comprising tunnel junctions

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CPC
G01R33/098

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/098comprising tunnel junctions

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic system for counting rotations having increased stability a...
- Patent number 12,326,482
- Issue date Jun 10, 2025
- Horst Siedle GmbH & Co. KG
- G01 - MEASURING TESTING
Information Patent Grant
PUF-based magnetometer with safety protection circuit
- Patent number 12,326,489
- Issue date Jun 10, 2025
- Wenzhou University
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic multi-turn sensor structures and fabrication
- Patent number 12,326,483
- Issue date Jun 10, 2025
- Analog Devices International Unlimited Company
- G01 - MEASURING TESTING
Information Patent Grant
Linear tunnel magnetoresistive sensor including an integrated back-...
- Patent number 12,326,351
- Issue date Jun 10, 2025
- Infineon Technologies AG
- G01 - MEASURING TESTING
Information Patent Grant
Controlling out-of-plane anisotropy in an MR sensor with free layer...
- Patent number 12,320,870
- Issue date Jun 3, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Samridh Jaiswal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive element for sensing a magnetic field in a Z-axis
- Patent number 12,320,873
- Issue date Jun 3, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Jeffrey Childress
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor and magnetic sensor system
- Patent number 12,320,872
- Issue date Jun 3, 2025
- TDK Corporation
- Shunji Saruki
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive sensor element having compensated temperature coef...
- Patent number 12,313,707
- Issue date May 27, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Léa Cuchet
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor with an elongated element
- Patent number 12,306,023
- Issue date May 20, 2025
- TDK Corporation
- Keisuke Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive random access memory and method for fabricating th...
- Patent number 12,306,274
- Issue date May 20, 2025
- United Microelectronics Corp.
- Hui-Lin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic tunneling junction device and memory device including the...
- Patent number 12,310,250
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Kwangseok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Fabricating an electroconductive contact on a top surface of a tunn...
- Patent number 12,310,246
- Issue date May 20, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Sundar Chetlur
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor system with magnetic vortex used for b-field...
- Patent number 12,298,361
- Issue date May 13, 2025
- Infineon Technologies AG
- Bernhard Endres
- G01 - MEASURING TESTING
Information Patent Grant
Methods for tunnel magnetoresistance multi-turn sensor manufacture...
- Patent number 12,298,365
- Issue date May 13, 2025
- Analog Devices International Unlimited Company
- Onur Necdet Urs
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor having magnetoresistive effect element with incline...
- Patent number 12,298,363
- Issue date May 13, 2025
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an external magnetic field by at least one mag...
- Patent number 12,292,486
- Issue date May 6, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Ricardo Sousa
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance effect element, magnetic recording element, and h...
- Patent number 12,288,576
- Issue date Apr 29, 2025
- TDK Corporation
- Shinto Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive sensor element for sensing a two-dimensional magne...
- Patent number 12,287,381
- Issue date Apr 29, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Clarisse Ducruet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photodetection element and receiver
- Patent number 12,272,476
- Issue date Apr 8, 2025
- TDK Corporation
- Tomohito Mizuno
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnet structure for back-biased sensors
- Patent number 12,270,869
- Issue date Apr 8, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Electromechanical modulation magnetoresistive rotary magnetic field...
- Patent number 12,270,871
- Issue date Apr 8, 2025
- MultiDimension Technology Co., Ltd.
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive stack without radiated field, sensor and magnetic...
- Patent number 12,274,177
- Issue date Apr 8, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Claude Fermon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibrating magnetoresistance-based magnetic field sensors
- Patent number 12,253,576
- Issue date Mar 18, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Interleaving sub-arrays of magnetoresistance elements based on refe...
- Patent number 12,248,039
- Issue date Mar 11, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor including magnetic detection element disposed on in...
- Patent number 12,248,040
- Issue date Mar 11, 2025
- TDK Corporation
- Hidekazu Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor including magnetic detection element including bott...
- Patent number 12,235,333
- Issue date Feb 25, 2025
- TDK Corporation
- Hidekazu Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor element and device having improved accuracy under h...
- Patent number 12,228,620
- Issue date Feb 18, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Andrey Timopheev
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device
- Patent number 12,228,621
- Issue date Feb 18, 2025
- TDK Corporation
- Kenkichi Anagawa
- G01 - MEASURING TESTING
Information Patent Grant
Iridium-manganese-based tunnel magnetoresistance sensing element wi...
- Patent number 12,210,075
- Issue date Jan 28, 2025
- Infineon Technologies AG
- Bernhard Endres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protective passivation layer for magnetic tunnel junctions
- Patent number 12,213,385
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jodi Mari Iwata
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SENSOR WITH COMMON MODE REJECTION AND OFFSET CORRECTION
- Publication number 20250180671
- Publication date Jun 5, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
LOW RESIDUAL OFFSET SENSOR
- Publication number 20250180677
- Publication date Jun 5, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS
- Publication number 20250180670
- Publication date Jun 5, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250185256
- Publication date Jun 5, 2025
- United Microelectronics Corp.
- Yan-Jun XU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250180678
- Publication date Jun 5, 2025
- TDK Corporation
- Hidekazu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR FOR PRINTED CIRCUIT BOARD
- Publication number 20250172641
- Publication date May 29, 2025
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Yongshun SUN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROTECTIVE PASSIVATION LAYER FOR MAGNETIC TUNNEL JUNCTIONS
- Publication number 20250169372
- Publication date May 22, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jodi Mari Iwata
- G11 - INFORMATION STORAGE
Information Patent Application
TMR SENSOR HAVING TUNED VORTEX RESPONSE
- Publication number 20250164585
- Publication date May 22, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR AND MAGNETIC MEASUREMENT METHOD
- Publication number 20250164583
- Publication date May 22, 2025
- ALPS ALPINE CO., LTD.
- Eiji UMETSU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250155531
- Publication date May 15, 2025
- TDK Corporation
- Hidekazu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
PAD OVER ACTIVE SENSOR CELLS INTEGRATED IN A CHIP PACKAGE
- Publication number 20250160219
- Publication date May 15, 2025
- INFINEON TECHNOLOGIES AG
- Walter HARTNER
- G01 - MEASURING TESTING
Information Patent Application
POWER TOOL INCLUDING A TRIGGER WITH A NON-CONTACT SENSOR
- Publication number 20250150078
- Publication date May 8, 2025
- Milwaukee Electric Tool Corporation
- Mitchell A. Ellena
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
MAGNETORESISTIVE SENSOR
- Publication number 20250147129
- Publication date May 8, 2025
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
TMR SENSOR HAVING MAGNETIC FIELD GENERATION FOR PILLAR STIMULATION
- Publication number 20250147128
- Publication date May 8, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Tyler Daigle
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICES HAVING SEMICONDUCTOR SUBSTRATE TRENCHES, AND ASSOCIA...
- Publication number 20250130294
- Publication date Apr 24, 2025
- INFINEON TECHNOLOGIES AG
- Horst Theuss
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250107102
- Publication date Mar 27, 2025
- Samsung Electronics Co., Ltd.
- Junhoe KIM
- G01 - MEASURING TESTING
Information Patent Application
Sensing Arrangements for Camera Modules
- Publication number 20250102367
- Publication date Mar 27, 2025
- Apple Inc.
- Himesh Patel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250093434
- Publication date Mar 20, 2025
- TDK Corporation
- Hirokazu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR CIRCUIT AND MAGNETIC FIELD MEASUREMENT METHOD
- Publication number 20250085361
- Publication date Mar 13, 2025
- INFINEON TECHNOLOGIES AG
- Christoph KRALL
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250085364
- Publication date Mar 13, 2025
- TDK Corporation
- Toshihide SUTO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20250085362
- Publication date Mar 13, 2025
- TDK Corporation
- Norikazu OTA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE ELEMENT HAVING THERMALLY ROBUST PERFORMANCES AFTER...
- Publication number 20250085365
- Publication date Mar 13, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Salim DOUNIA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...
- Publication number 20250076419
- Publication date Mar 6, 2025
- INFINEON TECHNOLOGIES AG
- Dieter SUESS
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETORESISTANCE SIGNAL PATH COMPENSATION
- Publication number 20250076421
- Publication date Mar 6, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Tyler Daigle
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE SENSORS AND ASSOCIATED PRODUCTION METHOD
- Publication number 20250060429
- Publication date Feb 20, 2025
- INFINEON TECHNOLOGIES AG
- Manuel GILLINGER
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVING SUB-ARRAYS OF MAGNETORESISTANCE ELEMENTS BASED ON REFE...
- Publication number 20250052838
- Publication date Feb 13, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Paolo Campiglio
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250035718
- Publication date Jan 30, 2025
- UNITED MICROELECTRONICS CORP.
- Hui-Lin Wang
- G11 - INFORMATION STORAGE
Information Patent Application
PUF-BASED MAGNETOMETER WITH SAFETY PROTECTION CIRCUIT
- Publication number 20250028012
- Publication date Jan 23, 2025
- Wenzhou University
- Pengjun WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO TERMINAL SPIN-ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMOR...
- Publication number 20250024689
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- William San-Hsi HWANG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS
- Publication number 20250012876
- Publication date Jan 9, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING

comprising tunnel junctions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Magnetic system for counting rotations having increased stability a...

PUF-based magnetometer with safety protection circuit

Magnetic multi-turn sensor structures and fabrication

Linear tunnel magnetoresistive sensor including an integrated back-...

Controlling out-of-plane anisotropy in an MR sensor with free layer...

Magnetoresistive element for sensing a magnetic field in a Z-axis

Magnetic sensor and magnetic sensor system

Magnetoresistive sensor element having compensated temperature coef...

Magnetic sensor with an elongated element

Magnetoresistive random access memory and method for fabricating th...

Magnetic tunneling junction device and memory device including the...

Fabricating an electroconductive contact on a top surface of a tunn...

Magnetic field sensor system with magnetic vortex used for b-field...

Methods for tunnel magnetoresistance multi-turn sensor manufacture...

Magnetic sensor having magnetoresistive effect element with incline...

Method for measuring an external magnetic field by at least one mag...

Magnetoresistance effect element, magnetic recording element, and h...

Magnetoresistive sensor element for sensing a two-dimensional magne...

Photodetection element and receiver

Magnet structure for back-biased sensors

Electromechanical modulation magnetoresistive rotary magnetic field...

Magnetoresistive stack without radiated field, sensor and magnetic...

Self-calibrating magnetoresistance-based magnetic field sensors

Interleaving sub-arrays of magnetoresistance elements based on refe...

Magnetic sensor including magnetic detection element disposed on in...

Magnetic sensor including magnetic detection element including bott...

Magnetic sensor element and device having improved accuracy under h...

Magnetic sensor device

Iridium-manganese-based tunnel magnetoresistance sensing element wi...

Protective passivation layer for magnetic tunnel junctions

Patents Applicationslast 30 patents

SENSOR WITH COMMON MODE REJECTION AND OFFSET CORRECTION

LOW RESIDUAL OFFSET SENSOR

SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS

MAGNETIC MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME

MAGNETIC SENSOR

CURRENT SENSOR FOR PRINTED CIRCUIT BOARD

PROTECTIVE PASSIVATION LAYER FOR MAGNETIC TUNNEL JUNCTIONS

TMR SENSOR HAVING TUNED VORTEX RESPONSE

MAGNETIC SENSOR AND MAGNETIC MEASUREMENT METHOD

MAGNETIC SENSOR

PAD OVER ACTIVE SENSOR CELLS INTEGRATED IN A CHIP PACKAGE

POWER TOOL INCLUDING A TRIGGER WITH A NON-CONTACT SENSOR

MAGNETORESISTIVE SENSOR

TMR SENSOR HAVING MAGNETIC FIELD GENERATION FOR PILLAR STIMULATION

SENSOR DEVICES HAVING SEMICONDUCTOR SUBSTRATE TRENCHES, AND ASSOCIA...

SEMICONDUCTOR DEVICE

Sensing Arrangements for Camera Modules

MAGNETIC SENSOR

MAGNETIC FIELD SENSOR CIRCUIT AND MAGNETIC FIELD MEASUREMENT METHOD

MAGNETIC SENSOR

MAGNETIC SENSOR DEVICE

MAGNETORESISTIVE ELEMENT HAVING THERMALLY ROBUST PERFORMANCES AFTER...

DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...

MAGNETORESISTANCE SIGNAL PATH COMPENSATION

MAGNETORESISTIVE SENSORS AND ASSOCIATED PRODUCTION METHOD

INTERLEAVING SUB-ARRAYS OF MAGNETORESISTANCE ELEMENTS BASED ON REFE...

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

PUF-BASED MAGNETOMETER WITH SAFETY PROTECTION CIRCUIT

TWO TERMINAL SPIN-ORBIT TORQUE MAGNETORESISTIVE RANDOM ACCESS MEMOR...

MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS