Wentworth Laboratories, Inc.

Organization

Brookfield, CT, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods of fabricating probe cards including nanotubes
- Patent number 10,234,480
- Issue date Mar 19, 2019
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods of fabricating probe cards including nanotubes
- Patent number 9,851,378
- Issue date Dec 26, 2017
- Wentworth Laboratories Inc.
- Alexander Brandorff
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe card assemblies and probe pins including carbon nanotubes
- Patent number 9,267,968
- Issue date Feb 23, 2016
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,649,372
- Issue date Jan 19, 2010
- Wentworth Laboratories, Inc.
- Robert L. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Multi-offset die head
- Patent number 7,554,348
- Issue date Jun 30, 2009
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin cleaning system
- Patent number 7,392,563
- Issue date Jul 1, 2008
- Wentworth Laboratories, Inc.
- William H. Fulton
- B08 - CLEANING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,388,392
- Issue date Jun 17, 2008
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Flexible microcircuit space transformer assembly
- Patent number 7,282,934
- Issue date Oct 16, 2007
- Wentworth Laboratories, Inc.
- Dean C. Mazza
- G01 - MEASURING TESTING
Information Patent Grant
Die design with integrated assembly aid
- Patent number 7,282,936
- Issue date Oct 16, 2007
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Double side probing of semiconductor devices
- Patent number 7,145,353
- Issue date Dec 5, 2006
- Wentworth Laboratories, Inc.
- Jeremy Hope
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming photo-defined micro electrical contacts
- Patent number 6,977,515
- Issue date Dec 20, 2005
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,927,586
- Issue date Aug 9, 2005
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Grant
Method for chemically etching photo-defined micro electrical contacts
- Patent number 6,906,540
- Issue date Jun 14, 2005
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Planarizing interposer for thermal compensation of a probe card
- Patent number 6,756,797
- Issue date Jun 29, 2004
- Wentworth Laboratories Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Grant
Nickel alloy probe card frame laminate
- Patent number 6,661,244
- Issue date Dec 9, 2003
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,566,898
- Issue date May 20, 2003
- Wentworth Laboratories, Inc.
- William F. Theissen
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,297,657
- Issue date Oct 2, 2001
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Grant
Multiple layer electrical interface
- Patent number 6,255,602
- Issue date Jul 3, 2001
- Wentworth Laboratories, Inc.
- Stephen Evans
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated vertical pin probing device
- Patent number 6,163,162
- Issue date Dec 19, 2000
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Grant
Impedance-matched interconnection device for connecting a vertical-...
- Patent number 6,160,412
- Issue date Dec 12, 2000
- Wentworth Laboratories, Inc.
- Anthony Paul Martel
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for low voltage, low current measurements in a water p...
- Patent number 6,124,723
- Issue date Sep 26, 2000
- Wentworth Laboratories, Inc.
- Matthew J. Costello
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for low current, low voltage parametric measurements...
- Patent number 6,031,383
- Issue date Feb 29, 2000
- Wentworth Laboratories, Inc.
- George H. Streib
- G01 - MEASURING TESTING
Information Patent Grant
Probe station adapter for backside emission inspection
- Patent number 5,959,461
- Issue date Sep 28, 1999
- Wentworth Laboratories, Inc.
- John Brown
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for testing integrated circuits
- Patent number 5,416,429
- Issue date May 16, 1995
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly for testing integrated circuit devices
- Patent number 5,355,079
- Issue date Oct 11, 1994
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Multi-level test probe assembly for IC chips
- Patent number 4,719,417
- Issue date Jan 12, 1988
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly for IC chips
- Patent number 4,599,559
- Issue date Jul 8, 1986
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Probes for fixed point probe cards
- Patent number 4,382,228
- Issue date May 3, 1983
- Wentworth Laboratories Inc.
- Arthur Evans
- G01 - MEASURING TESTING
Information Patent Grant
Assembly fixture for fixed point probe card
- Patent number 3,930,809
- Issue date Jan 6, 1976
- Wentworth Laboratories, Inc.
- Arthur Evans
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FABRICATING PROBE CARDS INCLUDING NANOTUBES
- Publication number 20180045757
- Publication date Feb 15, 2018
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- B82 - NANO-TECHNOLOGY
Information Patent Application
MULTI-OFFSET DIE HEAD
- Publication number 20090002009
- Publication date Jan 1, 2009
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING
Information Patent Application
Method for forming photo-defined micro electrical contacts
- Publication number 20040157350
- Publication date Aug 12, 2004
- Wentworth Laboratories, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Application
Probe pin cleaning system and method
- Publication number 20040134516
- Publication date Jul 15, 2004
- Wentworth Laboratories, Inc.
- William H. Fulton
- B08 - CLEANING
Information Patent Application
Temperature compensated vertical pin probing device
- Publication number 20040051546
- Publication date Mar 18, 2004
- Wentworth Laboratories, Inc.
- William F. Thiessen
- G01 - MEASURING TESTING
Information Patent Application
Method for chemically etching photo-defined micro electrical contacts
- Publication number 20030057957
- Publication date Mar 27, 2003
- Wentworth Laboratories, Inc.
- Fran McQuade
- G01 - MEASURING TESTING
Information Patent Application
Planarizing interposer
- Publication number 20020109514
- Publication date Aug 15, 2002
- Wentworth Laboratories, Inc.
- Alexander Brandorff
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77207163 - MEGAMAX
- Serial number 77207163
- Registration number 3437393
- Filing date Jun 15, 2007
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78930287 - MACROMAX
- Serial number 78930287
- Filing date Jul 14, 2006
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78923834 - MICROMAX
- Serial number 78923834
- Registration number 3339786
- Filing date Jul 6, 2006
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78401147 - ACCUMAX
- Serial number 78401147
- Registration number 2942080
- Filing date Apr 13, 2004
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78181650 - SABER
- Serial number 78181650
- Registration number 2808606
- Filing date Nov 5, 2002
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78105464 - WL WENTWORTH LABORATORIES
- Serial number 78105464
- Registration number 2756086
- Filing date Jan 29, 2002
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78105462 - WL
- Serial number 78105462
- Registration number 2727154
- Filing date Jan 29, 2002
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76224886 - PROBEABILITY
- Serial number 76224886
- Registration number 2620346
- Filing date Mar 13, 2001
- Wentworth Laboratories, Inc.
- 16 - Paper, cardboard and goods made from these materials, not included in other classes
Information Trademark
75734730 - VENOM
- Serial number 75734730
- Registration number 2621751
- Filing date Jun 23, 1999
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74595669 - COBRA
- Serial number 74595669
- Registration number 2144860
- Filing date Nov 7, 1994
- Wentworth Laboratories, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Wentworth Laboratories, Inc.

Organization

Patents Grantslast 30 patents

Methods of fabricating probe cards including nanotubes

Methods of fabricating probe cards including nanotubes

Probe card assemblies and probe pins including carbon nanotubes

Die design with integrated assembly aid

Multi-offset die head

Probe pin cleaning system

Die design with integrated assembly aid

Flexible microcircuit space transformer assembly

Die design with integrated assembly aid

Double side probing of semiconductor devices

Method for forming photo-defined micro electrical contacts

Temperature compensated vertical pin probing device

Method for chemically etching photo-defined micro electrical contacts

Planarizing interposer for thermal compensation of a probe card

Nickel alloy probe card frame laminate

Temperature compensated vertical pin probing device

Temperature compensated vertical pin probing device

Multiple layer electrical interface

Temperature compensated vertical pin probing device

Impedance-matched interconnection device for connecting a vertical-...

Probe holder for low voltage, low current measurements in a water p...

Probe station for low current, low voltage parametric measurements...

Probe station adapter for backside emission inspection

Probe assembly for testing integrated circuits

Probe assembly for testing integrated circuit devices

Multi-level test probe assembly for IC chips

Test probe assembly for IC chips

Probes for fixed point probe cards

Assembly fixture for fixed point probe card

Patents Applicationslast 30 patents

METHODS OF FABRICATING PROBE CARDS INCLUDING NANOTUBES

MULTI-OFFSET DIE HEAD

Method for forming photo-defined micro electrical contacts

Probe pin cleaning system and method

Temperature compensated vertical pin probing device

Method for chemically etching photo-defined micro electrical contacts

Planarizing interposer

Trademarklast 30 trademarks

77207163 - MEGAMAX

78930287 - MACROMAX

78923834 - MICROMAX

78401147 - ACCUMAX

78181650 - SABER

78105464 - WL WENTWORTH LABORATORIES

78105462 - WL

76224886 - PROBEABILITY

75734730 - VENOM

74595669 - COBRA