Claims
- 1. A method of selecting a material for use as the expansive element in a thermoelastic design by deriving an indicator of the material's potential effectiveness for that use, said method including the step of calculating a dimensionless constant εγ for that material in accordance with the formula: ε γ=E γ2Tρ Cwherein E is the Young's modulus of the material; γ is the coefficient of thermal expansion; T is the maximum operating temperature, ρ is the density and C is the specific heat capacity and selecting the material on the basis of ε.
- 2. The method of claim 1 further including the step of normalizing the dimensionless constant relative to that of silicon to a value ε which is achieved by deriving the value εγ for the material of interest at the relevant temperature value and dividing this by the value of ε obtained for silicon at that same temperature.
- 3. The method of claim 1 further including determining mε where mε=ⅆεⅆT=E γ2ρ C[N/m2 1/° C.2kg/m3 Nm/kg ° C.](EQ 6)and selecting the material on the basis of both mε and ε.
- 4. The method of claim 1 further including the step of eliminating certain materials by requiring a pre-determined resistivity range.
- 5. The method of claim 4 further wherein the resistivity range is between 0.1 μΩm and 10.0 μΩm.
- 6. The method of claim 1 including selecting a material on the basis of at least one of the following group of properties:a resistivity between 0.1 μΩm and 10.0 μΩm; chemically inert in air; chemically inert in the chosen ink; and depositable by CVD, sputtering or other thin film deposition technique.
- 7. The method of claim 1 including selecting a material from a group including:silicides and carbides of titanium; borides, suicides, carbides and nitrides of tantalum, molybdenum, niobium, chromium, tungsten, vanadium, and zirconium.
- 8. A method of manufacturing a thermoelastic element that includes at least one expansive element, the method including:selecting a material for use as the expansive element in the thermoelastic design by deriving an indicator of the material's potential effectiveness for that use, said method including the step of calculating a dimensionless constant εγ for that material in accordance with the formula: ε γ=E γ2Tρ Cwherein E is the Young's modulus of the material; γ is the coefficient of thermal expansion; T is the maximum operating temperature, ρ is the density and C is the specific heat capacity and selecting the material on the basis of ε, andmanufacturing the thermoelastic element with the at least one expansive element formed of the selected material.
- 9. The method of claim 8 further including the step of normalizing the dimensionless constant relative to that of silicon to a value ε which is achieved by deriving the value εγ for the material of interest at the relevant temperature value and dividing this by the value of ε obtained for silicon at that same temperature.
- 10. The method of claim 8 further including determining mε where mε=ⅆεⅆT=E γ2ρ C[N/m2 1/° C.2kg/m3 Nm/kg ° C.](EQ 6)and selecting the material on the basis of both mε and ε.
- 11. The method of claim 4 further including the step of eliminating certain materials by requiring a pre-determined resistivity range.
- 12. The method of claim 4 further wherein the resistivity range is between 0.1 μΩm and 10.0 μΩm.
- 13. The method of claim 8 including selecting a material on the basis of at least one of the following group of properties:a resistivity between 0.1 μΩm and 10.0 μΩm; chemically inert in air; chemically inert in the chosen ink; and depositable by CVD, sputtering or other thin film deposition technique.
- 14. The method of claim 8 including selecting a material from a group including:suicides and carbides of titanium; borides, suicides, carbides and nitrides of tantalum, molybdenum, niobium, chromium, tungsten, vanadium, and zirconium.
CO-PENDING APPLICATIONS
This application is a Continuation of Ser. No. 09/693,079, filed on Oct. 20, 2000, still pending.
Various methods, systems and apparatus relating to the present invention are disclosed in the following co-pending applications filed by the applicant or assignee of the present invention on May 23, 2000:
US Referenced Citations (15)
Foreign Referenced Citations (4)
Number |
Date |
Country |
WO 9903681 |
Jan 1999 |
WO |
WO 200023279 |
Apr 2000 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
09/693079 |
Oct 2000 |
US |
Child |
10/636259 |
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US |