Claims
- 1. A semiconductor memory device comprising:
- an output terminal,
- a plurality of memory cells, each storing data of a first or second logic level therein,
- read out means for reading out sequentially data stored in said memory cells,
- extending means for extending each data read out from said read out means,
- providing means responsive to extended data from said extending means for providing output data sequentially to said output terminal, and
- intermediate level rendering means for rendering a potential of said output terminal to an intermediate level which is a level between the first and second logic levels before each output data is provided by said providing means.
- 2. The semiconductor memory device according to claim 1, wherein said providing means includes
- a first transistor connected between a first node to which a first potential corresponding to the first logic level is supplied and said output terminal, being turned on in response to the extended data, and
- a second transistor connected between a second node to which a second potential corresponding to the second logic level is supplied and said output terminal, being turned on in response to the extended data and complementarily to said first transistor,
- wherein said intermediate level rendering means renders both said first and second transistors to an on state before each output data is provided by said providing means.
- 3. The semiconductor memory device according to claim 1, wherein said extending means includes
- passage means for passing read out data therethrough, and
- latch means for latching each data passing through said passage means until subsequent data is read out.
- 4. A semiconductor memory device comprising:
- an output terminal,
- a plurality of memory cells, each storing data of a first or second logic level therein,
- read out means responsive to a predetermined read out control signal for reading out sequentially data stored in said memory cells,
- control means including
- first generation means responsive to said read out control signal for generating an extend control signal of a third logic level for a predetermined time period during read out of each data by said read out means, and
- second generation means responsive to said read out control signal for generating an output control signal of a fourth logic level for a predetermined time period before or after said extend control signal is altered from a fifth logic level to the third logic level,
- extending means including
- passage means for passing data read out from said read out means therethrough during said extend control signal attaining the third logic level, and
- latch means for latching data passing through said passage means during said extend control signal attaining the fifth logic level,
- providing means for providing output data to said output terminal in response to data provided from said extending means during said output control signal attaining a sixth logic level, and
- intermediate level rendering means for rendering a potential of said output terminal to an intermediate level which is a level between said first and second logic levels during said output control signal attaining the fourth logic level.
- 5. The semiconductor memory device according to claim 4, wherein said providing means includes
- a first transistor connected between a first node to which a first potential corresponding to the first logic level is supplied and said output terminal, being turned on in response to data provided from said extending means, and
- a second transistor connected between a second node to which a second potential corresponding to the second logic level is supplied and said output terminal, being turned on in response to data provided from said extending means and complementarily to said first transistor,
- wherein said intermediate level rendering means renders said first and second transistors both to an on state before each output data is supplied by said providing means.
Priority Claims (1)
Number |
Date |
Country |
Kind |
5-321557 |
Dec 1993 |
JPX |
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Parent Case Info
This application is a division of application Ser. No. 08/345,758 filed Nov. 22, 1994, now U.S. Pat. No. 5,532,961.
US Referenced Citations (4)
Foreign Referenced Citations (4)
Number |
Date |
Country |
62-12210 |
Jan 1987 |
JPX |
3-23714 |
Jan 1991 |
JPX |
3-124120 |
May 1991 |
JPX |
3-185921 |
Aug 1991 |
JPX |
Non-Patent Literature Citations (1)
Entry |
Dave Bursky, "High Performance DRAMs", Electronic Design, Jul. 22, 1993, pp. 55-70. |
Divisions (1)
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Number |
Date |
Country |
Parent |
345758 |
Nov 1994 |
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