David Walker

Person

Sunol, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,656,170
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution, low-distortion and high-efficiency optical couplin...
- Patent number 7,566,873
- Issue date Jul 28, 2009
- KLA-Tencor Technologies Corporation
- David Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,012,439
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,984,822
- Issue date Jan 10, 2006
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,921,672
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,867,606
- Issue date Mar 15, 2005
- KLA-Tencor Technologies, Inc.
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Multi-pixel methods and apparatus for analysis of defect informatio...
- Patent number 6,771,806
- Issue date Aug 3, 2004
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,713,759
- Issue date Mar 30, 2004
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual probe test structures for semiconductor integrated circuits
- Patent number 6,636,064
- Issue date Oct 21, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Stepper type test structures and methods for inspection of semicond...
- Patent number 6,633,174
- Issue date Oct 14, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous flooding and inspection for charge control in an elect...
- Patent number 6,627,884
- Issue date Sep 30, 2003
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,566,885
- Issue date May 20, 2003
- KLA Tencor
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,528,818
- Issue date Mar 4, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Continuous movement scans of test structures on semiconductor integ...
- Patent number 6,524,873
- Issue date Feb 25, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,087,659
- Issue date Jul 11, 2000
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 5,973,323
- Issue date Oct 26, 1999
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
- Publication number 20080237487
- Publication date Oct 2, 2008
- KLA-TENCOR
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple directional scans of test structures on semiconductor inte...
- Publication number 20050139767
- Publication date Jun 30, 2005
- KLA-TENCOR
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for secondary electron emission microscope
- Publication number 20030205669
- Publication date Nov 6, 2003
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple directional scans of test structures on srmiconductor inte...
- Publication number 20030155927
- Publication date Aug 21, 2003
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Test structures and methods for inspection of semiconductor integra...
- Publication number 20030096436
- Publication date May 22, 2003
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous flooding and inspection for charge control in an elect...
- Publication number 20020130260
- Publication date Sep 19, 2002
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for secondary electron emission microscope
- Publication number 20020104964
- Publication date Aug 8, 2002
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS

David Walker

Person

Patents Grantslast 30 patents

Multiple directional scans of test structures on semiconductor inte...

High-resolution, low-distortion and high-efficiency optical couplin...

Multiple directional scans of test structures on semiconductor inte...

Apparatus and method for secondary electron emission microscope

Test structures and methods for inspection of semiconductor integra...

Multiple directional scans of test structures on semiconductor inte...

Multi-pixel methods and apparatus for analysis of defect informatio...

Apparatus and method for secondary electron emission microscope

Dual probe test structures for semiconductor integrated circuits

Stepper type test structures and methods for inspection of semicond...

Simultaneous flooding and inspection for charge control in an elect...

Multiple directional scans of test structures on semiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Continuous movement scans of test structures on semiconductor integ...

Apparatus and method for secondary electron emission microscope

Apparatus and method for secondary electron emission microscope

Patents Applicationslast 30 patents

TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...

MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...

Multiple directional scans of test structures on semiconductor inte...

Apparatus and method for secondary electron emission microscope

Multiple directional scans of test structures on srmiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Simultaneous flooding and inspection for charge control in an elect...

Apparatus and method for secondary electron emission microscope