comprising tunnel junctions

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CPC
G01R33/098

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/098comprising tunnel junctions

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Protective passivation layer for magnetic tunnel junctions
- Patent number 12,213,385
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jodi Mari Iwata
- G11 - INFORMATION STORAGE
Information Patent Grant
Iridium-manganese-based tunnel magnetoresistance sensing element wi...
- Patent number 12,210,075
- Issue date Jan 28, 2025
- Infineon Technologies AG
- Bernhard Endres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive element, magnetoresistive device and magnetic sensor
- Patent number 12,204,003
- Issue date Jan 21, 2025
- TDK Corporation
- Daichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection device
- Patent number 12,204,004
- Issue date Jan 21, 2025
- TDK Corporation
- Yoshiaki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive sensor element having a wide linear response and r...
- Patent number 12,204,005
- Issue date Jan 21, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Jeffrey Childress
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin-orbit torque MRAM structure and manufacture thereof
- Patent number 12,201,030
- Issue date Jan 14, 2025
- Applied Materials, Inc.
- Minrui Yu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device
- Patent number 12,188,996
- Issue date Jan 7, 2025
- TDK Corporation
- Norikazu Ota
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,189,002
- Issue date Jan 7, 2025
- TDK Corporation
- Toshihide Suto
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,189,003
- Issue date Jan 7, 2025
- TDK Corporation
- Hirokazu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with increased SNR
- Patent number 12,181,539
- Issue date Dec 31, 2024
- EVERSPIN TECHNOLOGIES, INC.
- Phillip G. Mather
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance bridge circuits with stray field immunity
- Patent number 12,181,538
- Issue date Dec 31, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field closed loop sensors with offset reduction
- Patent number 12,174,275
- Issue date Dec 24, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive element for a 2D magnetic sensor having a reduced...
- Patent number 12,174,276
- Issue date Dec 24, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Andrey Timopheev
- G01 - MEASURING TESTING
Information Patent Grant
Programmable magnetic tunnel junction
- Patent number 12,156,476
- Issue date Nov 26, 2024
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Ping Zheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tunnel junction device and method of forming same
- Patent number 12,154,608
- Issue date Nov 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Bo-Jhih Shen
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive random access memory and method for fabricating th...
- Patent number 12,146,927
- Issue date Nov 19, 2024
- United Microelectronics Corp.
- Hui-Lin Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field current sensor to reduce stray magnetic fields
- Patent number 12,130,342
- Issue date Oct 29, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Redundant current sensor
- Patent number 12,123,926
- Issue date Oct 22, 2024
- Infineon Technologies AG
- Sebastian Maerz
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel magnetoresistive effect element, magnetic memory, and built-...
- Patent number 12,120,890
- Issue date Oct 15, 2024
- TDK Corporation
- Zhenyao Tang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic offset and amplitude tracker
- Patent number 12,117,291
- Issue date Oct 15, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Christophe Lutz
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,105,165
- Issue date Oct 1, 2024
- TDK Corporation
- Kazuya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tunnel junction comprising an inhomogeneous granular free...
- Patent number 12,100,437
- Issue date Sep 24, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Bernard Dieny
- G11 - INFORMATION STORAGE
Information Patent Grant
XMR sensors with serial segment strip configurations
- Patent number 12,092,704
- Issue date Sep 17, 2024
- Infineon Technologies AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor for sensing a two-dimensional external magnet...
- Patent number 12,092,706
- Issue date Sep 17, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Léa Cuchet
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive effect element
- Patent number 12,096,699
- Issue date Sep 17, 2024
- TDK Corporation
- Tomoyuki Sasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for activating an analyte monitoring system
- Patent number 12,088,201
- Issue date Sep 10, 2024
- DexCom, Inc.
- Nicholas Kalfas
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor structure and fabrication method thereof
- Patent number 12,075,705
- Issue date Aug 27, 2024
- Semiconductor Manufacturing International (Shanghai) Corporation
- Wen Bin Xia
- G11 - INFORMATION STORAGE
Information Patent Grant
Digital liquid level sensor utilizing cross-point magnetoresistive...
- Patent number 12,072,226
- Issue date Aug 27, 2024
- MultiDimension Technology Co., Ltd.
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,072,399
- Issue date Aug 27, 2024
- TDK Corporation
- Kentaro Harada
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device having magnetic field converter, magnetic fi...
- Patent number 12,072,398
- Issue date Aug 27, 2024
- TDK Corporation
- Yongfu Cai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250035718
- Publication date Jan 30, 2025
- UNITED MICROELECTRONICS CORP.
- Hui-Lin Wang
- G11 - INFORMATION STORAGE
Information Patent Application
PUF-BASED MAGNETOMETER WITH SAFETY PROTECTION CIRCUIT
- Publication number 20250028012
- Publication date Jan 23, 2025
- Wenzhou University
- Pengjun WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO TERMINAL SPIN-ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMOR...
- Publication number 20250024689
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- William San-Hsi HWANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS
- Publication number 20250012876
- Publication date Jan 9, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE ELEMENT HAVING HIGH OUT-OF-PLANE SENSITIVITY
- Publication number 20250004073
- Publication date Jan 2, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Nikita Strelkov
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20240418800
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuma YAMAWAKI
- G01 - MEASURING TESTING
Information Patent Application
TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...
- Publication number 20240418805
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...
- Publication number 20240420878
- Publication date Dec 19, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh JAISWAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240418804
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20240418806
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuma Yamawaki
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR SYSTEM WITH MAGNETIC VORTEX USED FOR B-FIELD...
- Publication number 20240418803
- Publication date Dec 19, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240402268
- Publication date Dec 5, 2024
- TDK Corporation
- Takafumi KOBAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR ACTIVATING AN ANALYTE MONITORING SYSTEM
- Publication number 20240396453
- Publication date Nov 28, 2024
- Dexcom, Inc.
- Nicholas KALFAS
- G01 - MEASURING TESTING
Information Patent Application
MAGNETISM DETECTION DEVICE
- Publication number 20240385264
- Publication date Nov 21, 2024
- Sony Semiconductor Solutions Corporation
- HIROYUKI OHMORI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FORMING A PERPENDICULAR SPIN TORQUE OSCILLATOR (PSTO) IN...
- Publication number 20240381780
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huanlong Liu
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240377484
- Publication date Nov 14, 2024
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS
- Publication number 20240369651
- Publication date Nov 7, 2024
- TDK Corporation
- Keisuke TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS
- Publication number 20240365676
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- YA-LING LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SPIN CURRENT MAGNETIZATION ROTATIONAL ELEMENT, SPIN CURRENT MAGNETI...
- Publication number 20240365684
- Publication date Oct 31, 2024
- TDK Corporation
- Tomoyuki SASAKI
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETORESISTIVE ELEMENT HAVING COMPENSATED TEMPERATURE COEFFICIENT...
- Publication number 20240345182
- Publication date Oct 17, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Andrey Timopheev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20240341102
- Publication date Oct 10, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- ALEXANDER KALNITSKY
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL PROCESSING CIRCUIT FOR TUNNELING MAGNETORESISTANCE SENSOR
- Publication number 20240337707
- Publication date Oct 10, 2024
- Wenzhou University
- Pengjun WANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240339255
- Publication date Oct 10, 2024
- TDK Corporation
- Kazuumi INUBUSHI
- G11 - INFORMATION STORAGE
Information Patent Application
OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20240329165
- Publication date Oct 3, 2024
- TDK Corporation
- Takekazu YAMANE
- G01 - MEASURING TESTING
Information Patent Application
CAMERA DEVICE AND OPTICAL INSTRUMENT
- Publication number 20240334057
- Publication date Oct 3, 2024
- LG Innotek Co., Ltd.
- Sang Ok Park
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MAGNETORESISTIVE SENSOR HAVING A SHIELDING ELEMENT WITH VORTEX MAGN...
- Publication number 20240310461
- Publication date Sep 19, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
Method for Manufacturing MRAM
- Publication number 20240315140
- Publication date Sep 19, 2024
- ZHEJIANG HIKSTOR TECHNOLOGY CO., LTD.
- Ze Jie ZHENG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20240315050
- Publication date Sep 19, 2024
- UNITED MICROELECTRONICS CORP.
- Hui-Lin Wang
- G01 - MEASURING TESTING
Information Patent Application
IRIDIUM-MANGANESE-BASED TUNNEL MAGNETORESISTANCE SENSING ELEMENT WI...
- Publication number 20240302459
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE ELEMENT, MAGNETIC SENSOR, AND MAGNETIC MEMORY
- Publication number 20240298548
- Publication date Sep 5, 2024
- Sony Semiconductor Solutions Corporation
- YUTAKA HIGO
- G01 - MEASURING TESTING

comprising tunnel junctions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Protective passivation layer for magnetic tunnel junctions

Iridium-manganese-based tunnel magnetoresistance sensing element wi...

Magnetoresistive element, magnetoresistive device and magnetic sensor

Magnetic field detection device

Magnetoresistive sensor element having a wide linear response and r...

Spin-orbit torque MRAM structure and manufacture thereof

Magnetic sensor device

Magnetic sensor

Magnetic sensor

Magnetic field sensor with increased SNR

Magnetoresistance bridge circuits with stray field immunity

Magnetic field closed loop sensors with offset reduction

Magnetoresistive element for a 2D magnetic sensor having a reduced...

Programmable magnetic tunnel junction

Magnetic tunnel junction device and method of forming same

Magnetoresistive random access memory and method for fabricating th...

Magnetic field current sensor to reduce stray magnetic fields

Redundant current sensor

Tunnel magnetoresistive effect element, magnetic memory, and built-...

Dynamic offset and amplitude tracker

Magnetic sensor

Magnetic tunnel junction comprising an inhomogeneous granular free...

XMR sensors with serial segment strip configurations

Magnetic field sensor for sensing a two-dimensional external magnet...

Magnetoresistive effect element

System and method for activating an analyte monitoring system

Semiconductor structure and fabrication method thereof

Digital liquid level sensor utilizing cross-point magnetoresistive...

Magnetic sensor

Magnetic sensor device having magnetic field converter, magnetic fi...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

PUF-BASED MAGNETOMETER WITH SAFETY PROTECTION CIRCUIT

TWO TERMINAL SPIN-ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMOR...

MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS

MAGNETORESISTIVE ELEMENT HAVING HIGH OUT-OF-PLANE SENSITIVITY

MAGNETIC SENSOR DEVICE

TUNNEL MAGNETORESISTANCE ELEMENT TO DETECT OUT-OF-PLANE CHANGES IN...

MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX L...

MAGNETIC SENSOR

MAGNETIC SENSOR DEVICE

MAGNETIC FIELD SENSOR SYSTEM WITH MAGNETIC VORTEX USED FOR B-FIELD...

MAGNETIC SENSOR

SYSTEM AND METHOD FOR ACTIVATING AN ANALYTE MONITORING SYSTEM

MAGNETISM DETECTION DEVICE

METHOD FOR FORMING A PERPENDICULAR SPIN TORQUE OSCILLATOR (PSTO) IN...

MAGNETIC SENSOR

MAGNETIC FIELD DETECTION APPARATUS

MAGNETIC TUNNEL JUNCTION (MTJ) ELEMENT AND ITS FABRICATION PROCESS

SPIN CURRENT MAGNETIZATION ROTATIONAL ELEMENT, SPIN CURRENT MAGNETI...

MAGNETORESISTIVE ELEMENT HAVING COMPENSATED TEMPERATURE COEFFICIENT...

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

SIGNAL PROCESSING CIRCUIT FOR TUNNELING MAGNETORESISTANCE SENSOR

MAGNETORESISTANCE EFFECT ELEMENT

OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD

CAMERA DEVICE AND OPTICAL INSTRUMENT

MAGNETORESISTIVE SENSOR HAVING A SHIELDING ELEMENT WITH VORTEX MAGN...

Method for Manufacturing MRAM

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

IRIDIUM-MANGANESE-BASED TUNNEL MAGNETORESISTANCE SENSING ELEMENT WI...

MAGNETORESISTIVE ELEMENT, MAGNETIC SENSOR, AND MAGNETIC MEMORY