HITACHI HIGH-TECH CORPO RATION

Organization

MINATO-KU, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Analysis apparatus having a plurality of liquid chromatographs and...
- Patent number 11,982,655
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Electrolyte analyzing device
- Patent number 11,982,681
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Takushi Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,982,631
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Medical material transport system
- Patent number 11,983,659
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Hikaru Takizawa
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Far-infrared spectroscopy device and far-infrared spectroscopy method
- Patent number 11,977,026
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Mizuki Mohara
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape detection device and detection method
- Patent number 11,977,035
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenichiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer, automatic analysis system, and automatic sample...
- Patent number 11,977,050
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Masashi Fukaya
- G01 - MEASURING TESTING
Information Patent Grant
Electron gun and charged particle beam device equipped with electro...
- Patent number 11,978,609
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Kaneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus
- Patent number 11,978,612
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Isao Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,977,099
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomohisa Ohtaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bubble detection in an automated analysis device
- Patent number 11,971,427
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Akinao Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 11,971,424
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuichi Hirabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,971,425
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Machine learning device, image diagnosis support device, machine le...
- Patent number 11,972,560
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideharu Hattori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Biological sample detection device
- Patent number 11,971,346
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayu Sao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analysis device, and method for conveying sample
- Patent number 11,971,423
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoto Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,971,426
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Rei Konishi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analysis device
- Patent number 11,965,902
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Kei Shioya
- G01 - MEASURING TESTING
Information Patent Grant
Reaction vessel for automatic analyzer
- Patent number 11,965,820
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuya Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 11,967,482
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,961,699
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and operation method therefor
- Patent number 11,961,701
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoharu Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vacuum processing method
- Patent number 11,961,719
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Nozomu Yoshioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis apparatus provided with a plurality of chromatographic app...
- Patent number 11,959,895
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and analysis method
- Patent number 11,959,914
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tatsuki Takakura
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam system
- Patent number 11,961,704
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoki Akimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode structure
- Patent number 11,953,461
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Ukyo Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic analysis device
- Patent number 11,953,508
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Sunao Funakoshi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Ion detector
- Patent number 11,955,327
- Issue date Apr 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic chuck and processing apparatus
- Patent number 11,955,360
- Issue date Apr 9, 2024
- Tocalo Co., Ltd.
- Takeshi Takabatake
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20240142484
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Rei SATO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND SAMPLE ASPIRATION METHOD IN AUTOMATIC ANALYZER
- Publication number 20240142487
- Publication date May 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Yoshihiro KABE
- G01 - MEASURING TESTING
Information Patent Application
Training Method for Learning Apparatus, and Image Generation System
- Publication number 20240144560
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Zhaohui CHENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240142477
- Publication date May 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhisa Oguro
- G01 - MEASURING TESTING
Information Patent Application
Connection Device and Automated System for Inspecting Specimen
- Publication number 20240142479
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Shigeki YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Body-To-Be-Conveyed, Container Carrier, and Conveying Device
- Publication number 20240140735
- Publication date May 2, 2024
- Hitachi High-Tech Corporation
- Ryosuke HOSHI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Pressure Sensor Module and Dispensing Device
- Publication number 20240133757
- Publication date Apr 25, 2024
- Hitachi High-Tech Corporation
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240134175
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240133824
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR COLLECTING BACTERIA
- Publication number 20240133774
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyotaka SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD OF BASE SEQUENCE AND GENE ANALYZER
- Publication number 20240132951
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Toru YOKOYAMA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
ELECTROLYTE MEASUREMENT DEVICE AND METHOD FOR DETERMINING ABNORMALI...
- Publication number 20240125735
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Miki FURUYA
- G01 - MEASURING TESTING
Information Patent Application
Defect Classification Device and Defect Classification Program
- Publication number 20240127421
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Yohei MINEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...
- Publication number 20240128047
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Masahiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID COLUMN SEPARATION DEVICE, SYSTEM, AND METHOD
- Publication number 20240123405
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Ruochi HSU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
- Publication number 20240127417
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takehiro HIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM AND SAMPLE DISTRIBUTION METHOD
- Publication number 20240125810
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Ayako WATAHIKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240125812
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenshiro SAKATA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20240128049
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Katsura TAKAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM
- Publication number 20240119698
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuki KAKISHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Control Method for Automatic Analyzer
- Publication number 20240118251
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Microscope and Stage
- Publication number 20240120169
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Kazuki ISHIZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CENTRIFUGAL FILTRATION CARTRIDGE AND MICROBIAL TEST METHOD
- Publication number 20240117406
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Shunsuke KAWABE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER
- Publication number 20240118298
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Hitomi NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Device
- Publication number 20240118223
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Katsuhiko KIMURA
- G01 - MEASURING TESTING
Information Patent Application
FUEL BATTERY CELL AND MANUFACTURING METHOD THEREFOR
- Publication number 20240120520
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yoshitaka SASAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device
- Publication number 20240120174
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE DIAGNOSIS SUPPORT DEVICE, IMAGE DIAGNOSIS SUPPORT METHOD, REM...
- Publication number 20240119588
- Publication date Apr 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideharu HATTORI
- G06 - COMPUTING CALCULATING COUNTING

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Trademarklast 30 trademarks

Information Trademark
98422632 - NSTREAM
- Serial number 98422632
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98422625 - NANOSLYNX
- Serial number 98422625
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98148348 - HUMAN CHROMOSOME EXPLORER
- Serial number 98148348
- Filing date Aug 24, 2023
- Hitachi High Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97882734 - COVISIONVX
- Serial number 97882734
- Filing date Apr 11, 2023
- Hitachi High Tech Corporation
- 7 - Machines and machine tools
Information Trademark
97304989 - MARTIPORT
- Serial number 97304989
- Registration number 7046898
- Filing date Mar 10, 2022
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90809087 - COPY ME DIRECT
- Serial number 90809087
- Registration number 6855910
- Filing date Jul 2, 2021
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
90461304 - EXTOPE
- Serial number 90461304
- Registration number 6720183
- Filing date Jan 12, 2021
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
88782576 - RAXIO
- Serial number 88782576
- Registration number 6513839
- Filing date Feb 3, 2020
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
88729852 - S.I.NAVI
- Serial number 88729852
- Registration number 6513816
- Filing date Dec 17, 2019
- HITACHI HIGH-TECH CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88106576 - D-PREX
- Serial number 88106576
- Registration number 6337581
- Filing date Sep 6, 2018
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
79216054 - ETHOS
- Serial number 79216054
- Registration number 5377505
- Filing date Jun 1, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79221967 - EXTOPE
- Serial number 79221967
- Registration number 5771966
- Filing date Mar 27, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79212361 - EXBRAIN
- Serial number 79212361
- Registration number 5472107
- Filing date Feb 28, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79198316 - MIRELIS
- Serial number 79198316
- Registration number 5193611
- Filing date Sep 21, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79189114 - FLEXSEM
- Serial number 79189114
- Registration number 5080143
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79195807 - ARBLADE
- Serial number 79195807
- Registration number 5158597
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79170037 - AEROSURF
- Serial number 79170037
- Registration number 4966888
- Filing date May 28, 2015
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79150904 - ES-CORRECTOR
- Serial number 79150904
- Registration number 4797226
- Filing date May 22, 2014
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110412 - OPTICROSS
- Serial number 79110412
- Filing date Feb 1, 2012
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110413 - EMULOUS
- Serial number 79110413
- Registration number 4200620
- Filing date Feb 1, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109261 - CHROMASTERULTRA
- Serial number 79109261
- Registration number 4212168
- Filing date Jan 19, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109327 - SEBIT
- Serial number 79109327
- Filing date Jan 11, 2012
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79103637 - PRIMAIDE
- Serial number 79103637
- Registration number 4130370
- Filing date Sep 12, 2011
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79089341 - J-LYNX
- Serial number 79089341
- Filing date Oct 19, 2010
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79086819 - CHROMASTER
- Serial number 79086819
- Registration number 3953640
- Filing date Jul 29, 2010
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77495038 - FLATMILLING
- Serial number 77495038
- Registration number 4002771
- Filing date Jun 10, 2008
- Kabushiki Kaisha Hitachi High-Technologies
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HITACHI HIGH-TECH CORPO RATION

Organization

Patents Grantslast 30 patents

Analysis apparatus having a plurality of liquid chromatographs and...

Electrolyte analyzing device

Defect detection device, defect detection method, and defect observ...

Medical material transport system

Far-infrared spectroscopy device and far-infrared spectroscopy method

Surface shape detection device and detection method

Automated analyzer, automatic analysis system, and automatic sample...

Electron gun and charged particle beam device equipped with electro...

Plasma processing apparatus

Method for manufacturing semiconductor device

Bubble detection in an automated analysis device

Automatic analyzer

Automatic analysis device and automatic analysis method

Machine learning device, image diagnosis support device, machine le...

Biological sample detection device

Automated analysis device, and method for conveying sample

Automatic analysis device

Automatic analysis device

Reaction vessel for automatic analyzer

Charged particle beam device

Charged particle beam device

Charged particle beam device and operation method therefor

Vacuum processing method

Analysis apparatus provided with a plurality of chromatographic app...

Automatic analyzer and analysis method

Charged particle beam system

Electrode structure

Automatic analysis device

Ion detector

Electrostatic chuck and processing apparatus

Patents Applicationslast 30 patents

INSPECTION SYSTEM

Automatic Analyzer

AUTOMATIC ANALYZER AND SAMPLE ASPIRATION METHOD IN AUTOMATIC ANALYZER

Training Method for Learning Apparatus, and Image Generation System

AUTOMATIC ANALYZER

Connection Device and Automated System for Inspecting Specimen

Body-To-Be-Conveyed, Container Carrier, and Conveying Device

Pressure Sensor Module and Dispensing Device

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

METHOD AND APPARATUS FOR COLLECTING BACTERIA

ANALYSIS METHOD OF BASE SEQUENCE AND GENE ANALYZER

ELECTROLYTE MEASUREMENT DEVICE AND METHOD FOR DETERMINING ABNORMALI...

Defect Classification Device and Defect Classification Program

Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...

LIQUID COLUMN SEPARATION DEVICE, SYSTEM, AND METHOD

Inspection System and Non-Transitory Computer-Readable Medium

AUTOMATIC ANALYSIS SYSTEM AND SAMPLE DISTRIBUTION METHOD

AUTOMATIC ANALYZER

ELECTRON MICROSCOPE

IMAGE PROCESSING DEVICE AND METHOD, AND IMAGE PROCESSING SYSTEM

Control Method for Automatic Analyzer

Charged Particle Microscope and Stage

CENTRIFUGAL FILTRATION CARTRIDGE AND MICROBIAL TEST METHOD

AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER

Surface Inspection Device

FUEL BATTERY CELL AND MANUFACTURING METHOD THEREFOR

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

Ion Milling Device

IMAGE DIAGNOSIS SUPPORT DEVICE, IMAGE DIAGNOSIS SUPPORT METHOD, REM...

Trademarklast 30 trademarks

98422632 - NSTREAM

98422625 - NANOSLYNX

98148348 - HUMAN CHROMOSOME EXPLORER

97882734 - COVISIONVX

97304989 - MARTIPORT

90809087 - COPY ME DIRECT

90461304 - EXTOPE

88782576 - RAXIO

88729852 - S.I.NAVI

88106576 - D-PREX

79216054 - ETHOS

79221967 - EXTOPE

79212361 - EXBRAIN

79198316 - MIRELIS

79189114 - FLEXSEM