This application claims priority to and the benefit of Taiwan Patent Application No. 106128772, filed on Aug. 24, 2017, at the Taiwan Intellectual Property Office, the entire contents of which are herein incorporated by reference in their entirety.
The present invention relates to a method for manufacturing a semiconductor light-emitting element. In particular, the present invention relates to a method of replacing an epitaxial substrate to facilitate manufacture of a micro-semiconductor light-emitting element and a semiconductor light-emitting element thereof.
The semiconductor light emitting diode (LED) is one of the best available sources for providing the most effective light currently. In a semiconductor light emitting diode, the plurality of semiconductor light-emitting elements are formed on the epitaxial substrates, and then separated from each other together with the epitaxial substrates respectively to form the respective semiconductor light-emitting elements.
However, the conventional method for separating the semiconductor light-emitting element is limited to the material properties of the substrate when the micro-semiconductor light-emitting elements are separated, and the surface of connecting the semiconductor light-emitting elements with the substrate materials are often broken or warped during separating the semiconductor light emitting elements and thus it cannot effectively satisfy the demand for increasing yield rates of mass production.
The inventors of the present invention have designed a method for manufacturing semiconductor light-emitting elements to improve the aforementioned shortcomings of the prior art so as to promote industrial practicability.
In view of the above-mentioned problems of the conventional art, the object of the present invention is to provide a method for manufacturing semiconductor light-emitting element to solve the above problems of the conventional manufacturing methods.
One object of the present invention is to provide a method for manufacturing a semiconductor light-emitting element, comprising: providing an epitaxial substrate; forming a light-emitting element layer on the epitaxial substrate; attaching a first substrate onto an upper surface of the light emitting element layer via a bonding adhesive; removing the epitaxial substrate to expose a lower surface of the light-emitting element layer; bonding a second substrate on the lower surface of the light-emitting element layer; dissolving the bonding adhesive to remove the first substrate; and cutting the light-emitting element layer together with the second substrate to form a plurality of semiconductor light-emitting elements respectively.
Preferably, the first substrate comprises a silicon substrate or a glass substrate.
Preferably, the light-emitting element layer has a concave-convex structure on the upper surface thereof, and the step of attaching the first substrate onto the upper surface of the light emitting element layer comprises coating the bonding adhesive for covering and filling the upper surface of the light-emitting element layer such that the bonding adhesive is formed to have a flat top surface.
Preferably, the step of removing the epitaxial substrate comprises applying a laser on a connecting surface of the epitaxial substrate and the light-emitting element layer to break a connecting structure between the epitaxial substrate and the light-emitting element layer.
Preferably, the step of disposing the second substrate comprises increasing a temperature of a bonding surface between the second substrate and the light-emitting element layer such that they are bonded to each other, or coating a bonding material for connecting the second substrate with the light-emitting element layer.
Preferably, the step of dissolving the bonding adhesive comprises changing an ambient temperature to reduce the viscosity of the bonding adhesive.
Preferably, the bonding adhesive is an ultraviolet-curable adhesive and the step of dissolving the bonding adhesive comprises using an infrared light to dissolve the bonding adhesive.
Preferably, the step of dissolving the bonding adhesive comprises applying at least two outward forces to physically delaminate the light-emitting element layer from the bonding adhesive.
Preferably, the step of cutting the light-emitting element layer and the second substrate comprises application of a laser to cut the light-emitting element layer and the second substrate according to the distribution of the semiconductor light-emitting elements.
The object of the present invention is also to provide a semiconductor light-emitting element, comprising: a substrate; a light-emitting element layer disposed on the substrate and comprising a P-type semiconductor layer and a N-type semiconductor layer; a p-type electrode disposed on the light-emitting element layer and exposed on an upper surface of the light-emitting element layer, the P-type electrode is electrically connected to the P-type semiconductor layer; and a N-type electrode disposed on the light-emitting element layer and exposed on the upper surface of the light-emitting element layer, the N-type electrode is electrically connected to the N-type semiconductor layer; wherein the crystal lattices of the substrate and the crystal lattices of a lower surface of the light-emitting element layer are mismatched with respect to each other.
According to the method for manufacturing semiconductor light-emitting element of the present invention, the bonding adhesive and the first substrate are coated on the light-emitting element layer before separating the epitaxial substrate to improve the component intensity of the semiconductor light-emitting element when the epitaxial substrate is delaminated.
Furthermore, the second substrate is disposed after separating the epitaxial substrate to improve the structural strength of the semiconductor light-emitting element in the process for separating the semiconductor light-emitting element.
The aforementioned and other features and advantages of the present invention will become apparent according to the exemplary embodiments described in more detail with reference to the accompanying drawings in which:
For a better understanding of the features, contents and advantages of the present invention, and the effect that may be achieved therefrom, the present embodiments of the present invention are described in more detail as follows with reference to the accompanying drawings. It should be noted that the drawings are used for the purpose of illustrating and assisting the specification, without necessarily implying the actual ratio and the precise configuration. Therefore, in the accompanying drawings, the ratio and the configuration shall not be interpreted in any way that limits the claims of the present invention in the practical implementation.
As used herein, “and/or” term comprises any or all combinations of one or more related items. When an element list is preceded by the description of “at least one”, the all elements rather than the individual element in the list are modified.
Referring to
The present invention will be sequentially described in detail as follows: an embodiment of the present invention provides a method for manufacturing a semiconductor light-emitting element, which replaces the epitaxial substrate of the semiconductor before cutting the semiconductor light-emitting element. The method of the present invention may be suitable for the requirements of production flow in mass production for such a semiconductor light emitting element and is not limited to the structure type of the semiconductor light emitting element:
The method of the present invention comprises the following steps:
At the step S01: providing an epitaxial substrate 10, which may preferably be a sapphire substrate.
At the step S02: forming a light-emitting element layer 20 on the epitaxial substrate 10, as shown in
The method for manufacturing another semiconductor light-emitting element of the present invention comprises the following steps: forming oxide composition on the epitaxial substrate 10; forming a first oxide crystal composition which grows from the surface of the oxide component to the inside and leaves an amorphous component above the surface of the base component; and stacking a second oxide crystal composition on the first oxide crystal composition, wherein the second oxide crystal composition is formed by using a material that is different from that of the first oxide crystal composition and growing heterogeneous crystals.
In the each aforementioned manufacturing method, the first oxide crystal composition and the second oxide crystal composition have high purity and have inherent conductive characteristics.
The all oxide crystal compositions and oxide compositions are metal oxides, which may be selected from four-component metal oxides such as In—Sn—Ga—Zn—O, three-component metal oxides such as In—Ga—Zn—O, In—Sn—Zn—O, In—Al—Zn—O, Sn—Ga—Zn—O, Al—Ga—Zn—O or Sn—Al—Zn—O, two-component metal oxides such as In—Zn—O, Sn—Zn—O, Al—Zn—O, Zn—Mg—O, Sn—Mg—O or In—Mg—O, or one-component metal oxides such as In—O, Sn—O or Zn—O. For example, In—Sn—Ga—Zn—O represents an oxide containing indium (In), tin (Sn), gallium (Ga) and zinc (Zn), and the stoichiometric ratio thereof is not particularly limited.
The oxide crystal composition and the oxide composition may be represented by InMO3 (ZnO) m (m>0, and m is not a natural number). Here, M represents one or more metal elements selected from Ga, Al, Mn and Co. For example, M may be Ga, Ga and Al, Ga and Mn, Ga and Co, etc.
Furthermore, an oxide semiconductor material represented by In-A-B-O may be used. Here, A represents one or more elements selected from the groups consisting of the group 13 elements such as gallium (Ga) or aluminum (Al) and the group 14 elements including silicon (Si) or germanium (Ge). In addition, B represents one or more elements selected from the group 12 elements. The contents of In, A and B may be set freely, and the content of A may be 0. On the other hand, the content of In and the content of B may not be 0. In other words, In—Ga—Zn—O, In—Zn—O, etc. are contained as described above.
Preferably, the number of oxide layers and the oxide components included in the formed light-emitting element layer 20 may be adjusted depending on the purpose, the upper surface 21 of the light-emitting element layer 20 that includes the P-type electrode and the N-type electrode is finally exposed on the formed light-emitting element layer 20.
At the step S03: attaching a first substrate 40 on the upper surface 21 of the light-emitting element layer 20 via a bonding adhesive 30; the light-emitting element layer 20 on the epitaxial substrate 10 is shown in
At the step S04: removing the epitaxial substrate 10 to expose the lower surface 22 of the light-emitting element layer 20; as shown in
At the step S05: disposing a second substrate 50 on the lower surface 22 of the light-emitting element layer 20; as shown in
At the step S06: dissolving the bonding adhesive 30 to remove the first substrate 40, which is carried out by dissolving the connection between the bonding adhesive 30 and the light-emitting element layer 20, as shown in
At the step S07: cutting the light-emitting element layer 20 together with the second substrate 50 to form a semiconductor light-emitting element 60; wherein, a guiding channel may be formed on the upper surface 21 of the light-emitting element layer 20 to guiding to cut the light-emitting element layer 20 into the separated semiconductor light-emitting elements 60, as shown in
According to the object of the present invention, as shown in
In summary, according to the method for manufacturing a semiconductor light-emitting element of the present invention, the bonding adhesive 30 and the first substrate 40 are coated on the upper surface 21 of the light-emitting element layer 20 before separating the epitaxial substrate 10 to improve the component intensity of the semiconductor light-emitting element 60 when the epitaxial substrate 10 is delaminated. Further, the second substrate 50 is disposed after separating the epitaxial substrate 10 to reinforce the component strength in the process for cutting the semiconductor light-emitting element layer 20 to prevent the cutting surface from being broken or warped and the formed semiconductor light-emitting element 60 from being broken.
The above-described embodiments are merely an exemplary illustration, and the present invention is not limited thereto. Any equivalent modification or change may be made thereto without departing from the scope and the spirit of the present invention and is covered by the appended claims.
Number | Date | Country | Kind |
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106128772 | Aug 2017 | TW | national |