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Yehud, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for functionally verifying a physical device u...
Patent number
7,284,177
Issue date
Oct 16, 2007
Verisity, Ltd.
Yoav Z. Hollander
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for compiling temporal expressions
Patent number
6,920,583
Issue date
Jul 19, 2005
Verisity Ltd.
Matthew John Morley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for providing bitwise constraints for test generation
Patent number
6,918,076
Issue date
Jul 12, 2005
Verisity Ltd.
Vitaly Lagoon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Synthesis of verification languages
Patent number
6,907,599
Issue date
Jun 14, 2005
Verisity Ltd.
Yaron Kashai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for test generation with dynamic constraints usin...
Patent number
6,684,359
Issue date
Jan 27, 2004
Verisity Ltd.
Amos Noy
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring temporal coverage detection
Patent number
6,675,138
Issue date
Jan 6, 2004
Verisity Ltd.
Yoav Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for test generation during circuit design
Patent number
6,530,054
Issue date
Mar 4, 2003
Verisity Ltd.
Yoav Hollander
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for applying flexible constraints
Patent number
6,519,727
Issue date
Feb 11, 2003
Verisity Ltd.
Amos Noy
G01 - MEASURING TESTING
Information
Patent Grant
System and method for analyzing temporal expressions
Patent number
6,499,132
Issue date
Dec 24, 2002
Verisity Ltd.
Matthew John Morley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for test generation during circuit design
Patent number
6,347,388
Issue date
Feb 12, 2002
Verisity Ltd.
Yoav Hollander
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for applying flexible constraints
Patent number
6,219,809
Issue date
Apr 17, 2001
Verisity Ltd.
Amos Noy
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for test generation during circuit design
Patent number
6,182,258
Issue date
Jan 30, 2001
Verisity Ltd.
Yoav Hollander
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for maximizing and managing test coverage
Publication number
20040216023
Publication date
Oct 28, 2004
Verisity Ltd.
Uri Maoz
G01 - MEASURING TESTING
Trademark
last 30 trademarks