Patent Application
20140239421
This disclosure relates to sensor devices and methods of fabricating such devices.
For a wide range of sensor devices, variations in surface charge and sudden changes in surface charge can couple into the transduction mechanism of the sensor and adversely affect the sensor output. For example, some sensor devices, such as capacitive sensor devices, utilize electrodes to indicate changes in an electrical characteristic, e.g., capacitance, that are directly or indirectly the result of changes in a sensed condition. In such sensors, variations in surface charge can alter the bias of the electrodes and result in inconsistent changes in the response of the sensor. Even with the inclusion of an insulating material, surface charges can be problematic for sensitive measurements.
To reduce the effects of variations and sudden changes in surface charge, sensor devices are often provided with a grounded, conductive layer on top of the sensor that is configured to direct surface charges away from the sensitive elements of the sensor. However, some sensor devices have configurations that preclude the use of traditional materials and/or deposition methods in forming a conductive layer on the device for surface charge dispersal. For example, microelectromechanical systems (MEMS) sensor devices have micro- and nanoscale mechanical structures that are configured to move in response to a sensed condition to produce a sensor output. Conductive layers that are deposited using traditional materials and/or methods often have mechanical properties that can interfere with the functionality of MEMS structures due to mechanical effects (e.g., stress, fatigue over lifetime testing, stiffness effects, etc.).
Traditional conductive layers may be formed of a material and/or be deposited at a thickness that results in an increased effective stiffness of the MEMS structures which can dampen or even prevent the movement of the MEMS structures as a result. Even films of several 10's of nanometers thickness can have adverse effects on the functionality of MEMS structures. Traditional materials and/or methods may also result in conductive layers with low conformality and/or discontinuities, especially on structures with extremely varying topology. Such low conformality and discontinuities, even of a very small nature, can have large impact on the sensor performance. Additionally, devices requiring optical transmission may suffer greatly depending on the material in question.
For the purposes of promoting an understanding of the principles of the disclosure, reference will now be made to the embodiments illustrated in the drawings and described in the following written specification. It is understood that no limitation to the scope of the disclosure is thereby intended. It is further understood that the present disclosure includes any alterations and modifications to the illustrated embodiments and includes further applications of the principles of the disclosure as would normally occur to one of ordinary skill in the art to which this disclosure pertains.
For many devices, such as MEMS sensors, small changes in surface charge can impact the output. To mitigate surface charge effects in a MEMS sensor, the present disclosure proposes the use of an extremely thin conductive layer referred to herein as a surface charge mitigation layer, deposited onto the surface of the sensor and connected to grounded contacts that are located far away from the sensitive structures of the MEMS sensor. The grounded surface charge mitigation layer can further be used as a shield against external electric fields, which may influence the sensor functionality negatively.
In accordance with one embodiment, a semiconductor device includes a substrate. At least one transducer is provided on the substrate. The at least one transducer includes at least one electrically conductive circuit element. A dielectric layer is deposited onto the substrate over the at least one transducer. A surface charge mitigation layer formed of a conductive material is deposited onto the outer surface of the dielectric layer with the surface charge mitigation layer being electrically coupled to ground potential.
In accordance with another embodiment, a method of fabricating a semiconductor device includes providing at least one transducer on a substrate. The transducer has at least one electrically conductive circuit element. A dielectric layer is deposited onto the substrate over the at least one transducer. A surface charge mitigation layer formed of a conductive material is deposited onto an outer surface of the dielectric layer. The surface charge mitigation layer is then coupled to ground potential.
The surface charge mitigation layer may be deposited to a thickness of 10 nm or less, and in some cases, 5 nm or less, and may be deposited using atomic layer deposition (ALD) although other deposition methods may also be used, such as chemical vapor deposition, plating, electroless deposition, self-assembled monolayers, or other available techniques for creating such thin layers.
The transducer is a device that is configured to receive one form of energy as an input and to output another form of energy as a measure of the input energy. As an example, a transducer may comprise a microelectromechanical systems (MEMS) device, such as a capacitive MEMS pressure sensor, and may be configured to implement a certain type of device, such as a microphone. The surface charge mitigation layer may be patterned to include pores to alter the properties of the mitigation layer based on the type of transducer or MEMS device implemented on the substrate. For example, the mitigation layer may be patterned to include pores and openings to enhance flexibility in order to minimize mechanical impact on any underlying movable MEMS components. The mitigation layer may also be patterned to provide certain optical properties in the mitigation layer, such as transmission, reflectance, focusing, and the like, as required for the functionality of any components provided on the substrate.
The surface charge mitigation layer is formed of a conductive material. Examples of conductive materials that may be used for the surface charge mitigation layer include platinum (Pt), aluminum (Al), titanium (Ti), and titanium nitride (TiN), tantalum nitride (TaN), and the like, although other suitable metal materials may be used. In one embodiment, the mitigation layer is deposited at a thickness of 10 nm or less and in some cases at 5 nm or less. In alternative embodiments, the surface charge mitigation layer may be formed at any suitable thickness taking the type of MEMS structures of the sensor into consideration. The surface charge mitigation layer can be deposited using atomic layer deposition (ALD), chemical vapor deposition (CVD), plating, electroless deposition, self-assembled monolayers, or other available techniques for creating such thin layers.
The deposition methods used to form the surface charge mitigation layer, particularly ALD, enables a continuous, conductive film to be formed on the structures of the MEMS sensor that has high conformality and uniformity even on structures with extremely varying topology. This is very important for micro- and nanoscale devices where small mechanical variations can have large impact on the sensor performance. Because such films can be effective even at thicknesses of 5 nm, their mechanical impact on most structures (even microscale ones) would be negligible. In addition, the possibility of patterning such a layer allows for further reductions in mechanical impact while also allowing additional possibilities for optical transmission based on the wavelength and film pattern.
The device 10 includes a bulk silicon layer 14 and a cap layer 16. In the embodiment of
The bulk silicon layer 14 includes a lower electrode 22 formed in a sensing region of the substrate that is configured to serve as the fixed electrode of the capacitive pressure sensor. The lower electrode 22 may be formed in any suitable manner, such as by the deposition of a conductive film, electrical isolation of a conductive layer, adding a spacer layer between two conductive layers, and implant doping of the silicon substrate. The exact implementation of the lower electrode 22 in the substrate depends in part on the desired performance characteristics of the device 10 and the processes and materials used to fabricate the structures that define the sensor.
In one embodiment, the cap layer 16 comprises an epitaxial deposition of polysilicon that forms a flexible membrane that is suspended over the lower electrode 22. The conductive polysilicon of the cap layer 16 enables the membrane to serve as the movable electrode 24 for the capacitive pressure sensor, also referred to herein as the upper electrode. During fabrication of the device 10, the cap layer 16 is deposited onto a sacrificial oxide layer (not shown) formed on the substrate in the area of the fixed electrode 22. The sacrificial layer is then removed between cap layer 16 and the substrate to form the cavity 20 and to release the membrane.
In the embodiment of
The deformable membrane 16 is configured to deflect toward the substrate under an applied pressure which alters the gap between the fixed electrode 22 and the movable electrode 24, resulting in a change in the capacitance between the two electrodes 22, 24. The fixed electrode 22 is electrically connected to the measurement circuitry (not shown) for the sensor. The measurement circuitry is configured to monitor the capacitance between the fixed electrode 22 and the movable electrode 24 to detect changes in capacitance that result from the deflection of the movable electrode 24 in response to changes in pressure. By monitoring the change in capacitance between the fixed electrode 22 and the movable electrode 24, a magnitude of a pressure applied to the deformable membrane can be determined.
The surface charge mitigation layer 12 is deposited using an ALD process. Alternatively, the surface charge mitigation layer 12 can be deposited using chemical vapor deposition, plating, electroless deposition, self-assembled monolayers, or other available techniques capable of forming such thin layers. The thin film deposition methods mentioned above, such as ALD, enables a continuous, conductive film to be formed on the device 10 that has high conformality and uniformity even on surfaces with extremely varying topology as depicted in
As an alternative to the use of a contiguous mitigation layer 12 as depicted in
The patterning may be used to alter the properties of the mitigation layer based on the type of transducer or MEMS device implemented on the substrate. For example, the mitigation layer may be patterned to include pores and openings that enhance flexibility in order to minimize mechanical impact on any underlying movable MEMS components. The mitigation layer may also be patterned to provide certain optical properties in the mitigation layer, such as transmission, reflectance, focusing, and the like, as required for the functionality of any optically sensitive components provided on the substrate, such as infrared radiation sensors and the like. The porosity of the mitigation layer should not be such that the ability to conduct surface charges away from the sensor is affected. Any suitable pattern may be implemented in the mitigation layer 12, including a mesh, grid, and array patterns, meandering patterns, or other arbitrary patterns, that are capable of imparting desired characteristics to the mitigation layer.
While the disclosure has been illustrated and described in detail in the drawings and foregoing description, the same should be considered as illustrative and not restrictive in character. It is understood that only the preferred embodiments have been presented and that all changes, modifications and further applications that come within the spirit of the disclosure are desired to be protected.
This application claims priority to U.S. Provisional Application Ser. No. 61/721,088 entitled “ SURFACE CHARGE MITIGATION LAYER FOR MEMS SENSORS” by Graham et al., filed Nov. 1, 2012, the disclosure of which is hereby incorporated herein by reference in its entirety.
| Number | Date | Country | |
|---|---|---|---|
| 61721088 | Nov 2012 | US |
