JAPAN ELECTRONIC MATERIAL CORPORATION

Organization

HYOGO-KEN, JP

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,908,180
- Issue date Feb 2, 2021
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate and probe device
- Patent number 10,386,387
- Issue date Aug 20, 2019
- Shinko Electric Industries Co., Ltd.
- Kosuke Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate and probe device
- Patent number 10,309,988
- Issue date Jun 4, 2019
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate having a silicon oxide layer formed on surfaces a...
- Patent number 10,261,110
- Issue date Apr 16, 2019
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,184,954
- Issue date Jan 22, 2019
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide, probe card, and method for probe guide manufacturing
- Patent number 10,139,430
- Issue date Nov 27, 2018
- Shinko Electric Industries Co., Ltd.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number 9,972,933
- Issue date May 15, 2018
- Japan Electronic Materials Corporation
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Guide plate for a probe card and probe card provided with same
- Patent number 9,841,438
- Issue date Dec 12, 2017
- Japan Electronic Materials Corporation
- Teppei Kimura
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Contact probe
- Patent number 9,774,121
- Issue date Sep 26, 2017
- Japan Electronics Material Corporation
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Guide plate for a probe card and probe card provided with same
- Patent number 9,535,096
- Issue date Jan 3, 2017
- Japan Electronic Materials Corporation
- Teppei Kimura
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Probe guide plate and method for manufacturing the same
- Patent number 9,523,716
- Issue date Dec 20, 2016
- Shinko Electric Industries Co., Ltd.
- Akinori Shiraishi
- G01 - MEASURING TESTING
Information Patent Grant
Guide plate for probe card
- Patent number 9,459,287
- Issue date Oct 4, 2016
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case
- Patent number D751555
- Issue date Mar 15, 2016
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Semiconductor test system and relay driving test method therefor
- Patent number 8,456,171
- Issue date Jun 4, 2013
- Japan Electronic Materials Corp.
- Shingo Matsuno
- G01 - MEASURING TESTING
Information Patent Grant
Optical device inspecting apparatus
- Patent number 8,159,659
- Issue date Apr 17, 2012
- Japan Electronic Materials Corp.
- Shigemi Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Bimetallic probe with tip end
- Patent number 7,692,438
- Issue date Apr 6, 2010
- National Institute for Materials Science
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contactor of the same
- Patent number 7,106,080
- Issue date Sep 12, 2006
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for examining semiconductor devices on semiconductor wafers
- Patent number 7,081,766
- Issue date Jul 25, 2006
- Japan Electronic Materials Corp.
- Katsuhiko Satou
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contactor of the same
- Patent number 6,967,493
- Issue date Nov 22, 2005
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method of reforming a tip portion of a probe
- Patent number 6,013,169
- Issue date Jan 11, 2000
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Antimicrobial polymer composition
- Patent number 5,827,524
- Issue date Oct 27, 1998
- Hagiwara Research Corporation
- Zenji Hagiwara
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Antimicrobial polymer composition
- Patent number 5,698,212
- Issue date Dec 16, 1997
- Hagiwara Research Corporation
- Zenji Hagiwara
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Antimicrobial composition of aluminosilicate coated silica gel
- Patent number 5,413,789
- Issue date May 9, 1995
- Hagiwara Research Corp.
- Zenji Hagiwara
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Grant
Antimicrobial composition having resistance to heat and weathers
- Patent number 5,298,252
- Issue date Mar 29, 1994
- Hagiwara Research Corp.
- Zenji Hagiwara
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Silica-gel based antimicrobial composition having an antimicrobial...
- Patent number 5,244,667
- Issue date Sep 14, 1993
- Hagiwara Research Corp.
- Zenji Hagiwara
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Grant
Complex probe card for testing a semiconductor wafer
- Patent number 4,523,144
- Issue date Jun 11, 1985
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND METHOD FOR REPAIRING PROBE CARD
- Publication number 20240110974
- Publication date Apr 4, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Yutaka TOMITA
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT CHIP FOR PROBE CARD, PROBE CARD AND PROBE CARD REPAIR METHOD
- Publication number 20240103071
- Publication date Mar 28, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Takashi YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240044942
- Publication date Feb 8, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Yuuki NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
PROBE-CARD MULTILAYER WIRING SUBSTRATE AND PROBE CARD
- Publication number 20230408547
- Publication date Dec 21, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Satoshi ABE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230266365
- Publication date Aug 24, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE OF PROBE CARD USE, AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230258689
- Publication date Aug 17, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Kazumasa OKUBO
- G01 - MEASURING TESTING
Information Patent Application
Contact Probe
- Publication number 20170346211
- Publication date Nov 30, 2017
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- G01 - MEASURING TESTING
Information Patent Application
Probe Guide, Probe Card, And Method For Probe Guide Manufacturing
- Publication number 20170242057
- Publication date Aug 24, 2017
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE DEVICE
- Publication number 20170205444
- Publication date Jul 20, 2017
- Shinko Electric Industries Co., Ltd.
- Kosuke Fujihara
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE DEVICE
- Publication number 20170205445
- Publication date Jul 20, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CASE AND PROBE CARD TRANSFER METHOD
- Publication number 20170153272
- Publication date Jun 1, 2017
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE APPARATUS
- Publication number 20170146569
- Publication date May 25, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME
- Publication number 20170082657
- Publication date Mar 23, 2017
- Japan Electronic Materials Corporation
- Teppei KIMURA
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME
- Publication number 20150301083
- Publication date Oct 22, 2015
- Japan Electronic Materials Corporation
- Teppei KIMURA
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Electrical Contact
- Publication number 20150280345
- Publication date Oct 1, 2015
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUIDE PLATE FOR PROBE CARD
- Publication number 20140266275
- Publication date Sep 18, 2014
- Shinko Electric Industries Co., Ltd.
- Teppei KIMURA
- G01 - MEASURING TESTING
Information Patent Application
Probe Card And Manufacturing Method Therefor
- Publication number 20130265073
- Publication date Oct 10, 2013
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Hirofumi Nakano
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER INSULATING SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130105212
- Publication date May 2, 2013
- Japan Electronic Materials Corp.
- Mitsuaki Tsuboi
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20110291685
- Publication date Dec 1, 2011
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND RELAY DRIVING TEST METHOD THEREFOR
- Publication number 20110193562
- Publication date Aug 11, 2011
- JAPAN ELECTRONIC MATERIALS CORP.
- Shingo Matsuno
- G01 - MEASURING TESTING
Information Patent Application
Probe Card and Manufacturing Method Thereof
- Publication number 20090174422
- Publication date Jul 9, 2009
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
Probe for the probe card
- Publication number 20020153913
- Publication date Oct 24, 2002
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING

JAPAN ELECTRONIC MATERIAL CORPORATION

Organization

Patents Grantslast 30 patents

Probe card case and probe card transfer method

Probe guide plate and probe device

Probe guide plate and probe device

Probe guide plate having a silicon oxide layer formed on surfaces a...

Probe card case and probe card transfer method

Probe guide, probe card, and method for probe guide manufacturing

Contact probe

Guide plate for a probe card and probe card provided with same

Contact probe

Guide plate for a probe card and probe card provided with same

Probe guide plate and method for manufacturing the same

Guide plate for probe card

Probe card case

Semiconductor test system and relay driving test method therefor

Optical device inspecting apparatus

Bimetallic probe with tip end

Probe card and contactor of the same

Probe card for examining semiconductor devices on semiconductor wafers

Probe card and contactor of the same

Method of reforming a tip portion of a probe

Antimicrobial polymer composition

Antimicrobial polymer composition

Antimicrobial composition of aluminosilicate coated silica gel

Antimicrobial composition having resistance to heat and weathers

Silica-gel based antimicrobial composition having an antimicrobial...

Complex probe card for testing a semiconductor wafer

Patents Applicationslast 30 patents

PROBE CARD AND METHOD FOR REPAIRING PROBE CARD

ALIGNMENT CHIP FOR PROBE CARD, PROBE CARD AND PROBE CARD REPAIR METHOD

PROBE CARD

PROBE-CARD MULTILAYER WIRING SUBSTRATE AND PROBE CARD

PROBE CARD

PROBE OF PROBE CARD USE, AND METHOD FOR MANUFACTURING THE SAME

Contact Probe

Probe Guide, Probe Card, And Method For Probe Guide Manufacturing

PROBE GUIDE PLATE AND PROBE DEVICE

PROBE GUIDE PLATE AND PROBE DEVICE

PROBE CARD CASE AND PROBE CARD TRANSFER METHOD

PROBE GUIDE PLATE AND PROBE APPARATUS

GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME

GUIDE PLATE FOR A PROBE CARD AND PROBE CARD PROVIDED WITH SAME

Electrical Contact

GUIDE PLATE FOR PROBE CARD

Probe Card And Manufacturing Method Therefor

MULTILAYER INSULATING SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME

PROBE

SEMICONDUCTOR TEST SYSTEM AND RELAY DRIVING TEST METHOD THEREFOR

Probe Card and Manufacturing Method Thereof

Probe for the probe card