Number | Date | Country | Kind |
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5297333 | Kusaka | Mar 1994 | A |
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5783870 | Mostafazadeh et al. | Jul 1998 | A |
5791243 | Marcoux et al. | Aug 1998 | A |
6099681 | Arikado et al. | Aug 2000 | A |
6537400 | Fogal et al. | Mar 2003 | B1 |
6576495 | Jiang et al. | Jun 2003 | B1 |
6581282 | Mori et al. | Jun 2003 | B2 |
20040035306 | Onishi et al. | Feb 2004 | A1 |
Number | Date | Country |
---|---|---|
62 056145 | Mar 1987 | JP |
06 238869 | Aug 1994 | JP |
08 187836 | Jul 1996 | JP |
11 198348 | Jul 1999 | JP |
2001-267728 | Sep 2001 | JP |
2001-339196 | Dec 2001 | JP |
WO 0005936 | Feb 2000 | WO |
Entry |
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IBM Technical Disclosure Bulletin, IBM Corp. New York, “Known Good Dye Test and Direct Chip Attach Assembly”, Jul. 1, 1996, pp. 215, 217, vol. 39 No. 07. |