BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a sectional view of one embodiment of the structure of a thin film magnetic head including a tunnel-type magnetic detecting device;
FIG. 2 is a sectional view of the structure of one embodiment of a thin film magnetic head including a tunnel-type magnetic detecting device;
FIG. 3 is a partially enlarged schematic view showing one embodiment of a seed layer and an antiferromagnetic layer thereon in the tunnel-type magnetic detecting device shown in FIG. 1 in an enlarged manner, and a distribution chart showing the Al concentration of the seed layer and antiferromagnetic layer;
FIG. 4 is a partially enlarged schematic view showing one embodiment of a seed layer and an antiferromagnetic layer thereon in the tunnel-type magnetic detecting device shown in FIG. 2 in an enlarged manner, and a distribution chart showing the Al concentration and Co concentration of the seed layer and antiferromagnetic layer; and
FIG. 5 is a graph showing the relationship between the total thickness of a seed layer in each of spin-valve-type thin film devices in Examples 3 and 8 and Comparative Example, and an interlayer-coupling magnetic field (Hin) which acts between a free magnetic layer and a fixed magnetic layer.