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Anda C. Mocuta
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LaGrangeville, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Compact model for device/circuit/chip leakage current (IDDQ) calcul...
Patent number
9,639,652
Issue date
May 2, 2017
GLOBALFOUNDRIES Inc.
Paul Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and system for analysis and management of parametric yield
Patent number
8,997,028
Issue date
Mar 31, 2015
Mentor Graphics Corporation
James A. Culp
G01 - MEASURING TESTING
Information
Patent Grant
Intra die variation monitor using through-silicon via
Patent number
8,754,412
Issue date
Jun 17, 2014
International Business Machines Corporation
Xiaojun Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compact model for device/circuit/chip leakage current (IDDQ) calcul...
Patent number
8,626,480
Issue date
Jan 7, 2014
International Business Machines Corporation
Paul Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and system for analysis and management of parametric yield
Patent number
8,429,576
Issue date
Apr 23, 2013
Mentor Graphics Corporation
James A. Culp
G01 - MEASURING TESTING
Information
Patent Grant
Methods and system for analysis and management of parametric yield
Patent number
8,239,790
Issue date
Aug 7, 2012
International Business Machines Corporation
James A. Culp
G01 - MEASURING TESTING
Information
Patent Grant
Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
Patent number
8,168,971
Issue date
May 1, 2012
International Business Machines Corporation
Dureseti Chidambarrao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Balancing NFET and PFET performance using straining layers
Patent number
8,106,462
Issue date
Jan 31, 2012
International Business Machines Corporation
Xiangdong Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and system for analysis and management of parametric yield
Patent number
8,042,070
Issue date
Oct 18, 2011
International Business Machines Corporation
James A. Culp
G01 - MEASURING TESTING
Information
Patent Grant
Protection against charging damage in hybrid orientation transistors
Patent number
7,928,513
Issue date
Apr 19, 2011
International Business Machines Corporation
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of providing protection against charging damage in hybrid or...
Patent number
7,879,650
Issue date
Feb 1, 2011
International Business Machines Corporation
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOSFET with super-steep retrograded island
Patent number
7,723,750
Issue date
May 25, 2010
International Business Machines Corporation
Huilong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High performance strained silicon FinFETs device and method for for...
Patent number
7,705,345
Issue date
Apr 27, 2010
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
Patent number
7,691,698
Issue date
Apr 6, 2010
International Business Machines Corporation
Dureseti Chidambarrao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS silicide metal gate integration
Patent number
7,655,557
Issue date
Feb 2, 2010
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon/silcion germaninum/silicon body device with embedded carbon...
Patent number
7,560,326
Issue date
Jul 14, 2009
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protection against charging damage in hybrid orientation transistors
Patent number
7,492,016
Issue date
Feb 17, 2009
International Business Machines Corporation
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS silicide metal gate integration
Patent number
7,411,227
Issue date
Aug 12, 2008
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Structure and method for manufacturing MOSFET with super-steep retr...
Patent number
7,268,049
Issue date
Sep 11, 2007
International Business Machines Corporation
Huilong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for preventing sidewall consumption during oxidation of SGOI...
Patent number
7,067,400
Issue date
Jun 27, 2006
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS silicide metal gate integration
Patent number
7,056,782
Issue date
Jun 6, 2006
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High performance CMOS device structure with mid-gap metal gate
Patent number
6,916,698
Issue date
Jul 12, 2005
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Strained silicon NMOS devices with embedded source/drain
Patent number
6,881,635
Issue date
Apr 19, 2005
International Business Machines Corporation
Dureseti Chidambarrao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High performance CMOS device structure with mid-gap metal gate
Patent number
6,762,469
Issue date
Jul 13, 2004
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming asymmetric extension mosfet using a drain side sp...
Patent number
6,746,924
Issue date
Jun 8, 2004
International Business Machines Corporation
Byoung H. Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Use of disposable spacer to introduce gettering in SOI layer
Patent number
6,635,517
Issue date
Oct 21, 2003
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for fabricating an MOS device having highly-localized halo...
Patent number
6,509,241
Issue date
Jan 21, 2003
International Business Machines Corporation
Heemyong Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS device structures and method of making same
Patent number
6,303,450
Issue date
Oct 16, 2001
International Business Machines Corporation
Heemyong Park
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
COMPACT MODEL FOR DEVICE/CIRCUIT/CHIP LEAKAGE CURRENT (IDDQ) CALCUL...
Publication number
20140123097
Publication date
May 1, 2014
International Business Machines Corporation
Paul Chang
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
Publication number
20130238263
Publication date
Sep 12, 2013
Mentor Graphics Corporation
James A. Culp
G01 - MEASURING TESTING
Information
Patent Application
Intra Die Variation Monitor Using Through-Silicon Via
Publication number
20130168673
Publication date
Jul 4, 2013
International Business Machines Corporation
Xiaojun Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
Publication number
20120227019
Publication date
Sep 6, 2012
International Business Machines Corporation
James A. Culp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
Publication number
20110307846
Publication date
Dec 15, 2011
International Business Machines Corporation
James A. Culp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BALANCING NFET AND PFET PERFORMANCE USING STRAINING LAYERS
Publication number
20110169096
Publication date
Jul 14, 2011
International Business Machines Corporation
Xiangdong Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPACT MODEL FOR DEVICE/CIRCUIT/CHIP LEAKAGE CURRENT (IDDQ) CALCUL...
Publication number
20110082680
Publication date
Apr 7, 2011
International Business Machines Corporation
Paul Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Protection against charging damage in hybrid orientation transistors
Publication number
20090179269
Publication date
Jul 16, 2009
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND SYSTEM FOR ANALYSIS AND MANAGEMENT OF PARAMETRIC YIELD
Publication number
20090106714
Publication date
Apr 23, 2009
International Business Machines Corporation
James A. Culp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CMOS SILICIDE METAL GATE INTEGRATION
Publication number
20080254622
Publication date
Oct 16, 2008
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PSEUDOMORPHIC SI/SIGE/SI BODY DEVICE WITH EMBEDDED SIGE SOURCE/DRAIN
Publication number
20080179680
Publication date
Jul 31, 2008
International Business Machines Corporation
Dureseti CHIDAMBARRAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
N-FETS WITH TENSILELY STRAINED SEMICONDUCTOR CHANNELS, AND METHOD F...
Publication number
20080179636
Publication date
Jul 31, 2008
International Business Machines Corporation
Dureseti Chidambarrao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of providing protection against charging damage in hybrid or...
Publication number
20080108186
Publication date
May 8, 2008
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SILICON/SILCION GERMANINUM/SILICON BODY DEVICE WITH EMBEDDED CARBON...
Publication number
20070257249
Publication date
Nov 8, 2007
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRUCTURE AND METHOD FOR MANUFACTURING MOSFET WITH SUPER-STEEP RETR...
Publication number
20070252203
Publication date
Nov 1, 2007
International Business Machines Corporation
Huilong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROTECTION AGAINST CHARGING DAMAGE IN HYBRID ORIENTATION TRANSISTORS
Publication number
20070228479
Publication date
Oct 4, 2007
International Business Machines Corporation
Terence B. Hook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
Publication number
20070196987
Publication date
Aug 23, 2007
Dureseti Chidambarrao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE FORMING METHOD AND STRUCTURE FOR RETARDING DO...
Publication number
20060220112
Publication date
Oct 5, 2006
International Business Machines Corporation
Huilong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS silicide metal gate integration
Publication number
20060189061
Publication date
Aug 24, 2006
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW CONCENTRATION SiGe BUFFER DURING STRAINED Si GROWTH OF SSGOI MA...
Publication number
20060151787
Publication date
Jul 13, 2006
International Business Machines Corporation
Huajie Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Structure and method for manufacturing MOSFET with super-steep retr...
Publication number
20060068555
Publication date
Mar 30, 2006
International Business Machines Corporation
Huilong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for preventing sidewall consumption during oxidation of SGOI...
Publication number
20060063358
Publication date
Mar 23, 2006
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Strained silicon NMOS devices with embedded source/drain
Publication number
20050242340
Publication date
Nov 3, 2005
International Business Machines Corporation
Dureseti Chidambarrao
C30 - CRYSTAL GROWTH
Information
Patent Application
CMOS silicide metal gate integration
Publication number
20050186747
Publication date
Aug 25, 2005
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High performance strained silicon FinFETs device and method for for...
Publication number
20050145941
Publication date
Jul 7, 2005
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High performance CMOS device structure with mid-gap metal gate
Publication number
20040171205
Publication date
Sep 2, 2004
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High performance CMOS device structure with mid-gap metal gate
Publication number
20030197230
Publication date
Oct 23, 2003
International Business Machines Corporation
Anda C. Mocuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Use of disposable spacer to introduce gettering in SOI layer
Publication number
20030032251
Publication date
Feb 13, 2003
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Structures and methods to minimize plasma charging damage in silico...
Publication number
20020142526
Publication date
Oct 3, 2002
International Business Machines Corporation
Mukesh Khare
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for fabricating an MOS device having highly-localized halo...
Publication number
20020072176
Publication date
Jun 13, 2002
Heemyong Park
H01 - BASIC ELECTRIC ELEMENTS