Number | Date | Country | Kind |
---|---|---|---|
42 07 341.3 | Mar 1992 | DEX |
Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/EP92/02931 | 12/17/1992 | 11/28/1994 | 11/28/1994 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO93/18543 | 9/16/1993 |
Number | Name | Date | Kind |
---|---|---|---|
4674939 | Maney et al. | Jun 1987 | |
4739882 | Parikh et al. | Apr 1988 | |
4815912 | Maney et al. | Mar 1989 | |
4995430 | Bonora et al. | Feb 1991 | |
5261935 | Ishii et al. | Nov 1993 | |
5431600 | Murata et al. | Jul 1995 |
Number | Date | Country |
---|---|---|
0340345A2 | Nov 1989 | EPX |
3826925 | Feb 1990 | DEX |
62-22933 | Jan 1987 | JPX |
WO8600870 | Feb 1986 | WOX |
Entry |
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Solid State Technology, No. 8, Westford, MA, US, "Wafer Confinement for Control of Contamination in Microelectronics", Claude Doche, Aug. 1990, pp. S1-S5. |
Document #1872--New Standard, SEMI E24, 200 MM "Standard Mechanical Interface (SMIF)", pp. 1-6. |