspartic acid, cysteine, glutamic acid, glycine, isoleucine, leucine, lysine, serine, methionine, threonine, valine, N,N-dimethyl glycine, β-alanine, β-leucine, β-isoleucine, β-glutamine, β-glutamic acid, β-methionine, β-asparagic acid.
The at least one amino carboxylic acid is present in the pre-treatment composition in a concentration of 0.1 g/l to 100 g/l, more preferred 0.5 g/l to 50 g/l and most preferred 1 g/l to 15 g/l.
The at least one acid present in the pre-treatment composition which is not an amino carboxylic acid preferably can be selected from the group consisting of sulfuric acid, hydrochloric acid, toluene sulfonic acid, methane sulfonic acid, formic acid and acetic acid. The total amount of acids which are not organic amino carboxylic acids ranges from 25 g/l to 150 g/l, more preferred from 50 g/l to 100 g/l. The most preferred mixture of acids in the pre-treatment composition consists of sulphuric acid and an organic amino carboxylic acid.
The pre-treatment composition according to the present invention may further contain a surfactant.
The pH value of the pre-treatment composition is preferably <1.
At least one additional rinse step between process steps i. and ii. using essentially water is optional. At least one additional rinse step between process step ii. and iii. Is applied using essentially water is mandatory.
The substrate having an activated copper surface is contacted with the inventive pre-treatment composition at a temperature of 10° C. to 50° C., more preferred 15° C. to 40° C. The contact time ranges from 30 s to 10 min, more preferred 1 min to 6 min.
There is no risk of nickel skip plating as re-dissolution of palladium from the copper surface does not occur when contacting the PCB substrate with the inventive pre-treatment composition. Skip plating means a lack of electroless nickel plating on copper surface areas where the copper is not sufficiently activated. Furthermore, the pre-treatment composition is very tolerant against drag over from the activator tank.
The invention will now be illustrated by reference to the following non-limiting examples.
A PCB substrate 2 having electroplated copper bond pads was contacted with an activator composition comprising 50 mg/l Pd2+ ions and 90 g/l sulfuric acid at a temperature of 23° C. for 3 min. In the next step said substrate was rinsed with a pre-treatment solution consisting of 60 g/l sulfuric acid at 20° C. for 5 min and then rinsed with water. As the final step nickel was deposited from an electroless nickel electrolyte (Aurotech® CNN, a product of Atotech Deutschland GmbH). The substrate surface was then investigated with an optical microscope (
A PCB substrate having electroplated copper and solder mask surface areas was contacted with an activator composition comprising 50 mg/l Pd2+ ions and 90 g/l sulfuric acid at a temperature of 23° C. for 3 min. In the next step said substrate was rinsed with a pre-treatment solution consisting of 60 g/l sulfuric acid and 3 g/l alanine at 20° C. for 5 min and then rinsed with water. As the final step nickel was deposited from an electroless nickel electrolyte (Aurotech® CNN, a product of Atotech Deutschland GmbH). The substrate surface was then investigated with an optical microscope (
Copper bond pads 1 on the surface of a PCB substrate 2 were activated with a solution of palladium ions comprising 50 mg/l Pd2+ ions and 90 g/l sulfuric acid at a temperature of 23° C. for 3 min. In the next step said substrate was rinsed with a pre-treatment solution consisting of 60 g/l sulfuric acid at 20° C. for 5 min and then rinsed with water. As the final step nickel was deposited from an electroless nickel electrolyte (Aurotech® CNN, a product of Atotech Deutschland GmbH) and coated with a thin gold layer from an immersion gold electrolyte (Aurotech® SF Plus, a product of Atotech Deutschland GmbH). Cross-sections of nickel 6 and gold 7 coated copper bond pads 1 were made and investigated with a scanning electron microscope (SEM) in order to determine the nickel foot 8 around copper bonding pads 1. One typical nickel foot 8 observed is shown in
Copper bond pads 1 on the surface of a PCB substrate 2 were activated with a solution of palladium ions as described in example 3, rinsed with water and then contacted with an inventive pre-treatment composition consisting of 60 g/l sulfuric acid and 3 g/l alanine, rinsed with water and then coated with nickel and gold as described in example 3. Cross-sections of nickel 6 and gold 7 coated copper bond pads 1 were made and investigated with a scanning electron microscope (SEM) in order to determine the nickel foot 8 around copper bonding pads 1. One typical nickel foot 8 observed is shown in
| Number | Date | Country | Kind |
|---|---|---|---|
| 09155882.5 | Mar 2009 | EP | regional |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/EP2010/053188 | 3/12/2010 | WO | 00 | 9/1/2011 |
