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Patents Grants
last 30 patents
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Patent Grant
Semiconductor structure
Patent number
12,288,689
Issue date
Apr 29, 2025
Winbond Electronics Corp.
Pei-Hsiu Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Region classification of film non-uniformity based on processing of...
Patent number
12,288,724
Issue date
Apr 29, 2025
Applied Materials, Inc.
Dominic J. Benvegnu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Critical dimension error analysis method
Patent number
12,288,725
Issue date
Apr 29, 2025
Shanghai IC R&D Center Co., Ltd.
Xueru Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection layer to improve the detection of defects through optica...
Patent number
12,281,991
Issue date
Apr 22, 2025
Taiwan Semiconductor Manufacturing Company Limited
I-Che Lee
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
Patent number
12,281,893
Issue date
Apr 22, 2025
NOVA MEASURING INSTRUMENTS INC.
Heath Pois
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of processing a cleaved semiconductor wafer
Patent number
12,270,768
Issue date
Apr 8, 2025
GlobalWafers Co., Ltd.
Benjamin Michael Meyer
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method of enhancing contrast while imaging high aspect ratio struct...
Patent number
12,272,607
Issue date
Apr 8, 2025
Applied Materials, Inc.
Geetika Bajaj
B82 - NANO-TECHNOLOGY
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Patent Grant
Method of measuring mask overlay using test patterns
Patent number
12,271,116
Issue date
Apr 8, 2025
Taiwan Semiconductor Manufacturing Co., Ltd
Tseng Chin Lo
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Measuring apparatus
Patent number
12,264,908
Issue date
Apr 1, 2025
Disco Corporation
Keiji Nomaru
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Apparatus, system, and method for non-contact temperature monitorin...
Patent number
12,266,551
Issue date
Apr 1, 2025
Applied Materials, Inc.
Bhaskar Prasad
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Chips bonding auxiliary structure
Patent number
12,266,578
Issue date
Apr 1, 2025
United Microelectronics Corp.
Sheng Zhang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Optical heating apparatus with angled light holding substrate and h...
Patent number
12,261,061
Issue date
Mar 25, 2025
Ushio Denki Kabushiki Kaisha
Tomonori Yoshida
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Substrate inspection system and a method of use thereof
Patent number
12,258,665
Issue date
Mar 25, 2025
JNK TECH
Youngjin Choi
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Overlay mark, overlay marking method and overlay measuring method
Patent number
12,259,661
Issue date
Mar 25, 2025
NEXCHIP SEMICONDUCTOR CORPORATION
Kuotung Yang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Splash resistant laser wafer singulation by crack length control
Patent number
12,255,097
Issue date
Mar 18, 2025
Texas Instruments Incorporated
Yang Liu
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Methods of detecting bonding between a bonding wire and a bonding l...
Patent number
12,255,109
Issue date
Mar 18, 2025
Kulicke and Soffa Industries, Inc.
Gary S. Gillotti
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Alignment method and alignment device
Patent number
12,255,113
Issue date
Mar 18, 2025
STAR TECHNOLOGIES (WUHAN) CO., LTD.
Choon Leong Lou
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Methods of detecting bonding between a bonding wire and a bonding l...
Patent number
12,255,172
Issue date
Mar 18, 2025
Kulicke and Soffa Industries, Inc.
Gary S. Gillotti
H01 - BASIC ELECTRIC ELEMENTS
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Method, electronic device and operating method of electronic device...
Patent number
12,254,621
Issue date
Mar 18, 2025
Samsung Electronics Co., Ltd.
Do-Nyun Kim
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Grinding apparatus
Patent number
12,255,071
Issue date
Mar 18, 2025
Disco Corporation
Satoru Fujimura
B24 - GRINDING POLISHING
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Patent Grant
Multiple-level interconnect structure and manufacturing method thereof
Patent number
12,255,111
Issue date
Mar 18, 2025
United Microelectronics Corp.
Jia Fang Wu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Prediction of electrical properties of a semiconductor specimen
Patent number
12,250,503
Issue date
Mar 11, 2025
Applied Materials Israel Ltd.
Ofer Adan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Using spectroscopic measurements for substrate temperature monitoring
Patent number
12,249,525
Issue date
Mar 11, 2025
Applied Materials, Inc.
Ian McDonald
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
Patent number
12,249,526
Issue date
Mar 11, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Chen Min Lin
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Methods and material deposition systems for forming semiconductor l...
Patent number
12,249,506
Issue date
Mar 11, 2025
SILANNA UV TECHNOLOGIES PTE LTD
Petar Atanackovic
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Dynamic bonding gap control and tool for wafer bonding
Patent number
12,249,592
Issue date
Mar 11, 2025
Taiwan Semiconductor Manufacturing Co., Ltd
Han-De Chen
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Wafer metrology technologies
Patent number
12,241,924
Issue date
Mar 4, 2025
FemtoMetrix, Inc.
Viktor Koldiaev
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Methods for wafer bonding
Patent number
12,234,145
Issue date
Feb 25, 2025
Taiwan Semiconductor Manufacturing Co., Ltd.
Chien-Wei Chang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Backside power rail for physical failure analysis (PFA)
Patent number
12,237,233
Issue date
Feb 25, 2025
Taiwan Semiconductor Manufacturing Co., Ltd
Chih-Chao Chou
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Wafer storage devices configured to measure physical properties of...
Patent number
12,237,189
Issue date
Feb 25, 2025
Micron Technology, Inc.
Nagasubramaniyan Chandrasekaran
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHOD FOR CREATING PRODUCT-LIKE STRESSED SURROGATE TEST WAFERS
Publication number
20250140614
Publication date
May 1, 2025
TOKYO ELECTRON LIMITED
Anthony R. SCHEPIS
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METH...
Publication number
20250139762
Publication date
May 1, 2025
Samsung Electronics Co., Ltd.
Hyunchul KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LOCALIZED STRESS MODULATION BY IMPLANT TO BACK OF WAFER
Publication number
20250140569
Publication date
May 1, 2025
Applied Materials, Inc.
Sony Varghese
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INFORMATION PROCESSING APPARATUS, PATTERN FORMING APPARATUS, INFORM...
Publication number
20250138427
Publication date
May 1, 2025
Canon Kabushiki Kaisha
JUNYA TANAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MONITORING EMBRITTLEMENT OF AN INTERFACE BETWEEN A SUBST...
Publication number
20250137928
Publication date
May 1, 2025
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Frédéric MAZEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
YIELD IMPROVEMENTS IN STACKED PACKAGING
Publication number
20250140615
Publication date
May 1, 2025
KLA Corporation
Xuewen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD INCLUDING POSITIONING A SOURCE DIE OR A DESTINATION SITE TO...
Publication number
20250132285
Publication date
Apr 24, 2025
Canon Kabushiki Kaisha
Byung-Jin Choi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEPOSITION SYSTEM AND METHOD
Publication number
20250132148
Publication date
Apr 24, 2025
Taiwan Semiconductor Manufacturing Co., Ltd.
Chia-Hsi WANG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
MANUFACTURING METHOD OF ELECTRONIC DEVICE
Publication number
20250133868
Publication date
Apr 24, 2025
Innolux Corporation
Yu-Jhou Gong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VIRTUAL METROLOGY FOR ENHANCED WINDOW TEMPERATURE CONTROL
Publication number
20250132179
Publication date
Apr 24, 2025
Applied Materials, Inc.
Ala MORADIAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
Publication number
20250123210
Publication date
Apr 17, 2025
NOVA LTD
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD AND MANUFACTURING APPARATUS OF SEMICONDUCTOR S...
Publication number
20250118554
Publication date
Apr 10, 2025
KYOCERA CORPORATION
Yuta AOKI
C30 - CRYSTAL GROWTH
Information
Patent Application
ULTRASONIC DETECTION OF VOIDS AND CRACKS IN SUBSTRATES
Publication number
20250116632
Publication date
Apr 10, 2025
ORBOTECH LTD.
Yuri Paskover
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METROLOGY SYSTEM WITH TWIN PLANAR MOTOR STAGE
Publication number
20250118602
Publication date
Apr 10, 2025
KLA Corporation
Michel Pharand
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMPROVED OPTICAL ACCESS FOR SPECTROSCOPIC MONITORING OF SEMICONDUCT...
Publication number
20250118603
Publication date
Apr 10, 2025
Verity Instruments, Inc.
Mark Meloni
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE POLISHING APPARATUS AND SUBSTRATE POLISHING METHOD
Publication number
20250118604
Publication date
Apr 10, 2025
EBARA CORPORATION
Akira FUKUNAGA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSFER METHOD FOR MICRO FLIP CHIPS
Publication number
20250120233
Publication date
Apr 10, 2025
XIAMEN UNIVERSITY
Xu YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PEDESTAL HEATER WITH SUBSTRATE TEMPERATURE MEASUREMENT SYSTEM
Publication number
20250118578
Publication date
Apr 10, 2025
Applied Materials, Inc.
Ajith Karonnan Ramapurath
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Inspection Method
Publication number
20250112096
Publication date
Apr 3, 2025
TOKYO ELECTRON LIMITED
Hiroyuki NAKAYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIQUID PROCESSING APPARATUS, AND MONITORING METHOD
Publication number
20250112066
Publication date
Apr 3, 2025
TOKYO ELECTRON LIMITED
Shinichi MIZUSHINO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-COORDINATE SYSTEM CALIBRATION AND EQUIPMENT ALIGNMENT METHOD,...
Publication number
20250113682
Publication date
Apr 3, 2025
BOE TECHNOLOGY GROUP CO., LTD.
Chengfei WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20250112095
Publication date
Apr 3, 2025
Mitsubishi Electric Corporation
Kazufumi OKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DECAPSULATING PACKAGED INTEGRATED CIRCUIT
Publication number
20250112058
Publication date
Apr 3, 2025
Tung Nguyen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-SITU FLUORESCENCE-BASED CHAMBER AND WAFER MONITORING
Publication number
20250110055
Publication date
Apr 3, 2025
TOKYO ELECTRON LIMITED
David Eitan BARLAZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACCELERATOR STRUCTURE, METHOD FOR GENERATING ACCELERATOR STRUCTURE,...
Publication number
20250105225
Publication date
Mar 27, 2025
Cambricon (Xi'an) Semiconductor Co., Ltd.
Zhiwei QIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIGNAL ROUTING BETWEEN MEMORY DIE AND LOGIC DIE
Publication number
20250104761
Publication date
Mar 27, 2025
Micron Technology, Inc.
Sean S. Eilert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND MISALIGNMENT MEASUREMENT METHOD FOR SEMICO...
Publication number
20250105062
Publication date
Mar 27, 2025
LAPIS Semiconductor Co., Ltd.
Takumi TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TUNABLE ELECTRON TRANSPARENT SUBSTRATES FOR HIGH-RESOLUTION CHARACT...
Publication number
20250104996
Publication date
Mar 27, 2025
MATTIQ, INC.
Andrey IVANKIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
Publication number
20250093277
Publication date
Mar 20, 2025
FemtoMetrix, Inc.
Viktor Koldiaev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS
Publication number
20250096022
Publication date
Mar 20, 2025
Taiwan Semiconductor Manufacturing company Ltd.
KAI-LIN CHUANG
H01 - BASIC ELECTRIC ELEMENTS