Claims
- 1. A method for modifying electronic printed-circuit-board design data, the method comprising:
accepting customer data indicating the location and character of pads to which electronic parts are to be soldered on a printed circuit board; from the data, creating footprints including parameters relating to pad configurations on the printed circuit board; creating a library that includes a plurality of the footprints applying a footprint filter that specifies criteria for one or more footprint parameters to the footprints in the footprint library to select footprints that meet the specified criteria; applying a modification parameter to the footprints selected by the footprint filter to modify one or more parameters in the selected footprints; and utilizing the footprints to cut apertures in a stencil.
- 2. The method of claim 1, wherein each of the footprints is assigned a name that incorporates each of the parameters.
- 3. The method of claim 1, further comprising the steps of creating the footprint filter and modification parameter as a function of a customer request to change a stencil aperture to align with a changed pad on a printed circuit board.
- 4. The method of claim 1, further comprising establishing a library of footprint filters and searching the footprint-filter library to determine whether a suitable footprint filter already exists to effect a change requested by a customer.
- 5. The method of claim 4, wherein:
if a suitable footprint filter is found, the suitable footprint filter is applied to the footprints in the footprint library; and if a suitable footprint filter is not found, a new footprint filter is created and applied to the footprints in the footprint library.
- 6. The method of claim 4, further comprising establishing a library of modification parameters and searching the modification-parameter library to determine whether a suitable modification parameter already exists to effect a change requested by a customer.
- 7. The method of claim 6, wherein:
if a suitable modification parameter is found, the suitable modification parameter is applied to the selected footprints; and if a suitable modification parameter is not found, a new modification parameter is created and applied to the selected footprints.
- 8. The method of claim 1, wherein the footprint includes parameters indicating part type, part group, pitch, number of leads, footprint dimensions, pad shape and pad dimensions.
- 9. The method of claim 8, wherein the footprint further includes a parameter indicating the customer with which the footprint is associated.
- 10. The method of claim 9, wherein the footprint filter specifies the customer.
- 11. The method of claim 1, further comprising scaling data in the footprint as a function of X- and Y-coordinate differences to compensate for known effects of at least one of the printed circuit board manufacturing process and the stencil manufacturing process.
- 12. The method of claim 11, further comprising scaling data in the footprint as a function of rotational coordinate differences to compensate for known effects of at least one of the printed circuit board manufacturing process, and the stencil manufacturing process.
- 13. The method of claim 1, further comprising scaling data in the footprint to the fabricated printed circuit board as a function of X- and Y-coordinate differences between the customer data and actual pad locations on the printed circuit board.
- 14. The method of claim 13, further comprising scaling data in the footprint as a function of rotational coordinate differences to compensate for differences between the customer data and actual pad locations on the printed circuit board.
- 15. A computer-readable storage medium storing program code for causing a computer to:
create footprints that include parameters relating to spatial characteristics of features; create a library including a plurality of the footprints, wherein the footprint parameters are searchable within the library; apply a footprint filter that specifies criteria for one or more footprint parameters to footprints in the footprint library to select footprints that meet the specified criteria; and apply a modification parameter to the footprints selected by the footprint filter to modify one or more parameters in the selected footprints.
- 16. The computer-readable storage medium of claim 15, including program code for assigning each of the footprints a name that incorporates each of the parameters.
- 17. The computer-readable storage medium of claim 15, wherein the features represent at least one of pads on a printed circuit board and apertures in a stencil.
- 18. The computer-readable storage medium of claim 15, including program code for scaling data in the footprint as a function of X- and Y-coordinate differences resulting from effects of at least one of a printed circuit board manufacturing process and a stencil manufacturing process.
- 19. The computer-readable storage medium of claim 18, including program code for scaling data in the footprint as a function of rotational coordinate differences resulting from effects of at least one of the printed circuit board manufacturing process and the stencil manufacturing process.
- 20. A method for modifying feature data comprising:
accepting data indicating spatial characteristics of a set of features; incorporating the data for each feature as parameters in a footprint name; creating a library that includes the footprint names; applying a footprint filter that specifies criteria for one or more parameters to the footprint names in the library to select footprint names that meet the specified criteria; applying a modification parameter to the footprint names selected by the footprint filter to modify one or more parameters in the selected footprint names.
- 21. The method of claim 20, further comprising utilizing at least one of the footprint names to change the spatial characteristics of an object.
- 22. The method of claim 21, wherein the spatial characteristics include position and dimensions.
- 23. A method for scaling data in footprints for apertures in a stencil, the method comprising:
determining X-coordinate and Y-coordinate differences between (a) an actual position of a feature selected from pads on a printed circuit board and apertures in a stencil and (b) an intended position of the feature recorded in a data set; and scaling data in the data set to compensate for the X- and Y-coordinate differences.
- 24. The method of claim 23, further comprising:
determining rotational differences between (a) an actual position of a feature selected from pads on a printed circuit board and apertures in a stencil and (b) an intended position of the feature recorded in a data set; and scaling data in the data set to compensate for the rotational differences.
- 25. The method of claim 23, wherein the actual position of the feature is determined by known effects of at least one of a printed circuit board manufacturing process and a stencil manufacturing process.
- 26. The method of claim 23, wherein the actual position of the feature is determined by actually measuring feature positions on at least one of a printed circuit board and a stencil.
- 27. The method of claim 23, further comprising cutting apertures in a stencil based on the scaled data.
RELATED APPLICATION
[0001] Priority is claimed to U.S. Provisional Patent Application Serial No. 60/402,300, filed Aug. 8, 2002, the entire teachings of which are incorporated herein by reference.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60402300 |
Aug 2002 |
US |