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David Erik Aspnes
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Berkeley Heights, NJ, US
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last 30 patents
Information
Patent Grant
Ellipsometric control of material growth
Patent number
5,091,320
Issue date
Feb 25, 1992
Bell Communications Research, Inc.
David E. Aspnes
C30 - CRYSTAL GROWTH
Information
Patent Grant
Optical control of deposition of crystal monolayers
Patent number
4,931,132
Issue date
Jun 5, 1990
Bell Communications Research, Inc.
David E. Aspnes
C30 - CRYSTAL GROWTH
Information
Patent Grant
Cylindrical grating monochromator for synchrotron radiation
Patent number
4,492,466
Issue date
Jan 8, 1985
AT&T Bell Laboratories
David E. Aspnes
G01 - MEASURING TESTING
Information
Patent Grant
Method of preparing semiconductor surfaces
Patent number
4,380,490
Issue date
Apr 19, 1983
Bell Telephone Laboratories, Incorporated
David E. Aspnes
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for producing devices comprising high density amorphous sili...
Patent number
4,357,179
Issue date
Nov 2, 1982
Bell Telephone Laboratories, Incorporated
Arthur C. Adams
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for optical monitoring in materials fabrication
Patent number
4,332,833
Issue date
Jun 1, 1982
Bell Telephone Laboratories, Incorporated
David E. Aspnes
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of thin films by polarized light
Patent number
3,985,447
Issue date
Oct 12, 1976
Bell Telephone Laboratories, Incorporated
David Erik Aspnes
G01 - MEASURING TESTING