CHARLES EVANS & ASSOCIATES, INC.

Organization

REDWOOD CITY, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Analytical depth monitor utilizing differential interferometric ana...
- Patent number 5,872,629
- Issue date Feb 16, 1999
- Charles Evans & Associates
- Carl Colvard
- G01 - MEASURING TESTING
Information Patent Grant
Imaging radionuclide analysis apparatus and method
- Patent number 5,241,569
- Issue date Aug 31, 1993
- Charles Evans & Associates
- Ronald H. Fleming
- G01 - MEASURING TESTING
Information Patent Grant
Plasma etching method and apparatus
- Patent number 5,167,748
- Issue date Dec 1, 1992
- Charles Evans & Associates
- Bernard J. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle analyzer apparatus and method
- Patent number 5,128,543
- Issue date Jul 7, 1992
- Charles Evans & Associates
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position sensitive detector and method using successive interdigita...
- Patent number 5,103,083
- Issue date Apr 7, 1992
- Charles Evans & Associates
- David A. Reed
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
78102537 - EAGLABS
- Serial number 78102537
- Registration number 2833050
- Filing date Jan 14, 2002
- Charles Evans & Associates, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
78102506 - REPLOT-PXT
- Serial number 78102506
- Registration number 2639841
- Filing date Jan 14, 2002
- Charles Evans & Associates, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78102532 - EAG
- Serial number 78102532
- Filing date Jan 14, 2002
- Charles Evans & Associates, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
78102526 - EVANS ANALYTICAL GROUP
- Serial number 78102526
- Registration number 2717578
- Filing date Jan 14, 2002
- Charles Evans & Associates, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
78102500 - CONTROL-PXT
- Serial number 78102500
- Registration number 2621587
- Filing date Jan 14, 2002
- Charles Evans & Associates, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75810309 - EVANS ON-SITE
- Serial number 75810309
- Registration number 2836750
- Filing date Oct 20, 1999
- Charles Evans & Associates
- 35 - Advertising
Information Trademark
75256524 - CEA
- Serial number 75256524
- Registration number 2135922
- Filing date Mar 13, 1997
- Charles Evans & Associates
- 41 - Education
Information Trademark
75256550 - CEA
- Serial number 75256550
- Registration number 2261902
- Filing date Mar 13, 1997
- Charles Evans & Associates
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
74553458 - CHARLES EVANS & ASSOCIATES
- Serial number 74553458
- Registration number 1922670
- Filing date Jul 25, 1994
- Charles Evans & Associates
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
73658268 - CHARLES EVANS & ASSOCIATES
- Serial number 73658268
- Registration number 1487435
- Filing date May 1, 1987
- CHARLES EVANS & ASSOCIATES, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NSF Awardslast 12 months

processing...

Count: 26

NSF Awards

Information NSF Award
SBIR Phase I: Positron Auger Spectroscopy for Advanced Materials An...
- Award Id 9861318
- Effective date Jan 1, 1999
Information NSF Award
SBIR Phase I: The Infinite Velocity Method for Elemental Quantifica...
- Award Id 9760853
- Effective date Jan 1, 1998
Information NSF Award
STTR Phase II: High Sensitivity Materials Analysis
- Award Id 9705609
- Effective date Aug 1, 1997
Information NSF Award
SBIR Phase II: Real Time Sputter Depth Measurement for In Situ Surf...
- Award Id 9627857
- Effective date Jun 1, 1997
Information NSF Award
STTR: High Sensitivity Materials Analysis
- Award Id 9523182
- Effective date Sep 1, 1995
Information NSF Award
Real Time Sputter Depth Measurement for In Situ Surface Microanalysis
- Award Id 9461166
- Effective date Jan 1, 1995
Information NSF Award
Creation of an Ultra-Fast Charge Division Imaging Detector
- Award Id 9405098
- Effective date Sep 1, 1994
Information NSF Award
Computer-Aided Instruction of Surface Analysis Techniques
- Award Id 9307159
- Effective date Sep 15, 1993
Information NSF Award
Applications of High Performance Matrix- Assisted Laser Desorption...
- Award Id 9310326
- Effective date Sep 1, 1993
Information NSF Award
Tenfold Speed Accelerator for Resistive Anode Imaging and Optical A...
- Award Id 9260270
- Effective date Jan 1, 1993
Information NSF Award
Computer-aided Instruction of Surface Analysis Techniques
- Award Id 9161301
- Effective date Feb 1, 1992
Information NSF Award
Isotope Ratio and Trace Elemental Imaging of Minerals by Secondary...
- Award Id 9160939
- Effective date Jan 15, 1992
Information NSF Award
Feasability of High Mass Resolution Matrix-Assisted Desorption Mass...
- Award Id 9160545
- Effective date Jan 1, 1992
Information NSF Award
Imaging Neutron Activation Analysis
- Award Id 9101588
- Effective date Sep 1, 1991
Information NSF Award
Imaging Neutron Activation Analysis
- Award Id 8961065
- Effective date Jan 1, 1990
Information NSF Award
Evaluation of Polymer Degradation Using Chemiluminescence Imaging
- Award Id 8806430
- Effective date Apr 1, 1989
Information NSF Award
Secondary Ion Mass Spectrometer (SIMS) Analysis of Defects in Semic...
- Award Id 8860839
- Effective date Jan 1, 1989
Information NSF Award
Laser Microprobe Organic Microanalysis Feasibility Study
- Award Id 8760431
- Effective date Jan 1, 1988
Information NSF Award
Development of Quantitative Laser Ionization Mass Spectrometry (LIMS)
- Award Id 8700019
- Effective date Aug 1, 1987
Information NSF Award
Evaluation of Polymer Degradation Using Chemiluminescence Imaging (...
- Award Id 8660531
- Effective date Feb 1, 1987
Information NSF Award
Fundamental Study of Quantitation in Laser Ionization Mass Spectrom...
- Award Id 8560203
- Effective date Feb 15, 1986
Information NSF Award
Surface Microanalysis of Ion Implanted Steels (Materials Research)
- Award Id 8420899
- Effective date Feb 15, 1985
Information NSF Award
Surface Microanalysis of Ion-Implanted Steels (Materials Research)
- Award Id 8360256
- Effective date Feb 1, 1984
Information NSF Award
An Advanced Detection System For Quantitative Ion Microscopy
- Award Id 8212981
- Effective date May 1, 1983
Information NSF Award
An Evaluation of Selected Materials Processing Applications For Con...
- Award Id 8260631
- Effective date Oct 15, 1982
Information NSF Award
An Advanced Detection System For Quantitative Three-Dimensional Ion...
- Award Id 8113779
- Effective date Oct 1, 1981

NIH Research Projectlast 12 months

processing...

Count: 12

Research Projects

Information Research Project
MATRIX ENHANCED SIMS STUDIES OF BIOMOLECULES
- Application id 2287065
- Award notice date Sep 30, 1997
Information Research Project
IMAGING MS/MS OF BIOLOGICAL COMPOUNDS BY TOF SIMS
- Application id 2284501
- Award notice date Jun 3, 1994
Information Research Project
ISOTOPE-RATIO ION IMAGING OF HARD BIOLOGICAL TISSUES
- Application id 3498798
- Award notice date Jun 9, 1993
Information Research Project
POLYATOMIC PRIMARY BEAM FOR SIMS
- Application id 3505405
- Award notice date Sep 25, 1992
Information Research Project
MASS SPECTROMETRIC SURFACE ANALYSIS OF MEMBRANES
- Application id 3498797
- Award notice date Apr 10, 1992
Information Research Project
DEVELOPMENT OF MOLECULAR SIMS IMAGING FOR BIOMOLECULES
- Application id 2179633
- Award notice date Aug 20, 1991
Information Research Project
QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRO-SAMPLES
- Application id 2179018
- Award notice date Jul 25, 1990
Information Research Project
DEVELOPMENT OF MOLECULAR SIMS IMAGING FOR BIOMOLECULES
- Application id 3507898
- Award notice date Jul 6, 1990
Information Research Project
QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRO-SAMPLES
- Application id 3507872
- Award notice date Jul 17, 1989
Information Research Project
SIMS ORGANIC MICROPROBE FEASIBILITY EVALUATION
- Application id 3497981
- Award notice date Jul 8, 1987
Information Research Project
DEVELOPMENT OF THE BIOLOGICAL LASER MICROPROBE TECHNIQUE
- Application id 3507743
Information Research Project
QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICROSAMPLES
- Application id 3497865

CHARLES EVANS & ASSOCIATES, INC.

Organization

Patents Grantslast 30 patents

Analytical depth monitor utilizing differential interferometric ana...

Imaging radionuclide analysis apparatus and method

Plasma etching method and apparatus

Particle analyzer apparatus and method

Position sensitive detector and method using successive interdigita...

Trademarklast 30 trademarks

78102537 - EAGLABS

78102506 - REPLOT-PXT

78102532 - EAG

78102526 - EVANS ANALYTICAL GROUP

78102500 - CONTROL-PXT

75810309 - EVANS ON-SITE

75256524 - CEA

75256550 - CEA

74553458 - CHARLES EVANS & ASSOCIATES

73658268 - CHARLES EVANS & ASSOCIATES

NSF Awardslast 12 months

NSF Awards

SBIR Phase I: Positron Auger Spectroscopy for Advanced Materials An...

SBIR Phase I: The Infinite Velocity Method for Elemental Quantifica...

STTR Phase II: High Sensitivity Materials Analysis

SBIR Phase II: Real Time Sputter Depth Measurement for In Situ Surf...

STTR: High Sensitivity Materials Analysis

Real Time Sputter Depth Measurement for In Situ Surface Microanalysis

Creation of an Ultra-Fast Charge Division Imaging Detector

Computer-Aided Instruction of Surface Analysis Techniques

Applications of High Performance Matrix- Assisted Laser Desorption...

Tenfold Speed Accelerator for Resistive Anode Imaging and Optical A...

Computer-aided Instruction of Surface Analysis Techniques

Isotope Ratio and Trace Elemental Imaging of Minerals by Secondary...

Feasability of High Mass Resolution Matrix-Assisted Desorption Mass...

Imaging Neutron Activation Analysis

Imaging Neutron Activation Analysis

Evaluation of Polymer Degradation Using Chemiluminescence Imaging

Secondary Ion Mass Spectrometer (SIMS) Analysis of Defects in Semic...

Laser Microprobe Organic Microanalysis Feasibility Study

Development of Quantitative Laser Ionization Mass Spectrometry (LIMS)

Evaluation of Polymer Degradation Using Chemiluminescence Imaging (...

Fundamental Study of Quantitation in Laser Ionization Mass Spectrom...

Surface Microanalysis of Ion Implanted Steels (Materials Research)

Surface Microanalysis of Ion-Implanted Steels (Materials Research)

An Advanced Detection System For Quantitative Ion Microscopy

An Evaluation of Selected Materials Processing Applications For Con...

An Advanced Detection System For Quantitative Three-Dimensional Ion...

NIH Research Projectlast 12 months

Research Projects

MATRIX ENHANCED SIMS STUDIES OF BIOMOLECULES

IMAGING MS/MS OF BIOLOGICAL COMPOUNDS BY TOF SIMS

ISOTOPE-RATIO ION IMAGING OF HARD BIOLOGICAL TISSUES

POLYATOMIC PRIMARY BEAM FOR SIMS

MASS SPECTROMETRIC SURFACE ANALYSIS OF MEMBRANES

DEVELOPMENT OF MOLECULAR SIMS IMAGING FOR BIOMOLECULES

QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRO-SAMPLES

DEVELOPMENT OF MOLECULAR SIMS IMAGING FOR BIOMOLECULES

QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRO-SAMPLES

SIMS ORGANIC MICROPROBE FEASIBILITY EVALUATION

DEVELOPMENT OF THE BIOLOGICAL LASER MICROPROBE TECHNIQUE

QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICROSAMPLES