Craig M. Herzinger

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
- Patent number 11,821,833
- Issue date Nov 21, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Patent number 11,740,176
- Issue date Aug 29, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,675,208
- Issue date Jun 13, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,989,601
- Issue date Apr 27, 2021
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and materials for metamaterials exhibiting form-induced bir...
- Patent number 10,914,866
- Issue date Feb 9, 2021
- HARRIS CORPORATION GCS
- Tino Hofmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Ellipsometer or polarimeter system having at least one rotating ele...
- Patent number 10,775,298
- Issue date Sep 15, 2020
- J.A. WOOLLAM CO., INC.
- Christopher D. Hassler
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Biased fast axis retarder system
- Patent number 10,606,093
- Issue date Mar 31, 2020
- J. A. Woollam Co., Inc.
- Craig M Herzinger
- G02 - OPTICS
Information Patent Grant
Method to analyze spectroscopic ellipsometry or intensity data of p...
- Patent number 10,175,160
- Issue date Jan 8, 2019
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence imaging chromatography based on highly ordered 3D nan...
- Patent number 10,101,265
- Issue date Oct 16, 2018
- BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA
- Mathias M. Schubert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...
- Patent number 10,073,120
- Issue date Sep 11, 2018
- Board of Regents for the University of Nebraska
- Tino Hofmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deviation angle self-compensating substantially achromatic retarder
- Patent number 10,061,068
- Issue date Aug 28, 2018
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G02 - OPTICS
Information Patent Grant
Method of obtaining micrographs of transparent or semi-transparent...
- Patent number 10,026,167
- Issue date Jul 17, 2018
- Board of Regents of the University of Nebraska
- Tino Hofmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to analyze spectroscopic ellipsometry data of porous samples...
- Patent number 9,976,902
- Issue date May 22, 2018
- J.A. Woolam Co., Inc.
- Stefan Schoeche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of characterizing a beam of electromagnetic radiation in ell...
- Patent number 9,952,141
- Issue date Apr 24, 2018
- J. A. Woollam Co., Inc.
- Jeffrey S. Hale
- G01 - MEASURING TESTING
Information Patent Grant
Biased fast axis retarder system
- Patent number 9,921,352
- Issue date Mar 20, 2018
- J. A. Woollam Co., Inc.
- Craig M Herzinger
- G02 - OPTICS
Information Patent Grant
Integrated mid-infrared, far infrared and terahertz optical Hall ef...
- Patent number 9,851,294
- Issue date Dec 26, 2017
- J. A. Woollam Co., Inc.
- Tino Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz ellipsometer system, and method of use
- Patent number 9,121,757
- Issue date Sep 1, 2015
- J. A. Woollam Co., Inc.
- Craig M Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 9,041,927
- Issue date May 26, 2015
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,934,096
- Issue date Jan 13, 2015
- University of Nebraska Board of Regents
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz ellipsometer system, and method of use
- Patent number 8,736,838
- Issue date May 27, 2014
- J. A. Woollam Co., Inc.
- Craig M Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,705,032
- Issue date Apr 22, 2014
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
System and method for compensating detector non-idealities
- Patent number 8,564,777
- Issue date Oct 22, 2013
- J. A. Woollam Co., Inc.
- Craig M Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,488,119
- Issue date Jul 16, 2013
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Mounting for deviation angle self compensating substantially achrom...
- Patent number 8,462,341
- Issue date Jun 11, 2013
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,416,408
- Issue date Apr 9, 2013
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Empirical correction for spectroscopic ellipsometric measurements o...
- Patent number 8,248,607
- Issue date Aug 21, 2012
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,169,611
- Issue date May 1, 2012
- University of Nebraska Board of Regents
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter in sample investigation system
- Patent number 8,013,996
- Issue date Sep 6, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of constructing a deviation angle self compensating substant...
- Patent number 7,907,280
- Issue date Mar 15, 2011
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fast and accurated mueller matrix infrared ellipsometer
- Publication number 20230194414
- Publication date Jun 22, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Publication number 20230184671
- Publication date Jun 15, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Publication number 20220244169
- Publication date Aug 4, 2022
- J. A. WOOLLAM CO., INC.
- Ping He
- G02 - OPTICS
Information Patent Application
TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE
- Publication number 20150153230
- Publication date Jun 4, 2015
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz ellipsometer system, and method of use
- Publication number 20140284484
- Publication date Sep 25, 2014
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20140027644
- Publication date Jan 30, 2014
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz ellipsometer system, and method of use
- Publication number 20130026368
- Publication date Jan 31, 2013
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120261580
- Publication date Oct 18, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120206724
- Publication date Aug 16, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Mounting for deviation angle self compensating substantially achrom...
- Publication number 20110188040
- Publication date Aug 4, 2011
- Ping He
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20100220313
- Publication date Sep 2, 2010
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Method of constructing a deviation angle self compensating substant...
- Publication number 20090091758
- Publication date Apr 9, 2009
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20080100842
- Publication date May 1, 2008
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20070253059
- Publication date Nov 1, 2007
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Method of analysis of multiple layer samples
- Publication number 20050179897
- Publication date Aug 18, 2005
- Ronald A. Synowicki
- G01 - MEASURING TESTING
Information Patent Application
Sample analysis methodology utilizing electromagnetic radiation
- Publication number 20040257567
- Publication date Dec 23, 2004
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Application
Methodology for improving precision of data acquired by spectrophot...
- Publication number 20020085200
- Publication date Jul 4, 2002
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Spatial filter source beam conditioning in ellipsometer and the lik...
- Publication number 20010046089
- Publication date Nov 29, 2001
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Determination of thickness and impurity profiles in thin membranes...
- Publication number 20010042832
- Publication date Nov 22, 2001
- Craig M. Herzinger
- G01 - MEASURING TESTING

Craig M. Herzinger

Person

Patents Grantslast 30 patents

Fast and accurate Mueller matrix infrared ellipsometer

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Beam focusing and reflective optics

Methods and materials for metamaterials exhibiting form-induced bir...

Ellipsometer or polarimeter system having at least one rotating ele...

Biased fast axis retarder system

Method to analyze spectroscopic ellipsometry or intensity data of p...

Birefringence imaging chromatography based on highly ordered 3D nan...

Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...

Deviation angle self-compensating substantially achromatic retarder

Method of obtaining micrographs of transparent or semi-transparent...

Method to analyze spectroscopic ellipsometry data of porous samples...

Method of characterizing a beam of electromagnetic radiation in ell...

Biased fast axis retarder system

Integrated mid-infrared, far infrared and terahertz optical Hall ef...

Terahertz ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

System and method for compensating detector non-idealities

Terahertz-infrared ellipsometer system, and method of use

Mounting for deviation angle self compensating substantially achrom...

Terahertz-infrared ellipsometer system, and method of use

Empirical correction for spectroscopic ellipsometric measurements o...

Terahertz-infrared ellipsometer system, and method of use

Sample investigating system and method of use

Spatial filter in sample investigation system

Method of constructing a deviation angle self compensating substant...

Patents Applicationslast 30 patents

Fast and accurated mueller matrix infrared ellipsometer

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE

Terahertz ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Mounting for deviation angle self compensating substantially achrom...

Terahertz-infrared ellipsometer system, and method of use

Method of constructing a deviation angle self compensating substant...

Deviation angle self compensating substantially achromatic retarder

Deviation angle self compensating substantially achromatic retarder

System for and method of investigating the exact same point on a sa...

Combined spatial filter and relay systems in rotating compensator e...

Method of analysis of multiple layer samples

Sample analysis methodology utilizing electromagnetic radiation

Methodology for improving precision of data acquired by spectrophot...

Spatial filter source beam conditioning in ellipsometer and the lik...

Determination of thickness and impurity profiles in thin membranes...