Clarence E. Cowan

Person

Newberg, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 7,616,017
- Issue date Nov 10, 2009
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,550,984
- Issue date Jun 23, 2009
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low inductance path
- Patent number 7,498,828
- Issue date Mar 3, 2009
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,403,025
- Issue date Jul 22, 2008
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 7,323,895
- Issue date Jan 29, 2008
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,295,025
- Issue date Nov 13, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 7,292,057
- Issue date Nov 6, 2007
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low inductance path
- Patent number 7,250,779
- Issue date Jul 31, 2007
- Cascade Microtech, Inc.
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Grant
POGO probe card for low current measurements
- Patent number 7,148,714
- Issue date Dec 12, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,148,711
- Issue date Dec 12, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,138,810
- Issue date Nov 21, 2006
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 7,138,813
- Issue date Nov 21, 2006
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 7,068,057
- Issue date Jun 27, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 7,042,241
- Issue date May 9, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,930,498
- Issue date Aug 16, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 6,856,153
- Issue date Feb 15, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 6,847,219
- Issue date Jan 25, 2005
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,838,890
- Issue date Jan 4, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 6,822,467
- Issue date Nov 23, 2004
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 6,642,732
- Issue date Nov 4, 2003
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 6,559,668
- Issue date May 6, 2003
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 6,512,391
- Issue date Jan 28, 2003
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Probe station thermal chuck with shielding for capacitive current
- Patent number 6,445,202
- Issue date Sep 3, 2002
- Cascade Microtech, Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Grant
Low-current pogo probe card
- Patent number 6,034,533
- Issue date Mar 7, 2000
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Electronic delay control circuit having pulse width maintenance
- Patent number 4,862,020
- Issue date Aug 29, 1989
- Tektronix, Inc.
- Clarence E. Cowan
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Membrane probing system
- Publication number 20080252316
- Publication date Oct 16, 2008
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20080054922
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20080042680
- Publication date Feb 21, 2008
- Cascade Microtech Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low inductance path
- Publication number 20070247178
- Publication date Oct 25, 2007
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20070030021
- Publication date Feb 8, 2007
- Cascade Microtech Inc.
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20070024302
- Publication date Feb 1, 2007
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20070018665
- Publication date Jan 25, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20060284630
- Publication date Dec 21, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20060164112
- Publication date Jul 27, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20050248359
- Publication date Nov 10, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20050151557
- Publication date Jul 14, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20050146345
- Publication date Jul 7, 2005
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20050104610
- Publication date May 19, 2005
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low inductance path
- Publication number 20050099192
- Publication date May 12, 2005
- John Dunklee
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20050035779
- Publication date Feb 17, 2005
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20050007131
- Publication date Jan 13, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20040150416
- Publication date Aug 5, 2004
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20040027145
- Publication date Feb 12, 2004
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20040017214
- Publication date Jan 29, 2004
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20030132767
- Publication date Jul 17, 2003
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Low-current pogo probe card
- Publication number 20030117157
- Publication date Jun 26, 2003
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20030080765
- Publication date May 1, 2003
- Clarence E. Cowan
- G01 - MEASURING TESTING
Information Patent Application
Probe station thermal chuck with shielding for capacitive current
- Publication number 20020167329
- Publication date Nov 14, 2002
- Clarence E. Cowan
- G01 - MEASURING TESTING

Clarence E. Cowan

Person

Patents Grantslast 30 patents

Probe station thermal chuck with shielding for capacitive current

Probe station with low noise characteristics

Probe station with low inductance path

Membrane probing system

Low-current pogo probe card

Probe station with low noise characteristics

Probe station thermal chuck with shielding for capacitive current

Probe station with low inductance path

POGO probe card for low current measurements

Membrane probing system

Probe station with low noise characteristics

Probe station thermal chuck with shielding for capacitive current

Low-current pogo probe card

Low-current pogo probe card

Membrane probing system

Low-current pogo probe card

Probe station with low noise characteristics

Membrane probing system

Low-current pogo probe card

Probe station thermal chuck with shielding for capacitive current

Low-current pogo probe card

Probe station thermal chuck with shielding for capacitive current

Probe station thermal chuck with shielding for capacitive current

Low-current pogo probe card

Electronic delay control circuit having pulse width maintenance

Patents Applicationslast 30 patents

Membrane probing system

Probe station with low noise characteristics

Probe station thermal chuck with shielding for capacitive current

Probe station with low inductance path

Probe station thermal chuck with shielding for capacitive current

Low-current pogo probe card

Probe station with low noise characteristics

Membrane probing system

Low-current pogo probe card

Membrane probing system

Low-current pogo probe card

Low-current pogo probe card

Probe station with low noise characteristics

Probe station with low inductance path

Low-current pogo probe card

Membrane probing system

Probe station thermal chuck with shielding for capacitive current

Low-current pogo probe card

Low-current pogo probe card

Membrane probing system

Low-current pogo probe card

Probe station thermal chuck with shielding for capacitive current

Probe station thermal chuck with shielding for capacitive current