Thin film light emitting diode

Information

  • Patent Grant
  • 8384091
  • Patent Number
    8,384,091
  • Date Filed
    Tuesday, November 10, 2009
    15 years ago
  • Date Issued
    Tuesday, February 26, 2013
    11 years ago
Abstract
Light emitting LEDs devices comprised of LED chips that emit light at a first wavelength, and a thin film layer over the LED chip that changes the color of the emitted light. For example, a blue LED chip can be used to produce white light. The thin film layer beneficially consists of a florescent material, such as a phosphor, and/or includes tin. The thin film layer is beneficially deposited using chemical vapor deposition.
Description

1. Field of the Invention


The present invention relates to diodes (LEDs), and more particularly, present invention relates to light emitting diodes LEDs.


2. Discussion of the Related Art


Light emitting diodes LEDs are well-known semiconductor devices that convert electrical current into light. An LED produces light by exciting electrons across the band gap between a conduction band and a valence band of a semiconductor active (light-emitting) layer. The electron transition generates light at a wavelength (color) that depends on the band gap. Thus, the color of the light (wavelength) emitted by an LED depends on the semiconductor material(s) of the active layer.


LEDs are widely available in a range of colors, for example, red, green, blue, yellow, and orange. However, conventional LEDs are relatively monochromatic light sources. Unfortunately, some applications require white light, which includes all primary colors. For example, laptop computers often require white-light backlights. Usually, white light is supplied either by incandescent bulbs or by fluorescent lamps. Although inexpensive, incandescent bulbs have fairly short lifetimes and low luminous efficiency. While more efficient, fluorescent lamps also tend to have limited lifetimes. Furthermore, fluorescent lamps require relatively large, heavy and expensive support devices, such as voltage stabilizers.


A white LED source could be made by fabricating closely spaced (or otherwise light-mixed) red, green, and blue LEDs that emit light in proper proportions. However, blue LEDs have been relatively difficult to fabricate, primarily because of difficulties in fabricating high quality crystals having a suitable band gap. Despite these difficulties, blue GaN-based LEDs have recently become commercially available. This has enabled white LEDs to actually be fabricated by mixing green, red and blue light together.


While successful in producing white light, three-component (green, red and blue) LEDs have problems. For example, three-component LEDs will use significantly more power than a single component LED. Additionally, three-component LEDs require careful balancing of optical outputs to achieve high quality white light, a balance that is difficult to maintain over time and temperature, and that requires careful and expensive fabrication. The necessity of optical balancing combined with a relatively complicated drive circuitry means that three-component LEDs are, in practice, difficult and expensive to fabricate.


Because of the forgoing problems with three-component LEDs it is would be advantageous to produce white light using only a single-element LED. Such single element white LEDs are known. For example, FIG. 1 illustrates a prior art single-element, white LED 12. The LED 12 incorporates an yttrium-aluminum garnet (YAG) phosphor. Essentially, the phosphor layer produces white light from blue light. As shown, the single element white LED 12 is comprised of a blue LED chip 14 that is located on a base 15, which is inside an organic YAG phosphor 16. The YAG phosphor 16 is embedded in a dome-shaped package 17 having a hemispherical top 18. The package 17 protects the resulting LED from damage caused by static electricity, moisture, and other environmental influences. Extending from the package 17 are two leads 20 and 22. Bonding wires 24 and 26 connect the anode and cathode of the LED chip 14 to the leads 20 and 22.


Still referring to FIG. 1, when electric power is applied to the LED chip 14 via the leads 20 and 22 and the bonding wires 24 and 26, the LED chip 14 emits blue light. A part of the blue light passes through the YAG phosphor 16, while another part is absorbed by the YAG phosphor 16. The result is white light from the package 17.


Thus, a key to making white LEDs using the method illustrated in FIG. 1 is suitable blue LEDs. A beneficial approach to fabricating such blue LEDs is to incorporate active layers comprised of Gallium-Nitride (GaN) and Indium to produce InGaN/GaN semiconductor layers. In fact, the energy efficiency of GaN-based white LEDs has surpassed that of incandescent lamps, and is now comparable with that of fluorescent lamps.


Despite their numerous advantages, white LEDs similar to the one shown in FIG. 1 have problems. One set of problems relates to degradation of the bonding wires 24 and 26, the LED chip 14, and the leads 20 and 22 due to direct contact and subsequent chemical reaction with the YAG phosphor 16. Additionally, the YAG phosphor 16 can be degraded by such chemical reactions.


Another problem with white LEDs similar to the one shown in FIG. 1 is that the hemispherical top 18 of the package 17 results in a “ring pattern” in the emitted light. Thus, the emitted light has poor luminance uniformity. The hemispherical top 18 also makes it difficult to reliably coat phosphors inside the package if such coating is required.


Another problem with white LEDs similar to the one shown in FIG. 1 is that the actual production of white light does not come from the light-producing LED chip 14, which emits only blue light, but from phosphor 16 within the package 17. Thus, the package not only provides protection, it is a functional requirement. Thus, the foregoing technique is not well suited for use with surface mount packaging.


U.S. Pat. No. 6,337,536, by inventors Matsubara et al., which issued on Jan. 8, 2002, and which is entitled, “White color light emitting diode and neutral color light emitting diode,” discloses a white light emitting source that uses an n-type ZnSe single crystal substrate. The substrate is doped with I, Cl, Br, Al, Ga, or In emission centers, and includes an epitaxial film active layer structure of ZnSe, ZnCdSe or ZnSeTe. The active layer emits blue or blue-green light. The emission centers convert the blue or blue-green light to yellow or orange. The blue or blue-green light and the yellow or orange light synthesize white light or a neutral color light between red and blue.


While the techniques taught in U.S. Pat. No. 6,337,536 are generally successful, they have problems. For example, U.S. Pat. No. 6,337,536 teaches a thick substrate. Therefore, the light intensity is heavily dependent on the thickness of the substrate. Furthermore, the materials used in U.S. Pat. No. 6,337,536 may not be optimal in specific applications.


Therefore, a new single-element, white LED would be beneficial. Particularly beneficial would be a single-element, white LED that reduces or eliminates bonding wire, LED chip, connector lead, and phosphor degradation. Also beneficial would be a single-element, white LED that does not produce a ring pattern and that improves the uniformity of emitted light. Such a single-element, white LED would beneficially be fabricated as an on-chip, single-element, white LED that does not require a package for white light emissions. A method of fabricating white light emitting diodes without coating phosphor inside packages would be useful. Also beneficial would be a single-element, white LED with a light output that does not depend on the thickness of a substrate. More generally, a method of fabricating light emitting diodes using thin film fluorescent coatings would be beneficial.


BRIEF SUMMARY OF THE INVENTION

The following summary of the invention is provided to facilitate an understanding of some of the innovative features unique to the present invention, and is not intended to be a full description. A full appreciation of the various aspects of the invention can be gained by taking the entire specification, claims, drawings, and abstract as a whole.


The principles of the present invention provide for white LEDs and for methods of fabricating white LEDs. Embodiments of white LEDs that are in accord with the principles of the present invention have reduced or eliminated bonding wire, LED chip, lead, and/or phosphor degradation. Such white LEDs can be fabricated on-chip, with improved light uniformity, and in such a manner that the light output is not heavily dependent on the thickness of a substrate.


According to the broad principles of the present invention, an LED element that produces light at a first wavelength and having p and n contacts is fabricated on a substrate. Then, a tinted thin film covers the LED element. A passivation layer is located on the LED element, but in such a manner that the p and n contact pads are exposed. Electrical power applied to the p and n contacts causes the LED element to emit light at the first wavelength. The thin film converts light at the first wavelength to at least a second wavelength.


According to the principles of the present invention a white LED includes a blue-LED element that includes p and n contact pads. A thin film material, such as a phosphor (like YAG) or a tin-containing compound, covers the blue-LED element. Such thin film materials are beneficially formed using metal organic chemical vapor deposition (MOCVD), atomic layer chemical vapor deposition (ALD), plasma enhanced MOCVD, plasma enhanced ALD, photo enhanced CVD, or other chemical vapor deposition methods.


A passivation layer, beneficially about a 1000 Å-thick SiO2 or SixNy layer, can be located on the blue-LED element, but in such a manner that the p and n contact pads are exposed. The passivation layer can be formed using PECVD, sputtering, electron beam evaporation, or coating with a material, such as epoxy or flowable SiO2. PECVD is particularly beneficial in that it provides protected sidewalls. Spin-coating is a useful method of material coating. The passivation layer can then be patterned to expose the p and n contact pads using photolithography and a suitable etchant (such a BOE, HF, and/or photo-resist stripping).


Wire bonds connect to the p and n contact pads. A second passivation layer can be formed over the p and n pads, over ends of the wire bonds, and over the first passivation layer. The result is an on-chip, single-element, white LED that is capable of emitting white-light without being encapsulated. Furthermore, an on-chip, single-element, white LED can be formed without a ring-patterned light. However, the resulting on-chip, single-element, white LED could be encapsulated in a package (such as a lamp or surface mount package) as required.


According to the principles of the present invention, an LED includes an LED element that includes p and n contact pads and that emits light at a first wavelength. A fluorescent thin film material (such as a phosphor or a tin-containing material) covers the LED element. Such thin film materials are beneficially formed using metal organic chemical vapor deposition (MOCVD), atomic layer chemical vapor deposition (ALD), plasma enhanced MOCVD, plasma enhanced ALD, photo enhanced CVD, or other chemical vapor deposition methods. A passivation layer, beneficially about a 1000 Å-thick SiO2 or SixNy layer, can be located on the LED element, but in such a manner that the p and n contact pads are exposed. The fluorescing material converts light emitted by the LED element into at least a second wavelength.


The novel features of the present invention will become apparent to those of skill in the art upon examination of the following detailed description of the invention or can be learned by practice of the present invention. It should be understood, however, that the detailed description of the invention and the specific examples presented, while indicating certain embodiments of the present invention, are provided for illustration purposes only because various changes and modifications within the spirit and scope of the invention will become apparent to those of skill in the art from the detailed description of the invention and claims that follow.





BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying figures, in which like reference numerals refer to identical or functionally-similar elements throughout the separate views and which are incorporated in and form part of the specification, further illustrate the present invention and, together with the detailed description of the invention, serve to explain the principles of the present invention.



FIG. 1 illustrates a prior art white LED;



FIG. 2 illustrates a lateral topology blue LED;



FIG. 3 illustrates vertical topology blue LED;



FIG. 4 illustrates a vertical topology, blue LED after coating with a passivation material;



FIG. 5 illustrates the LED of FIG. 4 after patterning of the passivation material;



FIG. 6 illustrates the LED of FIG. 5 after forming of a thin film;



FIG. 7 illustrates the LED of FIG. 6 after patterning of the thin film and after bonding wires are connected;



FIG. 8 illustrates the LED of FIG. 7 after a second coating of a passivation material; and



FIG. 9 illustrates an alternative embodiment LED that is in accord with the principles of the present invention.





DETAILED DESCRIPTION OF THE ILLUSTRATED EMBODIMENTS

The following generally describes a process for fabricating on-chip white LEDs. While that description is an advantageous method of fabricating white LEDs, the principles of the present invention are not limited to that described method. Accordingly, the present invention is to be limited only by the claims that follow as understood and interpreted according to United States Patent Laws.


Fabrication of a white light emitting diode that is in accord with the principles of the present invention begins with procurement of, such as by fabrication, a blue-LED chip having p and n contact pads. FIGS. 2 and 3 illustrate suitable blue-LED chips. In particular, FIG. 2 illustrates a lateral topology blue-LED chip 30 that is fabricated on a sapphire substrate 32. An n-GaN buffer layer 34 is formed on the substrate 32. A relatively thick n-GaN epitaxial layer 36 is then formed on the buffer layer 34. An active layer 38 having multiple quantum wells of aluminum-indium-gallium-nitride (AlInGaN) or of InGaN/GaN is then formed on the n-type GaN epitaxial layer 36. A p-GaN layer 40 is then formed on the active layer 38. A transparent conductive layer 42 is then formed on the p-GaN layer 40. The transparent conductive layer 42 may be made of any suitable material, such as Ru/Au, Ni/Au or indium-tin-oxide (ITO). A p-type electrode 44 is then formed on one side of the transparent conductive layer 42. Suitable p-type electrode materials include Ni/Au, Pd/Au, Pd/Ni and Pt. A p contact pad 46 is then formed on the p-type electrode 44. Beneficially, the p contact pad 46 is Au. The transparent conductive layer 42, the p-GaN layer 40, the active layer 38 and part of the n-GaN layer 36 are then etched to form a step. Because of the difficulty of wet etching GaN, a dry etch is beneficially usually used to form the step. The LED 30 is then completed by forming an n-electrode pad 48 (such as Cr or Au) and an n contact pad 50 (such as Au) on the step.



FIG. 3 illustrates an alternative blue LED, specifically a vertical topology GaN-based LED 54. An example of this alternative blue LED structure is disclosed in U.S. application Ser. No. 09/905,969 entitled “DIODE HAVING HIGH BRIGHTNESS AND METHOD THEREOF” filed on Jul. 17, 2001, and U.S. application Ser. No. 09/983,994 entitled “DIODE HAVING VERTICAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME” filed on Oct. 26, 2001, both of which are incorporated in this application as if fully set forth herein. The LED 54 is partially fabricated on a sapphire substrate that is subsequently removed. Removal of sapphire substrate may be done by, for example, laser lift-off. As shown, the LED 54 includes a GaN buffer layer 55 having an n-metal contact 56 on a bottom surface and a relatively thick n-GaN layer 58 on the other. The n-metal contact 56 is beneficially formed from a high reflective layer that is overlaid by a high conductivity metal (beneficially Au) to form an n contact pad 57. An active layer 60 having a multiple quantum well is formed on the n-type GaN layer 58, and a p-GaN layer 62 is formed on the active layer 60. A transparent conductive layer 64 is then formed on the p-GaN layer 62, and a p-type electrode 66 is formed on the transparent conductive layer 64. A p contact pad 68 is then formed on the p-type electrode 66.


The vertical GaN-based LED 54 has advantages in that step etching is not required. However, to locate the n-metal contact 56 below the GaN buffer layer 55, the sapphire substrate (not shown) that is used for initial GaN growth is removed. Sapphire substrate removal using laser lift-off is known, reference U.S. Pat. No. 6,071,795 to Cheung et al., entitled, “Separation of Thin Films From Transparent Substrates By Selective Optical Processing,” issued on Jun. 6, 2000, and Kelly et al. “Optical process for liftoff of group III-nitride films”, Physica Status Solidi (a) vol. 159, 1997, pp. R3-R4). Furthermore, highly advantageous methods of fabricating GaN semiconductor layers on sapphire (or other insulating and/or hard) substrates are taught in U.S. patent application Ser. No. 10/118,317 entitled “A Method of Fabricating Vertical Devices Using a Metal Support Film” and filed on Apr. 9, 2002 by Myung Cheol Yoo, and in U.S. patent application Ser. No. 10/118,316 entitled “Method of Fabricating Vertical Structure” and filed on Apr. 9, 2002 by Lee et al. Additionally, a method of etching GaN and sapphire (and other materials) is taught in U.S. patent application Ser. No. 10/118,318 entitled “A Method to Improve Light Output of GaN-Based Light Emitting Diodes” and filed on Apr. 9, 2002 by Yeom et al., all of which are hereby incorporated by reference as if fully set forth herein.


In principle, the vertical GaN-based LED 54 is preferred. Reasons for this include the fact that a 2″ diameter sapphire wafer has the potential to produce about 35,000 vertical GaN-based LEDs, but only about 12,000 lateral GaN-based LEDs. Furthermore, the lateral topology is more vulnerable to static electricity, primarily because the two electrodes/pads (44/46 and 48/50) are close together. Additionally, as the lateral topology is fabricated on an insulating substrate, and as the vertical topology can be attached to a heat sink, the lateral topology has relatively poor thermal dissipation.


While the vertical GaN-based LED 54 will be preferred in many applications, at the present time, lateral topology blue LED chips 30 are more common. Furthermore, the principles of the present invention are fully applicable to both types of blue LEDs (as well as with hybrids and variations). Therefore, without implying any loss of generality, the subsequent description of the fabrication of single-element white LEDs will make specific reference to the use of a lateral blue-LED chip 30.


Referring now to FIG. 4, a passivation layer 80 is formed over the blue LED chip 30. A suitable passivation layer 80 may be an SiO2 or SixNy layer of 1000 Å-thick, for example, formed on exposed surfaces of the LED chip 30 using PECVD. Alternatively, the passivation layer 80 may be formed by sputtering, electron beam evaporation, or by coating with a suitable protective material, such as epoxy or flowable SiO2. Note that spin-coating is a particularly useful coating technique. However, PECVD is beneficial because it can form the passivation layer 80 on the sidewalls of the blue LED chip 30.


Referring now to FIG. 5, the passivation layer 80 is then patterned to expose the p and n contact pads 46 and 50 using a suitable etchant. For example, BOE, HF, and/or photo-resist stripping can be used to expose the pads.


Then, as shown in FIG. 6, a thin film layer 86 of, for example, a fluorescent material (such as phosphor or a tin-containing compound) is formed on the passivation layer 80 so as to cover the blue LED element. Other suitable materials can be used for the thin film layer 86 to convert a light of first wavelength (a first color) to a light of second wavelength (a second color). Here, if a blue LED is used and coated with a phosphor thin film, for example, in accordance with the present invention, the blue light would be converted to white light by the phosphor, thus producing an “on-chip” white LED. Using different color LEDs and different color influencing materials would result in different colors produced directly from the chip.


The thin film layer is beneficially formed using metal organic chemical vapor deposition (MOCVD), atomic layer chemical vapor deposition (ALD), plasma enhanced MOCVD, plasma enhanced ALD, photo enhanced CVD, or other chemical vapor deposition methods. Preferably, the thin film layer 86 is about 10 μm or so thick. Thus, the thin film layer 86 is an integral element of the chip, and not part of a package. Regarding the film thickness, in general the thinner the better. The thickness can be reduced by growing dense thin film layers.


Referring now to FIG. 7, the thin film layer 86 is patterned to expose the p and n contact pads 46 and 50 using a suitable solvent (which will depend on the composition of the thin film layer 86). Bonding wires 90 and 92 are then bonded to the p and n contact pads 46 and 50, respectively.


Referring now to FIG. 8, an optional second passivation layer 94 (which is optically transparent) is then formed over the structure of FIG. 7. Beneficially the first and second passivation layers 80 and 94 are formed using the same process. The result is a white LED 100.


The white LED 100 can then be encapsulated into a package, such as a lamp package or a surface mount package. However, the white LED 100 also can be used unpackaged and/or as part of another assembly.


In some applications it will be beneficial to incorporate a reflector between a contact pad and an adjacent semiconductor layer. For example, as shown in FIG. 9, if a vertical LED 54 is used as the blue light source for a white LED 101, it might be advantageous to incorporate a reflective layer 104 between the n-metal contact 56 and the n contact pad 57. In that case, it is advantageous to include the second passivation layer 94 under the n contact pad 57 after the bonding wire 92 is attached. Likewise, the second passivation layer 94 is beneficially over the p contact pad 68. However, is should be understood that in all cases the second passivation layer 94 is optional.


The foregoing embodiments have described new, useful, and nonobvious white LEDs 101. However, the general principles of depositing thin films that change the color of input light, such as by a thin film material, are applicable to more than just white LEDs. It is entirely possible to implement LEDs that emit other then white light by depositing various thin film materials on LEDs that emit light of different colors. Therefore, while the embodiments and examples set forth herein are presented to best explain the present invention and its practical application and to thereby enable those skilled in the art to make and utilize the invention, others who are skilled in the art will recognize that the foregoing description and examples have been presented for the purpose of illustration and example only.

Claims
  • 1. A light emitting device, comprising: a semiconductor structure having a first surface, a second surface, and a side surface, the semiconductor structure comprising a first-type semiconductor layer, an active layer, and a second-type semiconductor layer;a first electrode electrically connected to the first-type semiconductor layer, the first electrode comprising a reflective layer, wherein the first electrode is arranged on the first surface that is opposite the second surface;a second electrode electrically connected to the second-type semiconductor layer;an insulative passivation layer on the second surface and the side surface of the semiconductor structure; anda phosphor on the insulative passivation layer, the phosphor having an open space corresponding to the second electrode for an external electrical connection, wherein the external electrical connection comprises a bonding wire, wherein the open space prevents the phosphor from contacting the bonding wire, wherein the insulative passivation layer is arranged between the second surface of the semiconductor structure and the phosphor.
  • 2. The device according to claim 1, wherein the open space is arranged near an edge of the second surface of the semiconductor structure.
  • 3. The device according to claim 1, wherein the bonding wire is arranged over the open space of the phosphor.
  • 4. The device according to claim 1, wherein the insulative passivation layer has an open space corresponding to the second electrode.
  • 5. The device according to claim 4, wherein the open space of the phosphor and the open space of the insulative passivation layer have substantially the same size.
  • 6. The device according to claim 1, wherein the insulative passivation layer has an open space corresponding to the second electrode, and wherein the bonding wire is arranged over the open space of the insulative passivation layer.
  • 7. The device according to claim 1, wherein the open space of the phosphor is configured to reduce the possibility of direct contact between the bonding wire and the phosphor.
  • 8. The device according to claim 1, wherein the phosphor comprises at least one of a fluorescent material and a tin-containing material.
  • 9. The device according to claim 1, wherein the insulative passivation layer comprises at least one of Si, epoxy, oxides, and nitrides.
  • 10. The device according to claim 1, further comprising a second insulative passivation layer on the phosphor.
  • 11. The device according to claim 10, wherein the second insulative passivation layer covers the second electrode.
  • 12. The device according to claim 1, wherein the phosphor is arranged with a substantially uniform thickness on at least one of the second surface, the side surface of the semiconductor structure, a side surface of the first electrode, and a side surface of the second electrode.
  • 13. The device according to claim 1, wherein the phosphor is arranged with a substantially uniform thickness on the insulative passivation layer.
  • 14. The device according to claim 1, wherein a portion of the insulative passivation layer electrically isolates the phosphor from the semiconductor structure.
  • 15. The device according to claim 1, wherein the phosphor is arranged on substantially the entire surface of the insulative passivation layer.
  • 16. The device according to claim 1, wherein the phosphor is about 10μm thick.
  • 17. The device according to claim 1, wherein the insulative passivation layer is configured to reduce the possibility of direct contact between the semiconductor structure and the phosphor.
  • 18. The device according to claim 1, wherein the thickness of the insulative passivation layer is about 1000 Å.
  • 19. The device according to claim 1, wherein the insulative passivation layer contacts the phosphor.
  • 20. The device according to claim 1, wherein the second electrode is arranged on the second surface of the semiconductor structure.
  • 21. The device according to claim 20, wherein the phosphor is arranged with a substantially uniform thickness on the second surface of the semiconductor structure.
  • 22. The device according to claim 20, wherein the open space is arranged near an edge of the second surface of the semiconductor structure.
  • 23. The device according to claim 20, wherein the first-type semiconductor layer has the first surface and the second-type semiconductor layer has the second surface.
  • 24. The device according to claim 1, wherein the first-type semiconductor layer is p-type and the second-type semiconductor layer is n-type.
  • 25. The device according to claim 1, wherein the reflective layer reflects light from the active layer back through the second surface.
  • 26. The device according to claim 1, wherein a width of the open space is substantially the same as a width of the second electrode.
  • 27. The device according to claim 1, wherein the insulative passivation layer is arranged over the active layer.
  • 28. The device according to claim 1, wherein the insulative passivation layer is arranged on a side of the first electrode.
  • 29. The device according to claim 1, wherein at least one of the second surface and the side surface is a light emitting surface.
  • 30. The device according to claim 29, wherein the insulative passivation layer is arranged on the light emitting surface.
  • 31. The device according to claim 1, wherein the insulative passivation layer and the phosphor is arranged over the reflective layer.
  • 32. The device according to claim 1, wherein the open space comprises a portion not covered by the insulative passivation layer and the phosphor.
BACKGROUND OF THE INVENTION

This application is a Continuation of application Ser. No. 11/978,680 filed on Oct. 30, 2007, now U.S. Pat. No. 7,649,210 which is a continuation of application Ser. No. 10/975,095 filed on Oct. 28,2004, now U.S. Pat. No. 7,691,650 which is a divisional of application Ser. No. 10/179,010 filed on Jun. 26, 2002, now issued as U.S. Pat. No. 6,841,802, all of which are hereby incorporated by reference.

US Referenced Citations (282)
Number Name Date Kind
2913358 Harrington et al. Nov 1959 A
2981877 Noyce Apr 1961 A
3602982 Kooi Sep 1971 A
3774086 Vincent, Jr. Nov 1973 A
3875456 Kano et al. Apr 1975 A
3907620 Abraham et al. Sep 1975 A
4141135 Henry et al. Feb 1979 A
4406052 Cogan Sep 1983 A
4634926 Vriens et al. Jan 1987 A
4647812 Vriens et al. Mar 1987 A
4882617 Vriens Nov 1989 A
4918497 Edmond Apr 1990 A
5027168 Edmond Jun 1991 A
5034068 Glenn et al. Jul 1991 A
5040044 Noguchi et al. Aug 1991 A
5162876 Kitagawa et al. Nov 1992 A
5198795 Shibasaki et al. Mar 1993 A
5210051 Carter, Jr. May 1993 A
5382452 Bruno et al. Jan 1995 A
5454915 Shor et al. Oct 1995 A
5504036 Dekker et al. Apr 1996 A
5523589 Edmond et al. Jun 1996 A
5554418 Ito et al. Sep 1996 A
5585648 Tischler Dec 1996 A
5592501 Edmond et al. Jan 1997 A
5620557 Manabe et al. Apr 1997 A
5631664 Adachi et al. May 1997 A
5644190 Potter Jul 1997 A
5661074 Tischler Aug 1997 A
5684309 McIntosh et al. Nov 1997 A
5693963 Fujimoto et al. Dec 1997 A
5707745 Forrest et al. Jan 1998 A
5729029 Rudaz Mar 1998 A
5739554 Edmond et al. Apr 1998 A
5744233 Optiz et al. Apr 1998 A
5786606 Nishio et al. Jul 1998 A
5798537 Nitta Aug 1998 A
5804834 Shimoyama et al. Sep 1998 A
5813752 Singer et al. Sep 1998 A
5813753 Vriens et al. Sep 1998 A
5847507 Butterworth et al. Dec 1998 A
5874747 Redwing et al. Feb 1999 A
5929466 Ohba et al. Jul 1999 A
5930653 Gaal Jul 1999 A
5959307 Nakamura et al. Sep 1999 A
5959316 Lowery Sep 1999 A
5972781 Wegleiter Oct 1999 A
5990500 Okazaki Nov 1999 A
5998925 Shimizu et al. Dec 1999 A
6025251 Jakowetz et al. Feb 2000 A
6041515 Ally et al. Mar 2000 A
6043515 Kamiguchi et al. Mar 2000 A
6066861 Hohn et al. May 2000 A
6067309 Onomura et al. May 2000 A
6069440 Shimizu et al. May 2000 A
6071795 Cheung et al. Jun 2000 A
6078064 Ming-Jiunn et al. Jun 2000 A
6093965 Nakamura et al. Jul 2000 A
6096570 Hattori Aug 2000 A
6100104 Haerle Aug 2000 A
6100545 Chiyo et al. Aug 2000 A
6120600 Edmond et al. Sep 2000 A
6133589 Krames et al. Oct 2000 A
6146916 Nanishi et al. Nov 2000 A
6155699 Miller et al. Dec 2000 A
6172382 Nagahama et al. Jan 2001 B1
6177684 Sugiyama Jan 2001 B1
6229160 Krames et al. May 2001 B1
6245259 Hohn et al. Jun 2001 B1
6252254 Soules et al. Jun 2001 B1
6255670 Srivastava et al. Jul 2001 B1
6277301 Hohn et al. Aug 2001 B1
6278136 Nitta Aug 2001 B1
6281526 Nitta et al. Aug 2001 B1
6294800 Duggal et al. Sep 2001 B1
6303404 Moon et al. Oct 2001 B1
6303405 Yoshida et al. Oct 2001 B1
6310351 Zur Oct 2001 B1
6320206 Coman et al. Nov 2001 B1
6326294 Jang et al. Dec 2001 B1
6329216 Matsumoto et al. Dec 2001 B1
6335217 Chiyo et al. Jan 2002 B1
6337536 Matsubara et al. Jan 2002 B1
6339010 Sameshima Jan 2002 B2
6340824 Komoto et al. Jan 2002 B1
6350998 Tsuji Feb 2002 B1
6358770 Itoh et al. Mar 2002 B2
6365429 Kneissl et al. Apr 2002 B1
6388275 Kano May 2002 B1
6388378 Tornqvist et al. May 2002 B1
6395572 Tsutsui et al. May 2002 B1
6409938 Comanzo Jun 2002 B1
6417019 Mueller et al. Jul 2002 B1
6426512 Ito et al. Jul 2002 B1
6429583 Levinson et al. Aug 2002 B1
6445007 Wu et al. Sep 2002 B1
6455340 Chua et al. Sep 2002 B1
6466135 Srivastava et al. Oct 2002 B1
6468824 Chen et al. Oct 2002 B2
6472765 Sano et al. Oct 2002 B1
6479839 Nikolaev et al. Nov 2002 B2
6486499 Krames et al. Nov 2002 B1
6495894 Shibata et al. Dec 2002 B2
6500689 Uemura et al. Dec 2002 B2
6500869 Driller et al. Dec 2002 B1
6501100 Srivastava et al. Dec 2002 B1
6501102 Mueller-Mach et al. Dec 2002 B2
6504181 Furukawa et al. Jan 2003 B2
6507049 Yeager et al. Jan 2003 B1
6508878 Kim et al. Jan 2003 B2
6509651 Matsubara et al. Jan 2003 B1
6510195 Chappo et al. Jan 2003 B1
6515306 Kuo et al. Feb 2003 B2
6518079 Imier Feb 2003 B2
6518600 Shaddock Feb 2003 B1
6521915 Odaki et al. Feb 2003 B2
6522065 Srivastava et al. Feb 2003 B1
6538371 Duggal et al. Mar 2003 B1
6551848 Kwak et al. Apr 2003 B2
6555405 Chen et al. Apr 2003 B2
6559075 Kelly et al. May 2003 B1
6562648 Wong et al. May 2003 B1
6576488 Collins, III et al. Jun 2003 B2
6576930 Reeh et al. Jun 2003 B2
6580097 Soules et al. Jun 2003 B1
6586874 Komoto et al. Jul 2003 B1
6586875 Chen et al. Jul 2003 B1
6589808 Chiyo et al. Jul 2003 B2
6592780 Hohn et al. Jul 2003 B2
6600175 Baretz et al. Jul 2003 B1
6603146 Hata et al. Aug 2003 B1
6603258 Mueller-Mach et al. Aug 2003 B1
6613247 Hohn et al. Sep 2003 B1
6614060 Wang et al. Sep 2003 B1
6614170 Wang et al. Sep 2003 B2
6614172 Chiu et al. Sep 2003 B2
6614179 Shimizu et al. Sep 2003 B1
6617401 Rubinsztajn Sep 2003 B2
6620643 Koike Sep 2003 B1
6621211 Srivastava et al. Sep 2003 B1
6624491 Waitl et al. Sep 2003 B2
6627921 Wong et al. Sep 2003 B2
6635363 Duclos et al. Oct 2003 B1
6639925 Niwa et al. Oct 2003 B2
6639928 Marion Oct 2003 B2
6642618 Yagi et al. Nov 2003 B2
6642652 Collins, III et al. Nov 2003 B2
6649943 Shibata et al. Nov 2003 B2
6650044 Lowery Nov 2003 B1
6661030 Komoto et al. Dec 2003 B2
6669866 Kummer et al. Dec 2003 B1
6674097 Komoto et al. Jan 2004 B2
6677173 Ota Jan 2004 B2
6685852 Setlur et al. Feb 2004 B2
6693935 Tojo et al. Feb 2004 B2
6696703 Mueller-Mach et al. Feb 2004 B2
6711191 Kozaki et al. Mar 2004 B1
6711192 Chikuma et al. Mar 2004 B1
6711426 Benaron et al. Mar 2004 B2
6734467 Schlereth et al. May 2004 B2
6734468 Uemura et al. May 2004 B2
6735230 Tanabe et al. May 2004 B1
6744196 Jeon Jun 2004 B1
6746889 Eliashevich et al. Jun 2004 B1
6747406 Bortscheller et al. Jun 2004 B1
6756731 Sano Jun 2004 B1
6759688 Preston et al. Jul 2004 B2
6765232 Takahashi et al. Jul 2004 B2
6774401 Nakada et al. Aug 2004 B2
6774405 Yasukawa et al. Aug 2004 B2
6784463 Camras et al. Aug 2004 B2
6791119 Slater, Jr. et al. Sep 2004 B2
6791259 Stokes et al. Sep 2004 B1
6798136 Sommers Sep 2004 B2
6803603 Nitta et al. Oct 2004 B1
6812500 Reeh et al. Nov 2004 B2
6815725 Sugawara et al. Nov 2004 B2
6815728 Tsuda et al. Nov 2004 B2
6818531 Yoo et al. Nov 2004 B1
6841802 Yoo Jan 2005 B2
6846686 Saeki et al. Jan 2005 B2
6869820 Chen Mar 2005 B2
6873634 Onomura et al. Mar 2005 B2
6876003 Nakamura et al. Apr 2005 B1
6876005 Hsieh et al. Apr 2005 B2
6878563 Bader et al. Apr 2005 B2
6878971 Uemura Apr 2005 B2
6890234 Bortscheller et al. May 2005 B2
6891203 Kozawa et al. May 2005 B2
6949395 Yoo Sep 2005 B2
6960488 Brosnihan et al. Nov 2005 B2
6992334 Wierer et al. Jan 2006 B1
6995510 Murakami et al. Feb 2006 B2
7005198 Yano et al. Feb 2006 B2
7029935 Negley et al. Apr 2006 B2
7049159 Lowery May 2006 B2
7067849 Yoo Jun 2006 B2
7078732 Reeh et al. Jul 2006 B1
7105370 Bader et al. Sep 2006 B2
7125737 Edmond et al. Oct 2006 B2
7126162 Reeh et al. Oct 2006 B2
7148520 Yoo Dec 2006 B2
7151283 Reeh et al. Dec 2006 B2
7164158 Stein et al. Jan 2007 B2
7170101 Tatsumi et al. Jan 2007 B2
7193246 Tanizawa et al. Mar 2007 B1
7202506 DenBaars et al. Apr 2007 B1
7235189 Hohn et al. Jun 2007 B2
7242025 Eisert et al. Jul 2007 B2
7250638 Lee et al. Jul 2007 B2
7265392 Hahn et al. Sep 2007 B2
7276736 Hohn et al. Oct 2007 B2
7319247 Bader et al. Jan 2008 B2
7345317 Reeh et al. Mar 2008 B2
7365369 Nakamura et al. Apr 2008 B2
7371597 Yoo May 2008 B2
7402838 Tanizawa et al. Jul 2008 B2
7432642 Murazaki Oct 2008 B2
7514721 Krames et al. Apr 2009 B2
7588998 Fehrer et al. Sep 2009 B2
7601550 Bogner et al. Oct 2009 B2
7629621 Reeh et al. Dec 2009 B2
7649210 Yoo Jan 2010 B2
7691650 Yoo Apr 2010 B2
7709851 Bader et al. May 2010 B2
7709852 Hohn et al. May 2010 B2
7939844 Hahn et al. May 2011 B2
7956364 Yoo Jun 2011 B2
8071996 Hohn et al. Dec 2011 B2
20010000622 Reeh et al. May 2001 A1
20010002049 Reeh et al. May 2001 A1
20010004112 Furukawa et al. Jun 2001 A1
20010014391 Forrest et al. Aug 2001 A1
20010019134 Chang et al. Sep 2001 A1
20010028053 Hohn et al. Oct 2001 A1
20010028062 Uemura et al. Oct 2001 A1
20010030326 Reeh et al. Oct 2001 A1
20010042866 Coman et al. Nov 2001 A1
20010045647 Hohn et al. Nov 2001 A1
20010050371 Odaki et al. Dec 2001 A1
20020000643 Uemura et al. Jan 2002 A1
20020003233 Mueller-Mach et al. Jan 2002 A1
20020030444 Muller-Mach et al. Mar 2002 A1
20020043926 Takahashi et al. Apr 2002 A1
20020079506 Komoto et al. Jun 2002 A1
20020084745 Wang et al. Jul 2002 A1
20020084748 Ayala et al. Jul 2002 A1
20020088985 Komoto et al. Jul 2002 A1
20020123164 Slater, Jr. et al. Sep 2002 A1
20020137244 Chen et al. Sep 2002 A1
20020145147 Chiou et al. Oct 2002 A1
20020163302 Nitta et al. Nov 2002 A1
20020187571 Collins, III et al. Dec 2002 A1
20030077847 Yoo Apr 2003 A1
20030102473 Chason et al. Jun 2003 A1
20030122144 Uemura et al. Jul 2003 A1
20030168664 Hahn et al. Sep 2003 A1
20030189212 Yoo Oct 2003 A1
20030189215 Lee et al. Oct 2003 A1
20030205714 Sugawara et al. Nov 2003 A1
20040016908 Hohn et al. Jan 2004 A1
20040033638 Bader Feb 2004 A1
20040051105 Tsuda et al. Mar 2004 A1
20040056254 Bader et al. Mar 2004 A1
20040084687 Hohn et al. May 2004 A1
20040259279 Erchak et al. Dec 2004 A1
20050051788 Tatsumi et al. Mar 2005 A1
20050127385 Reeh et al. Jun 2005 A1
20050161694 Reeh et al. Jul 2005 A1
20050231953 Reeh et al. Oct 2005 A1
20060027831 Kioke et al. Feb 2006 A1
20060060866 Tezen Mar 2006 A1
20060175681 Li Aug 2006 A1
20060289886 Sakai Dec 2006 A1
20070020790 Erchak et al. Jan 2007 A1
20070048885 Jeon Mar 2007 A1
20070122994 Sonobe et al. May 2007 A1
20070216281 Hohn et al. Sep 2007 A1
20080149958 Reeh et al. Jun 2008 A1
20090072264 Yoo Mar 2009 A1
20100044739 Reeh et al. Feb 2010 A1
20100176344 Hohn et al. Jul 2010 A1
Foreign Referenced Citations (82)
Number Date Country
2340968 Sep 2001 CA
2375069 Nov 2001 CA
196 25 622 Jan 1998 DE
19625622 Jan 1998 DE
196 38 667 Apr 1998 DE
19638667 Apr 1998 DE
20009283 Feb 2000 DE
297 24 284 Sep 2000 DE
29724284 Sep 2000 DE
297 24 382 Dec 2000 DE
10022879 Dec 2000 DE
29724382 Dec 2000 DE
19945007 Mar 2001 DE
10010638 Sep 2001 DE
10020464 Nov 2001 DE
10026254 Nov 2001 DE
10026255 Nov 2001 DE
297 24 543 Feb 2002 DE
29724543 Feb 2002 DE
10042947 Mar 2002 DE
10044500 Apr 2002 DE
10051465 May 2002 DE
10203809 Aug 2003 DE
0622858 Nov 1994 EP
0862794 Sep 1998 EP
0907969 Apr 1999 EP
0936682 Aug 1999 EP
1111689 Jun 2001 EP
1150361 Oct 2001 EP
1198016 Apr 2002 EP
0 862 794 Nov 2002 EP
0 907 969 May 2004 EP
1451853 Sep 2004 EP
2091980 Mar 1990 JP
9008403 Jan 1997 JP
9320984 Dec 1997 JP
10177974 Jun 1998 JP
10190065 Jul 1998 JP
10294491 Nov 1998 JP
10319877 Dec 1998 JP
11046015 Feb 1999 JP
11087770 Mar 1999 JP
11087778 Mar 1999 JP
11126923 May 1999 JP
11145519 May 1999 JP
11191641 Jul 1999 JP
2000-036626 Feb 2000 JP
2000-196197 Jul 2000 JP
3065263 Jul 2000 JP
2000-216434 Aug 2000 JP
2000-315826 Nov 2000 JP
2001-053336 Feb 2001 JP
2001-111109 Apr 2001 JP
2001-111109 Apr 2001 JP
2001-244503 Sep 2001 JP
2001-339100 Dec 2001 JP
2002-076523 Mar 2002 JP
2002-118293 Apr 2002 JP
2002-151747 May 2002 JP
2003-115614 Apr 2003 JP
10-2002-0000141 Jan 2002 KR
WO 9748138 Dec 1997 WO
WO 9750132 Dec 1997 WO
WO 9750132 Dec 1997 WO
WO 9812757 Mar 1998 WO
WO 9854930 Dec 1998 WO
WO 9905728 Feb 1999 WO
WO 0016455 Mar 2000 WO
WO 0033389 Jun 2000 WO
WO 0033390 Jun 2000 WO
WO 0108452 Feb 2001 WO
WO 0124283 Apr 2001 WO
WO 0124284 Apr 2001 WO
WO 0147038 Jun 2001 WO
WO 0150540 Jul 2001 WO
WO 0165613 Sep 2001 WO
WO 0182384 Nov 2001 WO
WO 0184640 Nov 2001 WO
WO 0191195 Nov 2001 WO
WO 0219439 Mar 2002 WO
WO 0233760 Apr 2002 WO
WO 03038874 May 2003 WO
Non-Patent Literature Citations (36)
Entry
Michael Kneissl, et al., “Continuous-Wave Operation of InGAN Multiple-Quantum-Well Laser Diodes on Copper Substrates Obtained by Laser Liftoff,” IEEE Journal on Selected Topics in Quantum Electronics, vol. 7, No. 2, Mar./Apr. 2001, pp. 188-191.
William S. Wong, et al., “Continuous-wave InGaN Multiple-Quantum-Well Laser Diodes on Copper Substrates,” Applied Physics Letters, vol. 78, No. 9, Feb. 2001, pp. 1198-1200.
William S. Wong, et al, “The Integration of InxGa1-xN Multiple-Quantum-Well Laser Diodes with Copper Substrates by Laser Lift-Off,” Jpn. J. Appl. Phys. vol. 39, Dec. 2000, pp. 1203-1205.
Authors: Mensz, P. M.; Kellawon, P.; van Rojen, R.; Kozodoy, P.; Denbaars, S.; Title: “InxGa1-xN/AlyGa1-yN Violet light emitting diodes with reflective p-contacts for high single sided light extraction”; Electronic Letters; Nov. 20, 1997; vol. 33—No. 24.
Mensz, “InxGa1-xN/AlyGa1-yN violet light emitting diodes with reflective p-contacts for high single sided light extraction”, Electronics Letters, vol. 33, No. 24, Nov. 20, 1997, pp. 2066-2068.
Michael Kneissl, et al. “Continuous-Wave Operation of InGaN Multiple-Quantum-Well Laser Diodes on Copper Substrates Obtained by Laser Liftoff”, IEEE Journal on Selected Topics in Quantum Electronics, Mar./Apr. 2001, vol. 7, No. 2, pp. 188-191.
William S. Wong, et al., “Continuous-Wave InGaN Multiple-Quantum-Well Laser Diodes on Copper Substrates”, Applied Physics Letters, Feb. 26, 2001, vol. 78, No. 9, pp. 1198-1200.
William S. Wong, et al. “The integration of In.sub.xGa.sub.1—xN Multiple-Quantum-Well Laser Diodes with Copper Substrates by Laser Lift-Off”, Jpn. J. Appl. Phys., Dec. 1, 2000, vol. 39, (2000) pp. L 1203-L 1205, Part 2, No. 12A, pp. L1203-L1205.
Wong, et al., “Integration of InGaN Laser Diodes with Dissimilar Substrates by Laser Lift-Off”, Materials Research Society, vol. 639, 2001 pp. G12.2.1-G12.2.5.
Wolf, Stanley, “Silicon Processing for the VLSI Era, vol. 2: Process Integration”, Lattice Press, California, 1990.
MK Kelly, et al. “Optical Process for Liftoff of Group III-nitride Films”, Physica Status Solidi (a) 1997 vol. 159,pp. R3-R4.
Schraud et al. “Substrateless singlemode vertical cavity surface-emitting GaAs/GaAIAs laser diode”, Electronics Letters Online, vol. 30, No. 3, Feb. 3, 1994, pp. 238-239.
Mueller-Mach et al. “White light emitting diodes for illumination”, Proceedings of SPIE, vol. 3938, Jan. 26-27, 2000, pp. 30-41.
Schlotter et al. “Fabrication and characterization of GaN/InGaN/A1GaN double heterostructure LEDs and their application in luminescence conversion LEDS”, Materials Science and Engineering B59, pp. 390-394, 1999.
Y.H. Lee et al. “Effect of an interlayer on the emission characteristics of a white-light-emitting electroluminescent device with a Pr and Ce doubly doped ZnS phosphor layer”, J. Appl. Phys., vol. 70, No. 11, Jun. 1, 1996.
Tanaka et al. Excitation Mechanism in White-Light Emitting SrS:Pr, K and SrS:CE, K, Eu Thin-film Electroluminescent Devices, Springer Proceedings in Physics, vol. 38, 1989, pp. 56-59.
Smela et al. “Planar microfabricated polymer light-emitting diodes”, Semicond. Sci. Technol., vol. 13, 1998, pp. 433-439.
Jayaraj et al. “Low voltage driven white light emitting thin film EL device”, Phys. Stat. Sol. (a), vol. 114, No. 2, Aug. 1989, pp. K233-K238.
Xiu-lai et al. “A novel blue thing film electroluminescent phosphor Gd3Ga5O12:Ag”, Chin. Phys. Lett., vol. 16, Vo. 5, 1999, pp. 387-388.
S. Nakamura and G. Fasol (editors), “The Blue Laser Diode”, Chapter 10, InGan Single-Quantum-Well LEDs, Springer-Verlag, New York., 1996.
Stolka, Dr. Milan, “Organic Light Emitting Diodes (OLEDS) for General Illumination: An OIDA Technology Roadmap”, Optoelectronics Industry Development Association, Mar. 2001.
Mueller-Mach et al. “High-power phosphor-converted light-emitting diodes based on III-Nitrides”, IEEE Journal on Selected Topics in Quantum Electronics, vol. 8, No. 2, Mar./Apr. 2002, pp. 339-345.
Zehnder et al. “Industrial production of GaN and InGaN-light emitting diodes on SiC-substrates”, Journal of Crystal Growth, vol. 230, 2001, pp. 497-502.
S. P. Denbaars, “Gallium-Nitride-based Materials for Blue to Ultra violet Optoelectronics Devices”, Proceedings of the IEEE, vol. 85, No. 11, Nov. 1997.
Shujji Nakamura, “III-V Nitride based Light-Emitting Devices”, Solid State Communications, vol. 102, No. 2-3, pp. 237-248, 1997.
Baur et al. “White Light Emitting Diodes”, Fraunhofer-Institut für Angewandte festkörperphysik, Tullastr. 72, D-79108 Freiburg, pp. 66-78.
Nakamura et al. “Room-temperature continuous-wave operation of InGaN multi-quantum-well-structure laser diodes with a long lifetime”, Appl. Phys. Lett., vol. 70, No. 7, Feb. 17, 1997, pp. 868-870.
Agilent Technologies, “Technical Data: T-1¾ (5 mm) Precision Optical Performance White LEDs”.
R.A. Hewes, “Efficient Infrared Excited Visible Luminescence in Rare Earth Systems”, 1970 International Convention Digest, IEEE, Mar. 23-26, 1970.
Burrus et al. “Small-Area, double-heterostructure aluminum-gallium arsenide electroluminescent diode sources for optical-fiber transmission lines”, Optics Communications, vol. 4, No. 4, Dec. 1971.
Stocker et al. “Optically pumped InGaN/GaN double heterostructure lasers with cleaved facets”, Electronics Letters, vol. 34, No. 4, Feb. 19, 1998, 373-375.
Steigerwald et al. “Illumination with solid state lighting technology”, IEEE Journal on Selected Topics in Quantum Electronics, vol. 8, No. 2, Mar./Apr. 2002.
Harle et al. “Advanced Technologies for high efficiency GaInN LEDs for solid state lighting”, Third international conference on solid state lighting, Proceedings of SPIE, vol. 5187, 2004.
Harle et al. “Light extraction technologies for high efficiency GaInN-LED devices”, Light-emitting diodes: Research, Manufacturing, and Application VII, Proceedings of SPIE, vol. 4996, 2003.
Dunn, Tim et al., “OSTAR—10-Watt LED Application Design”, Pre-conference seminar 2, Oct. 17, 2005.
Haerle et al. “High brightness LEDs for general lighting applications using the new ThinGaN Technology,” Phys. Stat. Sol. (A), vol. 201, No. 12, pp. 2736-2739, 2004.
Related Publications (1)
Number Date Country
20100129943 A1 May 2010 US
Divisions (1)
Number Date Country
Parent 10179010 Jun 2002 US
Child 10975095 US
Continuations (2)
Number Date Country
Parent 11978680 Oct 2007 US
Child 12591164 US
Parent 10975095 Oct 2004 US
Child 11978680 US