Claims
- 1. A process of depositing a fullerene coating on a substrate, the method comprising:
a) directing a charged beam in a chamber at a target comprising fullerene at a power adequate to emit fullerene molecules from the target without reacting the fullerene to deposit fullerene on a substrate surface within the chamber.
- 2. The process of claim 1, wherein the chamber is operated at a pressure between about 10−2 and 10−10 torr.
- 3. The process of claim 1, wherein the charged beam is an electron beam.
- 4. The process of claim 1, wherein the charged beam is an ion beam.
- 5. The process of claim 1, wherein the substrate is formed of a material selected from the group consisting of metals and semiconductors and combinations thereof.
- 6. The process of claim 1, wherein the substrate is formed of a material selected from the group consisting of Co—Ni, Co—Cr, Co—Ni—Cr, Co—Pt, Co—Ni—Pt, Co—Cr—Ta, Co—Cr—Pt, Co—Cr—Ni—B, Co—P, Co—Ni—P, PtMn, Cu, Ru, Rh, Ta, CoPt, CoCuPt, Au, rare earth elements, transition metals, mixtures thereof, and alloys thereof.
- 7. The process of claim 1, wherein the fullerene molecules are adhered to the substrate with a fullerene-substrate bond strength corresponding to a fullerene desorption temperature from the monolayer of at least about 700 K.
- 8. The process of claim 1, further including steps of:
b) heating the substrate to a temperature above the fullerene-to-fullerene disorption temperature while depositing fullerene on the substrate.
- 9. The process of claim 8, wherein the fullerene coating on the substrate is an approximate monolayer.
- 10. The process of claim 1, wherein the fullerene is C60.
- 11. The process of claim 1 wherein the substrate surface comprises metal or semiconductor and further comprising:
b) forming a clean metal or semiconductor surface within the chamber.
- 12. The process of claim 1 wherein the charged beam is an electron beam that is directed with a voltage of no more than about 1 kilovolts.
- 13. The process of claim 1 wherein the target comprises a powder of fullerene clusters.
- 14. The process of claim 1 wherein the target comprises a layer of condensed fullerenes.
- 15. A process of forming an approximate monolayer fullerene coating on a metal or semiconductor substrate, the method comprising:
a) depositing fullerene on the substrate over a period of a deposition time; and b) heating the substrate for at least a portion of the deposition time to a temperature above the fullerene-to-fullerene disorption temperature and below the fullerene-to-substrate disorption temperature.
- 16. The process of claim 15, wherein step (b) is performed at a temperature between about 225° C. and 350° C.
- 17. The process of claim 15, wherein the substrate is formed of a material selected from the group consisting of metals and semiconductors and combinations thereof.
- 18. The process of claim 15, wherein the substrate is formed of a material selected from the group consisting of Co—Ni, Co—Cr, Co—Ni—Cr, Co—Pt, Co—Ni—Pt, Co—Cr—Ta, Co—Cr—Pt, Co—Cr—Ni—B, Co—P, Co—Ni—P, PtMn, Cu, Ru, Rh, Ta, CoPt, CoCuPt, Au, rare earth elements, transition metals, mixtures thereof, and alloys thereof.
- 19. The process of claim 15, wherein the fullerene molecules are bonded to the substrate with a bond strength corresponding to a fullerene desorption temperature from the monolayer of at least about 700 K.
- 20. The process of claim 15, wherein the fullerene is C60.
- 21. The process of claim 15 wherein the deposition of fullerenes is performed by sublimation.
- 22. The process of claim 15 wherein the deposition of fullerenes is performed by sputtering a fullerene target.
- 23. The process of claim 15 wherein the substrate is heated for the entire deposition period.
- 24. The process of claim 15 wherein the substrate is heated for a portion of the deposition period to form a fullerene monolayer while the substrate is heated.
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application claims priority of U.S. Provisional Patent Application Ser. No. 60/208,760 filed on Jun. 2, 2000, and of U.S. Provisional Patent Application No. 60/208,761 filed Jun. 2, 2000. This application is related to U.S. application Ser. No. 09/835,120 filed Apr. 13, 2001 by John W. Dykes, Joel W. Hoehn, James E. Angelo and William D. Mosley for “Ultrathin Protective Overcoats for Magnetic Materials”, the disclosure of which is incorporated herein by reference.
Provisional Applications (2)
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Number |
Date |
Country |
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60208760 |
Jun 2000 |
US |
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60208761 |
Jun 2000 |
US |