Amol Joshi

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to mitigate hot electron read disturbs in 3D n...
- Patent number 12,051,469
- Issue date Jul 30, 2024
- INTEL NDTM US LLC
- Wei Cao
- G11 - INFORMATION STORAGE
Information Patent Grant
Contacts for semiconductor devices
- Patent number 11,830,942
- Issue date Nov 28, 2023
- Infineon Technologies LLC
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus to mitigate hot electron read disturbs in 3D N...
- Patent number 11,355,199
- Issue date Jun 7, 2022
- Intel Corporation
- Wei Cao
- G11 - INFORMATION STORAGE
Information Patent Grant
Contacts for semiconductor devices
- Patent number 10,944,000
- Issue date Mar 9, 2021
- Cypress Semiconductor Corporation
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for manufacturing self-aligned STI with single poly
- Patent number 10,622,370
- Issue date Apr 14, 2020
- MONTEREY RESEARCH, LLC
- Tim Thurgate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contacts for semiconductor devices
- Patent number 10,516,044
- Issue date Dec 24, 2019
- Cypress Semiconductor Corporation
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate structures for transistor devices for CMOS applications and pr...
- Patent number 9,362,283
- Issue date Jun 7, 2016
- GLOBALFOUNDRIES Inc.
- Zhendong Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of native oxides by annealing in reducing gas or plasma
- Patent number 9,312,137
- Issue date Apr 12, 2016
- Intermolecular, Inc.
- Frank Greer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for manufacturing self-aligned STI with single poly
- Patent number 9,276,007
- Issue date Mar 1, 2016
- Cypress Semiconductor Corporation
- Tim Thurgate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to control depth profiles of dopants using a remote plasma s...
- Patent number 9,224,644
- Issue date Dec 29, 2015
- Intermolecular, Inc.
- Sandip Niyogi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods of forming gate structures for transistor devices for CMOS...
- Patent number 9,105,497
- Issue date Aug 11, 2015
- GLOBALFOUNDRIES Inc.
- Zhendong Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circular transmission line methods compatible with combinatorial pr...
- Patent number 8,854,067
- Issue date Oct 7, 2014
- Intermolecular, Inc.
- Amol Joshi
- G01 - MEASURING TESTING
Information Patent Grant
High productivity combinatorial oxide terracing and PVD/ALD metal d...
- Patent number 8,735,302
- Issue date May 27, 2014
- Intermolecular, Inc.
- Amol Joshi
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming MOS capacitor
- Patent number 8,685,829
- Issue date Apr 1, 2014
- Intermolecular, Inc.
- Amol Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned STI with single poly for manufacturing a flash memory...
- Patent number 8,642,441
- Issue date Feb 4, 2014
- Spansion LLC
- Tim Thurgate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell system with charge trap
- Patent number 8,587,049
- Issue date Nov 19, 2013
- Spansion, LLC
- Meng Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contacts for semiconductor devices
- Patent number 8,564,041
- Issue date Oct 22, 2013
- Advanced Micro Devices, Inc.
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual charge storage node memory device and methods for fabricating...
- Patent number 8,183,623
- Issue date May 22, 2012
- Spansion LLC
- Chungho Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell system with charge trap
- Patent number 8,143,661
- Issue date Mar 27, 2012
- Spansion LLC
- Shenqing Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Applying negative gate voltage to wordlines adjacent to wordline as...
- Patent number 7,995,386
- Issue date Aug 9, 2011
- Spansion LLC
- Yuji Mizuguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Dual charge storage node memory device and methods for fabricating...
- Patent number 7,915,123
- Issue date Mar 29, 2011
- Spansion LLC
- Chungho Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact spacer formation using atomic layer deposition
- Patent number 7,704,878
- Issue date Apr 27, 2010
- Advanced Micro Devices, Inc,
- Minh Van Ngo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual bit flash memory devices and methods for fabricating the same
- Patent number 7,705,390
- Issue date Apr 27, 2010
- Spansion LLC
- Amol Ramesh Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit memory system employing silicon rich layers
- Patent number 7,675,104
- Issue date Mar 9, 2010
- Spansion LLC
- Amol Ramesh Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and methods for its fabrication
- Patent number 7,564,091
- Issue date Jul 21, 2009
- Spansion LLC
- Chungho Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and methods for its fabrication
- Patent number 7,432,156
- Issue date Oct 7, 2008
- Spansion LLC
- Chungho Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual bit flash memory devices and methods for fabricating the same
- Patent number 7,368,347
- Issue date May 6, 2008
- Spansion LLC
- Amol Ramesh Joshi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20220302297
- Publication date Sep 22, 2022
- CYPRESS SEMICONDUCTOR CORPORATION
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS TO MITIGATE HOT ELECTRON READ DISTURBS IN 3D N...
- Publication number 20220284968
- Publication date Sep 8, 2022
- Intel Corporation
- Wei Cao
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS TO MITIGATE HOT ELECTRON READ DISTURBS IN 3D N...
- Publication number 20220028459
- Publication date Jan 27, 2022
- Intel Corporation
- Wei Cao
- G11 - INFORMATION STORAGE
Information Patent Application
CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20200212215
- Publication date Jul 2, 2020
- CYPRESS SEMICONDUCTOR CORPORATION
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Metal-Insulator-Semiconductor Contacts with In...
- Publication number 20160181380
- Publication date Jun 23, 2016
- INTERMOLECULAR INC.
- Amol Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tantalum carbide metal gate stack for mid-gap work function applica...
- Publication number 20160093711
- Publication date Mar 31, 2016
- INTERMOLECULAR INC.
- Zhendong Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metal-insulator-semiconductor (MIS) contact with controlled defect...
- Publication number 20150380309
- Publication date Dec 31, 2015
- INTERMOLECULAR INC.
- Salil Mujumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING GATE STRUCTURES FOR TRANSISTOR DEVICES FOR CMOS...
- Publication number 20150311206
- Publication date Oct 29, 2015
- GLOBAL FOUNDRIES Inc.
- Zhendong Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Productivity Combinatorial Testing of Multiple Work Function M...
- Publication number 20150187664
- Publication date Jul 2, 2015
- INTERMOLECULAR INC.
- Amol Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two Step Deposition of High-k Gate Dielectric Materials
- Publication number 20150140838
- Publication date May 21, 2015
- INTERMOLECULAR INC.
- Kevin Kashefi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduction of native oxides by annealing in reducing gas or plasma
- Publication number 20150118828
- Publication date Apr 30, 2015
- INTERMOLECULAR INC.
- Frank Greer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DEPOSITING AN ALUMINUM OXIDE LAYER OVER GERMANIUM SUSBT...
- Publication number 20150093914
- Publication date Apr 2, 2015
- Intermolecular
- Bin Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR REMOVING A NATIVE OXIDE LAYER FROM GERMANIUM SUSBTRATES...
- Publication number 20150093889
- Publication date Apr 2, 2015
- Intermolecular
- Bin Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR REMOVING A NATIVE OXIDE LAYER FROM GERMANIUM SUSBTRATES...
- Publication number 20150093887
- Publication date Apr 2, 2015
- GLOBALFOUNDRIES, Inc.
- Bin Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING GATE STRUCTURES FOR TRANSISTOR DEVICES FOR CMOS...
- Publication number 20150061027
- Publication date Mar 5, 2015
- GLOBALFOUNDRIES INC.
- Zhendong Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UV treatment for ALD film densification
- Publication number 20150064361
- Publication date Mar 5, 2015
- INTERMOLECULAR INC.
- Frank Greer
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SYSTEM AND METHOD FOR MANUFACTURING SELF-ALIGNED STI WITH SINGLE POLY
- Publication number 20140312409
- Publication date Oct 23, 2014
- SPANSION LLC
- Tim Thurgate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Control Depth Profiles of Dopants Using a Remote Plasma S...
- Publication number 20140179100
- Publication date Jun 26, 2014
- Intermolecular, Inc.
- Sandip Niyogi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PVD-ALD-CVD hybrid HPC for work function material screening
- Publication number 20140162384
- Publication date Jun 12, 2014
- INTERMOLECULAR INC.
- Amol Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sacrificial Low Work Function Cap Layer
- Publication number 20140099785
- Publication date Apr 10, 2014
- Intermolecular, Inc.
- Salil Mujumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Device with Charge Trap
- Publication number 20140061771
- Publication date Mar 6, 2014
- SPANSION, LLC
- Meng Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCULAR TRANSMISSION LINE METHODS COMPATIBLE WITH COMBINATORIAL PR...
- Publication number 20140055152
- Publication date Feb 27, 2014
- GLOBALFOUNDRIES, INC.
- Amol Joshi
- G01 - MEASURING TESTING
Information Patent Application
CONTACTS FOR SEMICONDUCTOR DEVICES
- Publication number 20140042514
- Publication date Feb 13, 2014
- SPANSION LLC
- Angela T. Hui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTRIBUTED SUBSTRATE TOP CONTACT FOR MOSCAP MEASUREMENTS
- Publication number 20140008763
- Publication date Jan 9, 2014
- Intermolecular, Inc.
- Salil Mujumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PRODUCTIVITY COMBINATORIAL OXIDE TERRACING AND PVD/ALD METAL D...
- Publication number 20130316472
- Publication date Nov 28, 2013
- Intermolecular, Inc.
- Amol Joshi
- G01 - MEASURING TESTING
Information Patent Application
DUAL CHARGE STORAGE NODE MEMORY DEVICE AND METHODS FOR FABRICATING...
- Publication number 20110175158
- Publication date Jul 21, 2011
- Chungho LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPLYING NEGATIVE GATE VOLTAGE TO WORDLINES ADJACENT TO WORDLINE AS...
- Publication number 20100128521
- Publication date May 27, 2010
- SPANSION LLC
- Yuji Mizuguchi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND METHODS FOR ITS FABRICATION
- Publication number 20080315290
- Publication date Dec 25, 2008
- Chungho LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BIT FLASH MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME
- Publication number 20080169502
- Publication date Jul 17, 2008
- Amol Ramesh Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY SYSTEM WITH SELECT GATE ERASE
- Publication number 20080150000
- Publication date Jun 26, 2008
- SPANSION LLC
- YouSeok Suh
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method and apparatus to mitigate hot electron read disturbs in 3D n...

Contacts for semiconductor devices

Method and apparatus to mitigate hot electron read disturbs in 3D N...

Contacts for semiconductor devices

System and method for manufacturing self-aligned STI with single poly

Contacts for semiconductor devices

Gate structures for transistor devices for CMOS applications and pr...

Reduction of native oxides by annealing in reducing gas or plasma

System and method for manufacturing self-aligned STI with single poly

Method to control depth profiles of dopants using a remote plasma s...

Methods of forming gate structures for transistor devices for CMOS...

Circular transmission line methods compatible with combinatorial pr...

High productivity combinatorial oxide terracing and PVD/ALD metal d...

Method for forming MOS capacitor

Self-aligned STI with single poly for manufacturing a flash memory...

Memory cell system with charge trap

Contacts for semiconductor devices

Dual charge storage node memory device and methods for fabricating...

Memory cell system with charge trap

Applying negative gate voltage to wordlines adjacent to wordline as...

Dual charge storage node memory device and methods for fabricating...

Contact spacer formation using atomic layer deposition

Dual bit flash memory devices and methods for fabricating the same

Integrated circuit memory system employing silicon rich layers

Memory device and methods for its fabrication

Memory device and methods for its fabrication

Dual bit flash memory devices and methods for fabricating the same

Patents Applicationslast 30 patents

CONTACTS FOR SEMICONDUCTOR DEVICES

METHOD AND APPARATUS TO MITIGATE HOT ELECTRON READ DISTURBS IN 3D N...

METHOD AND APPARATUS TO MITIGATE HOT ELECTRON READ DISTURBS IN 3D N...

CONTACTS FOR SEMICONDUCTOR DEVICES

Semiconductor Device Metal-Insulator-Semiconductor Contacts with In...

Tantalum carbide metal gate stack for mid-gap work function applica...

Metal-insulator-semiconductor (MIS) contact with controlled defect...

METHODS OF FORMING GATE STRUCTURES FOR TRANSISTOR DEVICES FOR CMOS...

High Productivity Combinatorial Testing of Multiple Work Function M...

Two Step Deposition of High-k Gate Dielectric Materials

Reduction of native oxides by annealing in reducing gas or plasma

METHODS FOR DEPOSITING AN ALUMINUM OXIDE LAYER OVER GERMANIUM SUSBT...

METHODS FOR REMOVING A NATIVE OXIDE LAYER FROM GERMANIUM SUSBTRATES...

METHODS FOR REMOVING A NATIVE OXIDE LAYER FROM GERMANIUM SUSBTRATES...

METHODS OF FORMING GATE STRUCTURES FOR TRANSISTOR DEVICES FOR CMOS...

UV treatment for ALD film densification

SYSTEM AND METHOD FOR MANUFACTURING SELF-ALIGNED STI WITH SINGLE POLY

Method to Control Depth Profiles of Dopants Using a Remote Plasma S...

PVD-ALD-CVD hybrid HPC for work function material screening

Sacrificial Low Work Function Cap Layer

Memory Device with Charge Trap

CIRCULAR TRANSMISSION LINE METHODS COMPATIBLE WITH COMBINATORIAL PR...

CONTACTS FOR SEMICONDUCTOR DEVICES

DISTRIBUTED SUBSTRATE TOP CONTACT FOR MOSCAP MEASUREMENTS

HIGH PRODUCTIVITY COMBINATORIAL OXIDE TERRACING AND PVD/ALD METAL D...

DUAL CHARGE STORAGE NODE MEMORY DEVICE AND METHODS FOR FABRICATING...

APPLYING NEGATIVE GATE VOLTAGE TO WORDLINES ADJACENT TO WORDLINE AS...

MEMORY DEVICE AND METHODS FOR ITS FABRICATION

DUAL BIT FLASH MEMORY DEVICES AND METHODS FOR FABRICATING THE SAME

MEMORY SYSTEM WITH SELECT GATE ERASE