Number | Date | Country | Kind |
---|---|---|---|
102 05 084 | Feb 2002 | DE |
Number | Name | Date | Kind |
---|---|---|---|
6139625 | Tamatsuka et al. | Oct 2000 | A |
6228164 | Ammon et al. | May 2001 | B1 |
6245311 | Kobayashi et al. | Jun 2001 | B1 |
6336968 | Falster | Jan 2002 | B1 |
6503594 | Park | Jan 2003 | B2 |
6642123 | Mun et al. | Nov 2003 | B2 |
6680260 | Akiyama et al. | Jan 2004 | B2 |
20030056715 | Tachikawa et al. | Mar 2003 | A1 |
20030134492 | Lerch et al. | Jul 2003 | A1 |
Number | Date | Country |
---|---|---|
199 24 649 | Nov 2000 | DE |
199 25 044 | Dec 2000 | DE |
199 41 902 | Mar 2001 | DE |
10055648 | Aug 2001 | DE |
10055648 | Aug 2001 | DE |
829 559 | Mar 1998 | EP |
926 718 | Jun 1999 | EP |
942 077 | Sep 1999 | EP |
1087042 | Mar 2001 | EP |
9838675 | Sep 1998 | WO |
Entry |
---|
English Derwent Abstract AN 2001-309273 corresponding to DE19925044. |
English Derwent Abstract AN 2001-103979 corresponding to DE19924649. |
English Derwent Abstract AN 1998-161363 corresponding to EP829559. |
English Derwent Abstract AN 2001-204398 corresponding to DE 19941902. |
G. Kissinger et al., Electrochem. Soc. Proc. 98-1 (1998), 1095. |
Hull, R. (Ed.), Properties of Crystalline Silicon, The Institution of Electrical Engineers, 1999 p. 489ff. |
Huff, H. R., Fabry L., Kishino S., Semiconductor Silicon 2002, vol. 2, The Electrochemical Society, p. 545. |
English Derwent Abstract AN 2001-607934 corresponding to DE 10055648. |