Semiconductor nanowires represent a diverse class of nanomaterials whose synthetically tunable structural, electronic, and optical properties have enabled active nanodevices including high-performance field-effect transistors, ultrasensitive biological probes, and solar cells and photonic devices with tunable optical spectra. Enhanced synthetic control of the morphology, crystal structure, and composition of nanostructures can drive advances in nanoscale devices. For example, synthetically tuned and modulated properties of semiconductor nanowires can lead to further advances in nanotransistor, nanophotonic, and thermoelectric devices.
Many aspects of the present disclosure can be better understood with reference to the following drawings. The components in the drawings are not necessarily to scale, emphasis instead being placed upon clearly illustrating the principles of the present disclosure. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
Disclosed herein are various examples related to production of nanowires or other nanomaterials. An automated apparatus for nanowire growth with multiple sources can advance the synthesis of multi-component nanomaterials. Nanowires are the most investigated nanomaterial and have potential applications in electronics, solar cells, sensors and other fields. Reference will now be made in detail to the description of the embodiments as illustrated in the drawings, wherein like reference numbers indicate like parts throughout the several views.
Referring to
The apparatus 100 also includes a material feeder 112 that is coupled to the first end of the furnace tube 106. The second end of the furnace tube 106 is coupled to a vacuum pumping system (not shown) that maintains a vacuum, at a predefined pressure, within the furnace tube 106 and the housing 115 of the material feeder 112. A vacuum seal or connector between the furnace tube 106 and the housing of the material feeder 112 can be used to prevent leakage and thereby maintain the operating pressure within the furnace tube 106 and housing 115. With the source material positioned within the furnace tube 106, a carrying (or carrier) gas can be drawn through the furnace tube 106 from the material feeder 112 by the vacuum pumping system for formation of nanowires or other nanomaterial.
The housing 115 of the material feeder 112 encloses an automated setup for manipulation of the source material. A cover 118 provides access to the inside of the material feeder housing 115 for adding and/or removing source material. The cover 118 can be sealed to maintain the vacuum pressure within the housing during operation of the apparatus 100. The automated setup allows for different source materials to be positioned within the furnace tube 106 during various stages of the nanowire formation. In this way, the automated synthesis of multi-component nanomaterial can be accomplished while maintaining the vacuum environment of the apparatus 100.
Referring to
In the apparatus 100 of
In some implementations, the source material (or powder) 303 may be coated with the catalyst as described in U.S. Patent Publ. No. 2010/0202952 (“Nanowire synthesis from vapor and solid sources” by Zhang et al.), which is hereby incorporated by reference in its entirety. Heating of the catalyst coated source material in the tube furnace 103 produces a vapor including the catalyst and the precursor, which facilitates nanowire growth on one or more substrates 203. In other implementations, catalyst drops 206 can be formed on the substrate(s) 203 by initially vaporizing a catalyst material and dispersing the catalyst nanoparticles on the substrate(s) 203 before putting the substrates into the furnace tube. In some embodiments, the catalyst material may be patterned on the substrate to provide for different nanomaterial geometries or patterns.
Referring next to
The source material manipulator 409 can be a four-axis manipulator with a gripper that transports the source material 303 between a storage location in the material feeder 112 (e.g., in the deposition tray 415) and the fixture 418. Accuracy torque control can be used to pick up, reposition, and set down the source material 303 (or a container such as, e.g., a ceramic boat that holds the source material 303) in the fixture 418 at the distal end of the feeder arm 421 of the linear manipulator 412. With the source material 303 in the fixture 418, the feeder arm 421 of the linear manipulator 412 can be extended to position the source material 303 in the furnace tube 106 for formation of the nanowires as illustrated in
The linear manipulator 412 can include a stepper motor or servo motor driven lead screw or conveyor belt or a linear motor, which can be used to extend the feeder arm 421 from the material feeder housing 115 into the furnace tube 106 or retract the feeder arm 421 from the furnace tube 106 back into the material feeder housing 115. The material feeder housing 115 may extend around the linear manipulator 412 to maintain the vacuum seal or a vacuum seal may be provided around the feeder arm 421 at the interface between the linear manipulator 412 and the material feeder housing 115 to maintain the predefined pressure in the material feeder 112 and furnace tube 106. Electrical connections into the material feeder 112 are also vacuum sealed.
The apparatus can also include a control system, which can monitor various system parameters (e.g., temperature, pressure, flow, position, etc.) and control operation of the apparatus 100 in response to one or more of the monitored parameters. For example, temperatures along the furnace tube 106 can be monitored and operation of the tube furnace 103 can be adjusted accordingly. Operation of the vacuum pump system may also be controlled to maintain the monitored furnace tube pressure at a predefined pressure and/or within predefined limits. Positioning of the source material manipulator 409 and the linear manipulator 412 can also be monitored and controlled.
The control system can be implemented using processing circuitry. In various embodiments, the processing circuitry is implemented as at least a portion of a microprocessor. The processing circuitry may be implemented using one or more circuits, one or more microprocessors, microcontrollers, application specific integrated circuits, dedicated hardware, digital signal processors, microcomputers, central processing units, field programmable gate arrays, programmable logic devices, state machines, or any combination thereof. In yet other embodiments, the processing circuitry may include one or more software modules executable within one or more processing circuits. The processing circuitry may further include memory configured to store instructions and/or code that cause the processing circuitry to execute various control functions.
Operation of the apparatus 100 to grow nanowires will now be briefly discussed with respect to
With the feeder arm 421 retracted as shown in
When synthesis of the nanowires with the source material 303 is finished, the feeder arm 421 can be retracted back into the material feeder housing 115, and the container, which may hold any unused source material 303, is returned to the deposition tray 415 by the source material manipulator 409. A second source material 303 may then be placed in the fixture 418 using the source material manipulator 409 for continued nanowire growth. During this exchange of source materials 303, the furnace tube 106 may be purged again. The feeder arm 421, with the second source material, may then be extended to the desired position within the furnace tube 106. The tube furnace 103 can be maintained at the same temperature or adjusted to a different temperature and provided with carrying (or carrier) gas 306 to continue the nanowire synthesis. The process can be repeated multiple times using combinations of the same or different source materials 303 (e.g., second, third, fourth, fifth or more source materials). Movement of the source material manipulator 409 and the linear manipulator 412, as well as a deposition tray definition, can be programmed for deposition and purge intervals during operation.
In some embodiments, the apparatus 100 may include a plurality of linear manipulators 412 that may be extended from the material feeder 112 into the furnace tube 106. The source material manipulator 409 can be controlled to position catalysts and/or source materials 303 in the fixture 418 of the various linear manipulators 112 to coat substrate(s) with catalyst and/or grow nanowires. In some cases, multiple source materials 303 or a combination of catalyst and source materials 303 may be positioned within the furnace tube 106 using the linear manipulators 412. A multi-zone oven 109 allows for heating at different temperatures at different locations along the furnace tube 106, allowing for vaporization of different materials at the same time. Other variations are also possible.
It should be emphasized that the above-described embodiments of the present disclosure are merely possible examples of implementations set forth for a clear understanding of the principles of the disclosure. Many variations and modifications may be made to the above-described embodiment(s) without departing substantially from the spirit and principles of the disclosure. All such modifications and variations are intended to be included herein within the scope of this disclosure and protected by the following claims.
It should be noted that ratios, concentrations, amounts, and other numerical data may be expressed herein in a range format. It is to be understood that such a range format is used for convenience and brevity, and thus, should be interpreted in a flexible manner to include not only the numerical values explicitly recited as the limits of the range, but also to include all the individual numerical values or sub-ranges encompassed within that range as if each numerical value and sub-range is explicitly recited. To illustrate, a concentration range of “about 0.1% to about 5%” should be interpreted to include not only the explicitly recited concentration of about 0.1 wt % to about 5 wt %, but also include individual concentrations (e.g., 1%, 2%, 3%, and 4%) and the sub-ranges (e.g., 0.5%, 1.1%, 2.2%, 3.3%, and 4.4%) within the indicated range. The term “about” can include traditional rounding according to significant figures of numerical values. In addition, the phrase “about ‘x’ to ‘y’” includes “about ‘x’ to about ‘y’”.
This application claims priority to, and the benefit of, co-pending U.S. provisional application entitled “Systems and Methods for Automated Production of Multi-Composition Nanowire” having Ser. No. 62/013,728, filed Jun. 18, 2014, which is hereby incorporated by reference in its entirety.
Number | Date | Country | |
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62013728 | Jun 2014 | US |