An Application Data Sheet is filed concurrently with this specification as part of the present application. Each application that the present application claims benefit of or priority to as identified in the concurrently filed Application Data Sheet is incorporated by reference herein in its entirety and for all purposes.
Semiconductor processing tools often use radical sources to distribute radicalized process gas across a semiconductor wafer during processing, e.g., during atomic layer deposition (ALD) processing. Such radical sources may include a faceplate that faces the wafer during processing, and a number of gas distribution holes may be distributed across the faceplate to facilitate radicalized gas delivery to the wafer from within the radical source.
During some semiconductor manufacturing processes, e.g., plasma-enhanced atomic layer deposition (PEALD), semiconductor fabrication process gases may be converted into a plasma to produce radicals used in various process steps. Such plasma-enhanced processes may provide advantages over, for example, thermal atomic layer deposition since such processes may be performed with lower process temperatures and greater flexibility in process chemistry, and may provide denser deposition films. Plasma conversion, however, may also be damaging to the wafer, e.g., by oxidizing the underlying silicon of the wafer or an ultra-low K dielectric used in the process. To reduce such damage potential, such plasmas may be located so as to be “remote” from the wafer; such processes are commonly referred to as remote plasma atomic layer deposition (RPALD) processes. For example, some radical sources may have an internal volume within which the plasma may be generated. This internal volume may be separated from the wafer by the radical source faceplate (making the plasma “remote” from the wafer), somewhat shielding the wafer from possible damage arising from plasma conversion. The gas distribution holes in the faceplate may allow radicals produced by the remotely-generated plasma to flow out of the radical source and onto the wafer.
The purge cycles are needed to mitigate or eliminate the possibility that the precursor gas will mix with the radicalized gas that is flowed into the reactor, and vice-versa. Such precursor/radicalized gas mixing can lead to precursor/radical reactions that, in effect, transform an ALD process into a chemical vapor deposition (CVD) process. Since one of the benefits of ALD, PEALD, and RPALD is that such processes allow for thin film depositions of much higher conformality than CVD processes, such precursor/radical mixing is highly undesirable. Another undesirable side effect of such mixing is that some ALD chemistries may, when mixed, form particulates that may interfere with ALD processing, e.g., by creating electrical shorts or other problems. Accordingly, each precursor and radical flow into the reactor is separated by a flow of purge gas into the reactor.
While ALD-type processes provide superior film uniformity as compared with CVD films, ALD-type processes are generally slower than CVD processes since ALD requires that a film be built up by many sequential reaction cycles (a single reaction cycle may, for example, correspond to blocks 104 through 110 of
Details of one or more implementations of the subject matter described in this specification are set forth in the accompanying drawings and the description below. Other features, aspects, and advantages will become apparent from the description, the drawings, and the claims. Note that the relative dimensions of the following figures may not be drawn to scale unless specifically indicated as being scaled drawings.
In some implementations, a radical source for semiconductor processes may be provided. The radical source may include a faceplate. The faceplate may include a first plurality of gas distribution holes passing through the faceplate and exiting the radical source, and the first plurality of gas distribution holes may have a first total flow conductivity. The radical source may also include a first plenum volume partially bounded by the faceplate and a baffle having a first side and a second side opposing the first side. The baffle may be offset from the faceplate with the first side facing the faceplate. The baffle may divide the first plenum volume into a baffle volume located between the first side of the baffle and the faceplate and a remote volume partially bounded by the second side of the baffle. The baffle may also include a plurality of baffle holes fluidly connecting the baffle volume and the remote volume, the baffle holes having a total flow conductivity that is greater than the first total flow conductivity. The radical source may also include one or more baffle gas inlets configured to flow baffle gas into the baffle volume and one or more first process gas inlets configured to flow a first process gas into the remote volume.
In some implementations of the radical source, the one or more baffle gas inlets may be configured to flow the baffle gas into the baffle volume without first exposing the baffle gas to the remote volume and without first exposing the baffle gas to the first gas distribution holes.
In some implementations of the radical source, the one or more first process gas inlets may be configured to flow the first process gas into the remote volume without first exposing the first process gas to the baffle.
In some implementations of the radical source, the radical source may also include a remote plasma dome connected with the faceplate. In such implementations, the remote volume may be substantially defined by the baffle and the remote plasma dome. In some such implementations, the radical source may further include a radio-frequency generator configured to ignite a plasma using the first process gas within the remote volume.
In some implementations of the radical source, the radical source may further include a cover connected with the faceplate. The cover may include the one or more first process gas inlets. The radical source may also include an external remote plasma generator connected with the one or more first process gas inlets. The external remote plasma generator may be configured to supply radicalized first process gas to the remote volume via the one or more first process gas inlets.
In some implementations of the radical source, the radical source may also include an electrode plate connected with, and offset from, the baffle. The remote volume may be formed between the electrode plate and the baffle, and the electrode plate may be configured to ignite a plasma within the remote volume using the first process gas.
In some implementations of the radical source, the faceplate may be a dual-flow faceplate with a plurality of second gas distribution holes fluidly connected to a set of gas distribution channels within the faceplate. The gas distribution channels may be fluidly connected to one or more second process gas inlets and the second gas distribution holes may exit the faceplate on a side opposite the baffle.
In some implementations of the radical source, the baffle may be made from quartz or may be quartz-coated.
In some implementations of the radical source, the baffle volume may be further bounded by one or more outer circumferential surfaces and the one or more baffle gas inlets may be located along one or more of the outer surfaces of revolution.
In some implementations of the radical source, the radical source may further include a plurality of baffle gas inlets arranged across a side of the faceplate facing the baffle. The baffle gas inlets may fluidly connect to a set of baffle gas distribution channels within the faceplate and the baffle gas distribution channels may be configured to flow baffle gas into the baffle volume via the baffle gas inlets.
In some implementations of the radical source, the faceplate and the baffle may be of substantially the same size.
In some implementations of the radical source, the baffle volume may be an order of magnitude or more thinner in an axial direction substantially perpendicular to the faceplate than the remote volume is in the axial direction.
In some implementations of the radical source, the first gas distribution holes and the baffle holes may be arranged in matching patterns and the baffle holes may be larger than the first gas distribution holes.
In some implementations of the radical source, the first gas distribution holes and the baffle holes may be arranged in non-matching patterns. In some such implementations, the first gas distribution holes and the baffle holes may not overlap one another.
In some implementations of the radical source, the baffle may be liquid-cooled. In some such implementations, the baffle may include internal cooling passages that traverse the baffle and that do not intersect any of the baffle holes.
In some implementations of the radical source, the radical source may further include one or more baffle gas inlet pressure control valves configured to control baffle gas flow from the baffle gas inlets into the baffle volume and a controller including a memory device and one or more processors communicatively connected with the memory device and the one or more baffle gas inlet pressure control valves. The memory may store computer-executable instructions for controlling the one or more processors to open the one or more baffle gas inlet pressure control valves during first operations of an atomic layer deposition (ALD) cycle performed with the radical source where radicalized first process gas is to be substantially prevented from flowing through the faceplate via the first gas distribution holes, substantially close the one or more baffle gas inlet pressure control valves during second operations of the ALD cycle, the second operations including flowing radicalized first process gas through the faceplate via the first gas distribution holes, and repeat the first operations and the second operations in an alternating manner.
In some such implementations of the radical source, the faceplate may be a dual-flow faceplate with a plurality of second gas distribution holes fluidly connected to a set of gas distribution channels within the faceplate and the gas distribution channels may be fluidly connected to one or more second process gas inlets. The second gas distribution holes may exit the faceplate on a side opposite the baffle. In such implementations, the first operations may include flowing a second process gas out of the faceplate via the second gas distribution holes, and performing purge operations between each successive first operation and second operation and between each successive second operation and first operation.
In some implementations of the radical source, the radical source may further include a pumping port fluidly connected to the remote volume such that the baffle volume is not interposed between the remote volume and the pumping port.
In some implementations of the radical source, the one or more first process gas inlets and the one or more baffle gas inlets may be connected to the same gas source or separate sources of substantially the same gas.
In some such implementations, a three-way valve or other valve arrangement facilitating switchable gas delivery from a common source to one of two separate flow paths may be used to connect the one or more first process gas inlets and the one or more baffle gas inlets to the gas source.
In some implementations a method of operating a radical source in a remote plasma atomic layer fabrication process may be provided. The method may include providing radicalized first process gas within a remote volume of a radical source and flowing baffle gas into a baffle volume of the radical source. The baffle volume may be interposed between the remote volume and a faceplate of the radical source and have a plurality of first gas distribution holes facing a wafer reaction area. The baffle volume may be partitioned from the remote volume by a baffle and may be fluidly connected with the remote volume through the baffle by a plurality of baffle holes. The method may further include flowing a second process gas through a plurality of second gas distribution holes in the faceplate and towards the wafer reaction area and substantially stopping the flow of the second process gas through the plurality of second gas distribution holes. The method may also further include performing a first purge of the wafer reaction area to remove unreacted second process gas from the wafer reaction area after flow of the second process gas through the plurality of second gas distribution holes has been stopped, substantially stopping the flow of the baffle gas into the baffle volume after the first purge is complete, flowing the radicalized first process gas from the remote volume into the baffle volume, through the first gas distribution holes in the faceplate, and into the wafer reaction area, performing a second purge of the wafer reaction area, and restarting the flow of the baffle gas into the baffle volume. The activities from flowing a second process gas through a plurality of second gas distribution holes onwards may be repeated for each cycle in the atomic layer process.
In some such implementations of the method, the method may also include relieving pressure built up in the remote volume via a pumping port while the baffle gas is flowed into the baffle volume.
In some implementations of the method, the method may further include flowing a coolant through cooling channels in the baffle.
These and other aspects of various implementations are explained in more detail below.
Examples of various implementations are illustrated in the accompanying drawings and described further below. It will be understood that the discussion herein is not intended to limit the claims to the specific implementations described. On the contrary, it is intended to cover alternatives, modifications, and equivalents as may be included within the spirit and scope of the invention as defined by the appended claims. In the following description, numerous implementation-specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may be practiced without some or all of these implementation-specific details. In other instances, well-known process operations have not been described in detail in order not to unnecessarily obscure the present invention.
The present inventor has realized that RPALD processes suffer significant increases in processing time due to the fact that the remote plasma source that generates the radicals must typically be turned off during the process phases where radicals are not desired, e.g., precursor flow and purge gas flows, and then re-ignited to provide radicals for the radical flow phase. The time needed for such plasma re-ignition may adversely affect process through-put by introducing unneeded delay.
Moreover, remote plasma sources may also need to be purged of radicals after the radical flow phase to prevent radicals that are still present within the remote plasma source volume from seeping into the reaction area. The present inventor has also realized that remote plasma sources are often quite voluminous, and thus the time to purge remote plasma sources can be unacceptably long compared with other process steps. Both of these delays would be repeatedly encountered during RPALD processing.
The present inventor has realized that a new radical source design for use with remote plasma sources may allow for the remote plasma source to remain lit during the precursor gas delivery and purge gas delivery phases as well as during the radical delivery phase and that obviates the need to completely purge the remote plasma source of radicals during non-radicalized gas delivery phases. This drastically reduces the duration of each ALD reaction cycle since it is no longer necessary to extinguish/reignite the remote plasma source, nor is it necessary to purge the entire volume of the remote plasma source.
The radical source 200 may include a plasma dome 202 and a dual-flow faceplate 208. In some implementations, a simple faceplate, i.e., one that does not provide dual-flows, may be used. In the depicted implementation, however, a dual-flow faceplate is used. Also depicted is a baffle 210 that may separate a first plenum volume that is substantially bounded by the plasma dome 202 and the dual-flow faceplate 208 into a remote volume 268 and a baffle volume 270. The plasma dome 202 may have a first process gas inlet 222 configured to introduce a first process gas into the plasma dome 202 near the top of the plasma dome 202. A first process gas inlet mass flow controller 294 may be configured to allow the first process gas flow to be increased or decreased. In some implementations, a first process gas inlet valve 230, e.g., a gate valve or other mechanical seal valve also may be provided in order to seal the first process gas inlet 222. The first process gas inlet valve 230 may be located downstream of the first process gas inlet mass flow controller 294. In some implementations, a single valve may be used to provide both pressure control and sealing functions.
An RF generator 286 may be located outside of the plasma dome and configured to provide RF energy to RF coils 212 for generating a plasma within the plasma dome 202 from the first process gas, thereby generating first process gas radicals, i.e., radicalized first process gas, that may be flowed across the wafer as needed. A matching network 288 may be placed in series between the RF generator 286 and the RF coils 212 to ensure that the RF power is coupled to the RF coils correctly, i.e., the matching network 288 matches the impedance of the RF coils and the plasma that is generated.
The dual-flow faceplate 208 may include a set of first gas distribution holes 240 that pass completely through the dual-flow faceplate 208. The first gas distribution holes 240 allow gas that is within the baffle volume 270 to flow through the dual-flow faceplate 208 and towards the wafer support 216. Thus, for example, the first process gas that may be flowed into the plasma dome 202 via the first process gas inlet 222 may flow through the baffle 210, through the first gas distribution holes 240, and exit the dual-flow faceplate 208 from the side of the dual-flow faceplate 208 facing the wafer support 216.
The dual-flow faceplate 208 may also include a set of second gas distribution holes 242 that pass through the side of the dual-flow faceplate 208 that faces the wafer support 216 and that do not exit the side of the dual-flow faceplate 208 that faces away from the wafer support 216. The second gas distribution holes 242 may instead intersect with an internal flow passage or passages that traverse the dual-flow faceplate 208 and connect to a second process gas inlet 224. Thus, a second process gas, e.g., a gas such as the precursor discussed with reference to
In addition to the baffle 210, the radical source 200 pictured in
The gas flows of the first process gas and the second process gas may be kept isolated from one another within the radical source 200 by virtue of the separate plenum spaces and gas distribution holes associated with each process gas. Once the process gases have left the radical source via the dual-flow faceplate 208, however, the separate plenum spaces no longer provide any isolative effect. The first process gas and the second process gas may, however, be kept further isolated from one another by performing purge cycles in between the sequential flows of such process gases. The purge cycles may be used to remove unreacted process gases from the wafer reaction area between the radical source 200 and the wafer support 216. This prevents, for example, unreacted first process gas in the wafer reaction area from mixing with newly-introduced second process gas, and vice versa, which could result in the ALD process being transformed, in effect, into a CVD process, resulting in a loss of the process uniformity that ALD provides. Such purge operations are covered in further detail below.
The total flow conductance through the baffle 210 via the baffle holes 244 may be higher than the total flow conductance through the dual-flow faceplate 208 via the first gas distribution holes 240. Due to the flow conductance mismatch between the first gas distribution holes 240 and the baffle holes 244, the baffle gas may biased towards flow into the remote volume 268 and may, as it flows through the baffle holes 244 and enters the remote volume 268, counteract flow of the radicalized first process gas through the baffle holes 244. This may effectively prevent radicals in the first process gas from travelling through the baffle volume 270 and the first gas distribution holes 240 to reach the wafer 214. At the same time, the second process gas may flow into the dual-flow faceplate 208 via the second process gas inlet 224 and may exit the dual-flow faceplate 208 through the second gas distribution holes 242. The second process gas may then flow across the wafer and react with the wafer without, or substantially without, encountering radicals of the first process gas.
One issue with radical sources that are similar to the radical source 200 but that lack a baffle system such as that described is that, absent the baffle system, the plenum volume corresponding to the remote volume 268 and the baffle volume 270 in the illustrated example must generally be purged during each deposition cycle to prevent radicals within the plenum volume from flowing through the first gas distribution holes and into the wafer reaction area while the second process gas is being introduced into the wafer reaction area. Since the remote volume 268 and the baffle volume 270 are, relatively speaking, large when compared to other system volumes, purging this plenum volume may take an inordinate amount of time compared to a purge, for example, of the second process gas distribution channels within the faceplate. Moreover, such a purge would also generally require that the plasma be extinguished. When a subsequent processing operation requiring radicals generated within the plasma dome 202 is performed, the plenum volume must be re-filled with first process gas and the plasma must be re-ignited. The inclusion of a baffle system such as that shown in the Figures avoids many of these issues by allowing a reservoir of radicalized first process gas to be maintained within the remote volume 268 throughout the entire ALD cycle, including during second process gas flow into the wafer reaction area as well as during purge operations.
After the additional purge operation is completed, additional ALD cycles may be performed by repeating the operations depicted in
The baffle 210 also, in some implementations, may be cooled during ALD cycles. For example, the baffle 210 may have internal cooling channels 246 that thread between the baffle holes 244. Coolant, e.g., water or other liquid, may be introduced into the cooling channels 246 through a coolant inlet 218 and may exit the cooling channels via a coolant outlet 220. The coolant may be passed through a heat exchanger or other heat dissipation system before being recirculated through the baffle 210. Alternatively, the coolant may not be recirculated at all but may instead be connected with a facility supply and drain. Cooling the baffle 210 may reduce the possibility of recombination of the radicals with, for example, the baffle 210.
In some implementations, a vacuum pump port 206 may be included to allow excess pressure build-up in the remote volume 268 resulting from the introduction of the baffle gas and consequent reduction in radicalized first process gas flow to be relieved, thus preventing over-pressurization of the plasma dome 202. A vacuum port valve 236 may be provided to seal the vacuum pump port 206 from the remote volume 268. A mass flow controller 238 may be provided to allow for fine control of the pressure of the vacuum pump port 206 during pressure bleed-off; the mass flow controller 238 may operate in tandem with a pressure sensor (not shown), e.g., a capacitance manometer, to control pressure in the vacuum pump port 206. Other flow-controlling valve technologies may be used as appropriate in place of the mass flow controller 238.
A variety of baffle gases may be used in such implementations. The baffle gas may be selected so as to not interfere, or minimally interfere, with the plasma generated in the remote volume 268 or with the absorption of the process gases into the wafer. In some implementations, the baffle gas may be the same as the first process gas. For example, in some remote plasma atomic layer deposition (RPALD) processes, such as a process for depositing SiO2, the first process gas may be O2 or N2O, and substantially the same gas may be used as the baffle gas. In such implementations, the plasma composition remains substantially unchanged when the baffle gas is introduced, and it may be possible to deactivate the flow of the first process gas into the remote volume 268 entirely since the plasma may continue to be fed by the baffle gas. This may have the effect of reversing the flow of gas within the remote volume 268. Instead of flowing from the top of the plasma dome 202 towards the baffle 210 (and towards the wafer 214), the gas may flow from the baffle 210 towards the top of the plasma dome 202 (and away from the wafer 214). In some such implementations, the first process gas and the baffle gas may be provided from the same source. For example, a first process gas source may be connected to the inlet port or ports of one or more three-way valves. The first process gas inlet(s) may, in turn be connected to one outlet port or ports of the three-way valves, and the baffle gas inlet(s) may be connected to the other outlet port or ports of the three-way valves. In this manner, the three-way valves may serve as a toggle that controls the directionality of gas flow within the remote volume 268. In some such reverse-flow implementations, the mass flow controller 238 in the vacuum port 206 may be opened to facilitate the reverse gas flow.
It is to be understood that several of the features shown in
For clarity,
Some other implementations may provide a blend of the features shown in
While
The radical source 400 may include a baffle 410 that is formed from two pieces: a baffle top portion 448 and a baffle bottom portion 450. Such a two-piece construction may allow for internal features, e.g., cooling channels 446, to be incorporated inside of the baffle 410. For example, in
The radical source 400 may also include a dual-flow faceplate 408 that is similarly formed from two pieces: a faceplate top portion 462 and a faceplate bottom portion 464. The faceplate bottom portion 464 may include both first gas distribution holes 440 and second gas distribution holes 442, as well as internal gas distribution channels 482 configured to route gas from second process gas inlets to the second gas distribution holes 442. The faceplate top portion 462 may also include the first gas distribution holes 440, and may also include matching gas distribution channels 482 that, when the faceplate top portion 462 and the faceplate bottom portion 464 are mated together, combine with the gas distribution channels 482 on the faceplate bottom portion 464 to form a single set of internal gas distribution channels 482 extending into both the faceplate top portion 462 and the faceplate bottom portion 464.
In some implementations, the faceplate or dual-flow faceplate may also feature internal cooling channels through which fluid may be flowed in order to cool or heat the faceplate. The cooling channels may be sealed from the gas flow paths and process volumes of the radical source and processing apparatus to avoid contamination of the process environment by the fluid. The cooling channels may allow the faceplate to be temperature-controlled so as to enhance process efficiency.
As can be seen in
The radical source 400 may also include an adapter ring 452. The adapter ring 452 may include various features such as threaded interfaces for receiving fittings for connection to process gas sources, coolant systems, etc. A gasket plate 454 may, if needed, be used to provide additional sealing surfaces between various components in the radical source 400. The various components shown in
As can be seen, the baffle top portion 448 and the baffle bottom portion 450 may both have the form of flanged circular plates that nest together. Other geometries are possible as well depending on design and packaging requirements. In the depicted implementation, coolant may be fed into the baffle 410 through coolant inlets 418 in adapter ring 452. The coolant inlets 418 may exit the adapter ring 452 via coolant transfer ports 480, which may be interfaced with coolant inlet ports 474 in the baffle bottom portion 450. The coolant inlet ports 474 may feed into cooling feed channels 456 recessed into the flange of the baffle top portion 448 (see reverse isometric exploded views) and route coolant to coolant risers 478 that may be used to feed coolant into the cooling channels 446 in the baffle bottom portion 450. Other coolant risers 478 may be fluidly connected with the exits of the serpentine cooling passages 446 and pass the coolant through coolant outlet ports 476 and mating coolant transfer ports 480 to coolant outlets 420. Other cooling arrangements are possible as well, e.g., different cooling passage geometries/routing. As noted previously, some implementations may not feature a cooled baffle and the various features associated with baffle cooling may be omitted in such implementations.
The adapter ring may also feature one or more baffle gas inlets 426 that are configured to allow for the introduction of a baffle gas into the baffle volume bounded by the baffle 410 and the dual-flow faceplate 408. In this implementation, six baffle gas inlets 426 equally spaced about the adapter ring 452 are used to provide baffle gas to the baffle volume via radial baffle gas outlets 472.
The gasket plate 454 may serve as an intermediate sealing surface for the various gas routing passages that are present in the radical source 400. In some implementations, depending on how such routing is performed, the gasket plate 454 may be unnecessary and be omitted.
As noted, the dual-flow faceplate 408 may be constructed in a somewhat similar manner to the baffle 410 (with cooling). For example, the dual-flow faceplate 408 may be formed from a faceplate top portion 462 and a faceplate bottom portion 464. The faceplate top portion 462 and the faceplate bottom portion 464 may, as shown, have the overall shape of a set of nested flanged plates, although other geometries are also considered within the scope of this disclosure. One or both of the faceplate top portion 462 and the faceplate bottom portion 464 may feature gas distribution channels 482, in this case forming a network of radial and circumferential passages, traversing mating surfaces of the faceplate top portion 462 and the faceplate bottom portion 464. The first gas distribution holes 440 may travel through both the faceplate top portion 462 and the faceplate bottom portion 464, whereas the second gas distribution holes 442 may travel only through the faceplate bottom portion 464 and link up with the gas distribution channels 482. Second process gas transfer ports 484 may allow for the second process gas to be routed to the gas distribution channels 482 without mixing with the first process gas or the baffle gas within the radical source.
It is to be understood that while the above discussion regarding radical sources has been in the context of RPALD processes, such equipment may also be of use in any semiconductor fabrication process involving remote plasma generation and radical flows and precursor gas flows that are preferably kept separated in time and space. For example, such equipment may be used in an atomic layer etch (ALE)-type process where conformal layers of material are etched away using alternating applications of radicals and one or more precursor(s). In general, references to an atomic layer process are to be understood to refer to any conformal process that involves atomic layering, whether it be atomic layer deposition, atomic layer etch, or some other process with similar fundamental characteristics.
In block 508, a baffle gas may be flowed into a baffle volume such as the baffle volume described earlier in this disclosure. In some implementations, the baffle gas may be the same as the first process gas, and may also serve as the first process gas flow of block 504. The baffle gas flow may act to keep the radicalized first process gas from escaping the remote volume and flowing through a faceplate such as the faceplates described earlier in this disclosure. In block 510, a second process gas may be flowed from the faceplate, into a wafer reaction area, and deposited on a semiconductor wafer or substrate. After sufficient deposition has occurred, the second process gas flow may be stopped, and a purge of the wafer reaction area begun in block 512.
After the purge operation of block 512 is complete, the baffle gas flow into the baffle volume may be stopped in block 514, allowing radicalized first process gas from the remote volume to flow into the wafer reaction area via first gas distribution holes in the faceplate in block 516. When sufficient radicalized first process gas has been provided to the wafer reaction area and sufficient reaction time has elapsed, the baffle gas flow into the baffle volume may be re-started in block 518, curtailing further radicalized first process gas flow from the remote volume into the wafer reaction area. A further purge operation may be performed in block 520 to clear unreacted radicalized first process gas from the wafer reaction area. In block 522, a decision may be made as to whether further ALD cycles are needed. If so, the technique may return to block 510. If not, the technique may continue to block 524, where the plasma may be extinguished. The technique may end in block 526. It is to be understood that, depending on the particular fabrication process within which technique 500 is performed, additional steps may be performed after block 526, or in between any of the blocks shown.
In block 514, the flow of the first process gas into the remote volume may be stopped. Block 514 is optional and may, in some cases, be omitted. For example, if the baffle gas is of sufficiently similar composition to the first process gas, the first process gas may be stopped and the plasma may be fed with the baffle gas. However, if the baffle gas is not sufficiently similar in composition to the first process gas to keep the plasma lit, then the first process gas may continue to be supplied to the remote volume.
In block 516, gas may be evacuated from the remote volume via a pumping port. This may be done to prevent over-pressurization of the plasma dome. Such evacuation may be unnecessary if the pressure environment within the remote volume stays within acceptable bounds. Accordingly, block 516 may be optional in some implementations.
In block 518, the flow of baffle gas into the remote volume is stopped. This may allow the first process gas and radicals within the remote volume to continue to flow towards the wafer. If the first process gas has been turned off in block 514, the flow of first process gas may be restarted in optional block 520. The purge cycle may end in block 522.
In block 524, a determination may be made as to whether further processing involving the remotely-generated plasma is warranted. If so, the technique may return to block 508. If not, the technique may proceed to block 526, where the plasma may be extinguished. The technique may end in block 528, although it is to be recognized that various other steps or actions may be performed after block 528 depending on the semiconductor fabrication process used.
The apparatus/process described hereinabove may be used in conjunction with lithographic patterning tools or processes, for example, for the fabrication or manufacture of semiconductor devices, displays, LEDs, photovoltaic panels and the like. Typically, though not necessarily, such tools/processes will be used or conducted together in a common fabrication facility. Lithographic patterning of a film typically comprises some or all of the following steps, each step enabled with a number of possible tools: (1) application of photoresist on a workpiece, i.e., wafer, using a spin-on or spray-on tool; (2) curing of photoresist using a hot plate or furnace or UV curing tool; (3) exposing the photoresist to visible or UV or x-ray light with a tool such as a wafer stepper; (4) developing the resist so as to selectively remove resist and thereby pattern it using a tool such as a wet bench; (5) transferring the resist pattern into an underlying film or workpiece by using a dry or plasma-assisted etching tool; and (6) removing the resist using a tool such as an RF or microwave plasma resist stripper.
Another aspect of the invention is an apparatus configured to accomplish the methods described herein. A suitable apparatus includes hardware for accomplishing the process operations and a system controller having instructions for controlling process operations in accordance with the present invention. The system controller may be configured, for example, to operate valves controlling the flow of first process gases, second process gases, and baffle gases into the radical sources described herein. The system controller may also be configured to control flow of coolant through the baffle, and to control the operation of the RF generator hardware. The system controller may receive data from one or more sensors, e.g., temperature sensors, pressure sensors, etc., in order to control the radical source in accordance with semiconductor process requirements. The system controller will typically include one or more memory devices and one or more processors configured to execute the instructions so that the apparatus will perform a method in accordance with the present invention. Machine-readable media containing instructions for controlling process operations in accordance with the present invention may be communicatively coupled to the system controller.
Any of the above implementations may be used alone or together with one another in any combination. Although various implementations may have been motivated by various deficiencies with the prior art, which may be discussed or alluded to in one or more places in the specification, the implementations do not necessarily address any of these deficiencies. In other words, different implementations may address different deficiencies that may be discussed in the specification. Some implementations may only partially address some deficiencies or just one deficiency that may be discussed in the specification, and some implementations may not address any of these deficiencies.
While various implementations have been described herein, it should be understood that they have been presented by way of example only, and not limitation. Thus, the breadth and scope of the present disclosure should not be limited by any of the implementations described herein, but should be defined only in accordance with the following and later-submitted claims and their equivalents.
It will be understood that unless features in any of the above-described implementations are expressly identified as incompatible with one another or the surrounding context implies that they are mutually exclusive and not readily combinable in a complementary and/or supportive sense, the totality of this disclosure contemplates and envisions that specific features of those implementations can be selectively combined to provide one or more comprehensive, but slightly different, technical solutions. It will therefore be further appreciated that the above description has been given by way of example only and that modifications in detail may be made within the scope of the disclosure.
Number | Name | Date | Kind |
---|---|---|---|
5597439 | Salzman | Jan 1997 | A |
5614026 | Williams | Mar 1997 | A |
5871586 | Crawley et al. | Feb 1999 | A |
5919382 | Qian et al. | Jul 1999 | A |
5994662 | Murugesh | Nov 1999 | A |
6036878 | Collins | Mar 2000 | A |
6054013 | Collins et al. | Apr 2000 | A |
6059885 | Ohashi et al. | May 2000 | A |
6089472 | Carter | Jul 2000 | A |
6148761 | Majewski et al. | Nov 2000 | A |
6200412 | Kilgore et al. | Mar 2001 | B1 |
6205869 | Schadt et al. | Mar 2001 | B1 |
6251188 | Hashimoto et al. | Jun 2001 | B1 |
6291793 | Qian et al. | Sep 2001 | B1 |
6306247 | Lin | Oct 2001 | B1 |
6364949 | Or et al. | Apr 2002 | B1 |
6387182 | Horie et al. | May 2002 | B1 |
6387207 | Janakiraman et al. | May 2002 | B1 |
6537419 | Kinnard | Mar 2003 | B1 |
6565661 | Nguyen | May 2003 | B1 |
6616767 | Zhao et al. | Sep 2003 | B2 |
6635117 | Kinnard et al. | Oct 2003 | B1 |
6727654 | Ogawa et al. | Apr 2004 | B2 |
6782843 | Kinnard et al. | Aug 2004 | B2 |
6820570 | Kilpela | Nov 2004 | B2 |
7186395 | Walsdorff | Mar 2007 | B2 |
7296534 | Fink | Nov 2007 | B2 |
7479303 | Byun | Jan 2009 | B2 |
7601242 | Fink | Oct 2009 | B2 |
7846291 | Otsuki | Dec 2010 | B2 |
7850779 | Ma | Dec 2010 | B2 |
7931749 | Amikura et al. | Apr 2011 | B2 |
7976631 | Burrows et al. | Jul 2011 | B2 |
8057600 | Nishimoto | Nov 2011 | B2 |
8083853 | Choi et al. | Dec 2011 | B2 |
8187679 | Dickey | May 2012 | B2 |
8231799 | Bera et al. | Jul 2012 | B2 |
8298370 | Byun | Oct 2012 | B2 |
8308865 | Kim et al. | Nov 2012 | B2 |
8328939 | Choi et al. | Dec 2012 | B2 |
8361275 | Tahara et al. | Jan 2013 | B2 |
8361892 | Tam et al. | Jan 2013 | B2 |
8419959 | Bettencourt et al. | Apr 2013 | B2 |
8512509 | Bera et al. | Aug 2013 | B2 |
8562785 | Kang et al. | Oct 2013 | B2 |
8679956 | Tam et al. | Mar 2014 | B2 |
8721791 | Tiner et al. | May 2014 | B2 |
8764902 | Suzuki et al. | Jul 2014 | B2 |
8869742 | Dhindsa et al. | Oct 2014 | B2 |
8882913 | Byun et al. | Nov 2014 | B2 |
9057128 | Olgado | Jun 2015 | B2 |
9315897 | Byun et al. | Apr 2016 | B2 |
9349619 | Kawamata et al. | May 2016 | B2 |
9441791 | Mizusawa et al. | Sep 2016 | B2 |
9447499 | Roy et al. | Sep 2016 | B2 |
9476121 | Byun et al. | Oct 2016 | B2 |
9677176 | Chandrasekharan et al. | Jun 2017 | B2 |
10023959 | Sung et al. | Jul 2018 | B2 |
10316409 | Schravendijk | Jun 2019 | B2 |
10494717 | Sung et al. | Dec 2019 | B2 |
20020017243 | Pyo | Feb 2002 | A1 |
20020179012 | Takatsu et al. | Dec 2002 | A1 |
20030010451 | Tzu | Jan 2003 | A1 |
20030051665 | Zhao et al. | Mar 2003 | A1 |
20030054099 | Jurgensen et al. | Mar 2003 | A1 |
20030151114 | Zyl | Aug 2003 | A1 |
20030205328 | Kinnard | Nov 2003 | A1 |
20040216844 | Janakiraman | Nov 2004 | A1 |
20040226507 | Carpenter et al. | Nov 2004 | A1 |
20050000430 | Jang et al. | Jan 2005 | A1 |
20050092248 | Lee et al. | May 2005 | A1 |
20050241579 | Kidd | Nov 2005 | A1 |
20050241765 | Dhindsa et al. | Nov 2005 | A1 |
20050241767 | Ferris et al. | Nov 2005 | A1 |
20060021703 | Umotoy et al. | Feb 2006 | A1 |
20060191637 | Zajac et al. | Aug 2006 | A1 |
20060228496 | Choi et al. | Oct 2006 | A1 |
20060263522 | Byun | Nov 2006 | A1 |
20070068798 | Honda et al. | Mar 2007 | A1 |
20070089817 | Ganguli | Apr 2007 | A1 |
20070110918 | Yuda et al. | May 2007 | A1 |
20070163440 | Kim et al. | Jul 2007 | A1 |
20070193515 | Jeon et al. | Aug 2007 | A1 |
20070215048 | Suzuki | Sep 2007 | A1 |
20070264427 | Shinriki et al. | Nov 2007 | A1 |
20070272154 | Amikura et al. | Nov 2007 | A1 |
20080017315 | Fukuchi | Jan 2008 | A1 |
20080020146 | Choi et al. | Jan 2008 | A1 |
20080081124 | Johanson et al. | Apr 2008 | A1 |
20080156264 | Fair et al. | Jul 2008 | A1 |
20080156631 | Fair et al. | Jul 2008 | A1 |
20090095222 | Tam et al. | Apr 2009 | A1 |
20090095621 | Kao et al. | Apr 2009 | A1 |
20090098276 | Burrows et al. | Apr 2009 | A1 |
20090169744 | Byun et al. | Jul 2009 | A1 |
20090178615 | Kim et al. | Jul 2009 | A1 |
20090202721 | Nogami et al. | Aug 2009 | A1 |
20090223449 | Ishida | Sep 2009 | A1 |
20090236313 | Qiu et al. | Sep 2009 | A1 |
20090266911 | Kim et al. | Oct 2009 | A1 |
20090320756 | Tanaka | Dec 2009 | A1 |
20100003405 | Kappeler | Jan 2010 | A1 |
20100003406 | Lam et al. | Jan 2010 | A1 |
20100048028 | Rasheed | Feb 2010 | A1 |
20100184298 | Dhindsa | Jul 2010 | A1 |
20100263588 | Zhiyin | Oct 2010 | A1 |
20100300359 | Armour et al. | Dec 2010 | A1 |
20110003087 | Soininen | Jan 2011 | A1 |
20110023782 | Han | Feb 2011 | A1 |
20110039402 | Yamazaki et al. | Feb 2011 | A1 |
20110048325 | Choi et al. | Mar 2011 | A1 |
20110052833 | Hanawa et al. | Mar 2011 | A1 |
20110065276 | Ganguly et al. | Mar 2011 | A1 |
20110073038 | Chien et al. | Mar 2011 | A1 |
20110088847 | Law et al. | Apr 2011 | A1 |
20110253044 | Tam et al. | Oct 2011 | A1 |
20110256315 | Tam et al. | Oct 2011 | A1 |
20110256692 | Tam et al. | Oct 2011 | A1 |
20110308551 | Chung et al. | Dec 2011 | A1 |
20120052216 | Hanawa et al. | Mar 2012 | A1 |
20120135609 | Yudovsky | May 2012 | A1 |
20120161405 | Mohn et al. | Jun 2012 | A1 |
20120225564 | Adachi et al. | Sep 2012 | A1 |
20120269968 | Rayner, Jr. | Oct 2012 | A1 |
20120321910 | Sneh | Dec 2012 | A1 |
20130052804 | Song | Feb 2013 | A1 |
20130109159 | Carlson | May 2013 | A1 |
20130288485 | Liang et al. | Oct 2013 | A1 |
20130341433 | Roy et al. | Dec 2013 | A1 |
20140061324 | Mohn et al. | Mar 2014 | A1 |
20140103145 | White et al. | Apr 2014 | A1 |
20140127911 | Shih | May 2014 | A1 |
20140179114 | van Schravendijk | Jun 2014 | A1 |
20140235069 | Breiling et al. | Aug 2014 | A1 |
20140272185 | Na et al. | Sep 2014 | A1 |
20140299681 | Kashyap et al. | Oct 2014 | A1 |
20150007770 | Chandrasekharan et al. | Jan 2015 | A1 |
20150007771 | Silva et al. | Jan 2015 | A1 |
20150377481 | Smith et al. | Dec 2015 | A1 |
20160348242 | Sung et al. | Dec 2016 | A1 |
20180340256 | Sung et al. | Nov 2018 | A1 |
Number | Date | Country |
---|---|---|
1574229 | Feb 2005 | CN |
101003895 | Jul 2007 | CN |
101405433 | Apr 2009 | CN |
101423936 | May 2009 | CN |
101423937 | May 2009 | CN |
102424956 | Apr 2012 | CN |
103403843 | Nov 2013 | CN |
103521956 | Jan 2014 | CN |
103890911 | Jun 2014 | CN |
104278254 | Jan 2015 | CN |
0709875 | May 1996 | EP |
H05-186292 | Jul 1993 | JP |
H08-239775 | Sep 1996 | JP |
H08239775 | Sep 1996 | JP |
2000-144421 | May 2000 | JP |
2002-030445 | Jan 2002 | JP |
2002-033311 | Jan 2002 | JP |
2003-533878 | Nov 2003 | JP |
2005-303292 | Oct 2005 | JP |
2006-261217 | Sep 2006 | JP |
2006-322074 | Nov 2006 | JP |
2007-142363 | Jun 2007 | JP |
2007-191792 | Aug 2007 | JP |
2007-227789 | Sep 2007 | JP |
2008-066413 | Mar 2008 | JP |
2010-062383 | Mar 2010 | JP |
2010-084190 | Apr 2010 | JP |
2010-232402 | Oct 2010 | JP |
2012-500471 | Jan 2012 | JP |
2012-533890 | Dec 2012 | JP |
10-2004-0079559 | Sep 2004 | KR |
10-2004-0091218 | Oct 2004 | KR |
10-0687373 | Feb 2007 | KR |
10-2011-0036322 | Apr 2011 | KR |
490705 | Jun 2002 | TW |
492045 | Jun 2002 | TW |
200710928 | Mar 2007 | TW |
201229300 | Jul 2012 | TW |
2014-11761 | Mar 2014 | TW |
2015-02310 | Jan 2015 | TW |
2015-09537 | Mar 2015 | TW |
WO 0188962 | Nov 2001 | WO |
WO 2009055244 | Apr 2009 | WO |
WO 2011-009002 | Jan 2011 | WO |
WO 2011011532 | Jan 2011 | WO |
WO 2011044451 | Apr 2011 | WO |
WO 2012122054 | Sep 2012 | WO |
WO 2012166362 | Dec 2012 | WO |
Entry |
---|
Paul, Pallabi, et al., “Antireflection Coating on PMMA Substrates by Atomic Layer Deposition”. Coatings 2020, 10, 64; pp. 1-13, doi: 10.3390/coatings10010064Cpatomgs. |
Cao, Kun, et al., “Development of a scanning probe microscopy integrated atomic layer deposition system for in situ successive monitoring of thin film growth”. Review of Scientific Instruments 89, 123702 pp. 1-8, (2018). https://doi.org/10.1063/1.5042463. |
Chen, Xing, et al., “Advances in Remote Plasma Sources For Cleaning 300 mm and Flat Panel CVD Systems”. Semiconductor Magazine, , Aug. 2003, pp. 1-6. |
Oviroh, Peter Ozaveshe, et al., “New development of atomic layer deposition: processes, methods and applications”. Science and Technology of Advanced Materials 2019, vol. 20, No. 1, 465-496 https://doi.org/10.1080/14686996.2019.1599694. |
U.S. Office Action dated Dec. 3, 2015 issued in U.S. Appl. No. 13/842,054. |
U.S. Final Office Action dated May 18, 2016 issued in U.S. Appl. No. 13/842,054. |
U.S. Office Action dated Sep. 8, 2016 issued in U.S. Appl. No. 13/842,054. |
U.S. Office Action dated Apr. 12, 2017 issued in U.S. Appl. No. 13/842,054. |
U.S. Office Action dated Oct. 20, 2017 issued in U.S. Appl. No. 13/842,054. |
U.S. Notice of Allowance dated May 30, 2018 issued in U.S. Appl. No. 13/842,054. |
U.S. Notice of Allowance dated Feb. 11, 2019 issued in U.S. Appl. No. 13/842,054. |
U.S. Office Action dated Oct. 12, 2016 issued in U.S. Appl. No. 13/934,620. |
U.S. Final Office Action dated Jun. 22, 2017 issued in U.S. Appl. No. 13/934,620. |
U.S. Final Office Action dated Sep. 13, 2018 issued in U.S. Appl. No. 13/934,620. |
U.S. Advisory Action dated Dec. 6, 2018 issued in U.S. Appl. No. 13/934,620. |
U.S. Office Action dated Nov. 20, 2017 issued in U.S. Appl. No. 13/934,620. |
U.S. Office Action dated Apr. 7, 2016 issued in U.S. Appl. No. 13/934,597. |
U.S. Final Office Action dated Sep. 16, 2016 issued in U.S. Appl. No. 13/934,597. |
U.S. Notice of Allowance dated Jan. 10, 2017 issued in U.S. Appl. No. 13/934,597. |
U.S. Notice of Allowance dated Apr. 14, 2017 issued in U.S. Appl. No. 13/934,597. |
U.S. Office Action dated Mar. 13, 2015 issued in U.S. Appl. No. 13/531,254. |
U.S. Office Action dated Sep. 17, 2015 issued in U.S. Appl. No. 13/531,254. |
U.S. Notice of Allowance dated Jan. 15, 2016 issued in U.S. Appl. No. 13/531,254. |
U.S. Notice of Allowance dated May 12, 2016 issued in U.S. Appl. No. 13/531,254. |
U.S. Notice of Allowance dated Mar. 8, 2018 issued in U.S. Appl. No. 13/934,620. |
U.S. Office Action dated Nov. 28, 2018 issued in U.S. Appl. No. 16/035,491. |
U.S. Notice of Allowance dated Mar. 22, 2019 issued in U.S. Appl. No. 16/035,491. |
Taiwanese Examination and Search Report dated Apr. 11, 2017 issued in Application No. TW 102147584. |
Taiwanese First Decision of Refusal dated Nov. 20, 2017 issued in Application No. TW 102147584. |
Chinese First Office Action dated Dec. 9, 2015 issued in Application No. CN 201410052998.X. |
Chinese Second Office Action dated Jul. 27, 2016 issued in Application No. CN 201410052998.X. |
Chinese Third Office Action dated Mar. 2, 2017 issued in Application No. CN 201410052998.X. |
Singapore Search Report and Written Opinion dated Jul. 7, 2015 issued in Application No. SG 201401171-2. |
Singapore Final Examination Report dated Jan. 12, 2016 issued in Application No. SG 201401171-2. |
Taiwan Examination and Search Report dated May 12, 2017 issued in Application No. TW 103104956. |
Taiwan First Office Action dated Jul. 3, 2018 issued in Application No. TW 107110096. |
Chinese First Office Action dated Mar. 2, 2016 issued in Application No. CN 201410312720.1. |
Japanese First Office Action dated Feb. 13, 2018 issued in Application No. JP 2014-130967. |
Taiwan Examination and Search Report dated Oct. 13, 2016 issued in Application No. TW 102122169. |
Chinese Fourth Office Action dated Sep. 13, 2017 issued in Application No. CN 201410052998.X. |
Japanese First Office Action dated Nov. 7, 2017 issued in Application No. JP 2014-021856. |
Japanese First Office Action dated Apr. 15, 2019 issued in Application No. JP 2018087939. |
Chinese First Office Action dated Apr. 10, 2018 issued in Application No. CN 201610361563.2. |
U.S. Notice of Allowance dated Jul. 30, 2019 issued in U.S. Appl. No. 16/035,491. |
Korean First Office Action dated Mar. 10, 2020 issued in Application No. KR 10-2013-0161939. |
Korean Decision for Grant of Patent dated Jul. 29, 2020 issued in Application No. KR 10-2013-016139. |
Korean First Office Action dated Nov. 18, 2020 issued in Application No. KR 10-2020-0142328. |
Korean First Office Action dated Aug. 28, 2019 issued in Application No. KR 10-2013-0071554. |
Chinese First Office Action dated Jun. 18, 2020 issued in Application No. CN 201811101686.8. |
Chinese Second Office Action dated Feb. 22, 2021 issued in Application No. CN 201811101686.8. |
Taiwanese First Office Action dated Aug. 7, 2019 issued in Application No. TW 105116200. |
Number | Date | Country | |
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20190301013 A1 | Oct 2019 | US |
Number | Date | Country | |
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61740914 | Dec 2012 | US |
Number | Date | Country | |
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Parent | 13842054 | Mar 2013 | US |
Child | 16434043 | US |