Number | Name | Date | Kind |
---|---|---|---|
5943551 | Schemmel et al. | Aug 1999 | A |
6011619 | Steffan et al. | Jan 2000 | A |
6017771 | Yang et al. | Jan 2000 | A |
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Huang et al., Wafer Testing with Pairwise Comparisons, pp. 374-383, (IEEE), 1992.* |
Kondo et al., A real time Process Control System for IC Testing, pp. 331-338, (IEEE), 1991.* |
Huang et al., A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing, pp. 363-372, (IEEE), 1995. |