Donald L. Wollesen

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Trenched gate non-volatile semiconductor method with the source/dra...
- Patent number 6,764,904
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-uniform gate/dielectric field effect transistor
- Patent number 6,744,101
- Issue date Jun 1, 2004
- Advanced Micro Devices, Inc.
- Wei Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trenched gate metal oxide semiconductor device and method
- Patent number 6,667,227
- Issue date Dec 23, 2003
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for profiling semiconductor device junctions using a voltage...
- Patent number 6,664,797
- Issue date Dec 16, 2003
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- G01 - MEASURING TESTING
Information Patent Grant
Silicon oxide insulator (SOI) semiconductor having selectively link...
- Patent number 6,627,952
- Issue date Sep 30, 2003
- Advanced Micro Devices, Inc.
- Donald Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin oxide anti-fuse
- Patent number 6,515,344
- Issue date Feb 4, 2003
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leaky lower interface for reduction of floating body effect in SOI...
- Patent number 6,417,030
- Issue date Jul 9, 2002
- Advanced Micro Devices, Inc.
- Matthew S. Buynoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Junction profiling using a scanning voltage micrograph
- Patent number 6,395,437
- Issue date May 28, 2002
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the robustness of memory cells...
- Patent number 6,348,356
- Issue date Feb 19, 2002
- Advanced Micro Devices, Inc.
- Sunil Narayan Shabde
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for fabricating a trench-gated vertical CMOS device
- Patent number 6,309,919
- Issue date Oct 30, 2001
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trenched gate non-volatile semiconductor device with the source/dra...
- Patent number 6,285,054
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling the thickness of a gate oxide...
- Patent number 6,271,151
- Issue date Aug 7, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for manufacturing asymmetric channel transistor
- Patent number 6,242,329
- Issue date Jun 5, 2001
- Advanced Micro Devices, Inc.
- Carl Robert Huster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leaky lower interface for reduction of floating body effect in SOI...
- Patent number 6,225,667
- Issue date May 1, 2001
- Advanced Micro Devices, Inc.
- Matthew S. Buynoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-uniform gate/dielectric field effect transistor
- Patent number 6,225,669
- Issue date May 1, 2001
- Advanced Micro Devices, Inc.
- Wei Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fully recessed semiconductor method for low power applications with...
- Patent number 6,225,161
- Issue date May 1, 2001
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon-on-insulator configuration which is compatible with bulk CM...
- Patent number 6,215,155
- Issue date Apr 10, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining the robustness of memory cells...
- Patent number 6,204,516
- Issue date Mar 20, 2001
- Advanced Micro Devices, Inc.
- Sunil Narayan Shabde
- G11 - INFORMATION STORAGE
Information Patent Grant
Field effect transistor with controlled body bias
- Patent number 6,201,761
- Issue date Mar 13, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for controlling the thickness of a gate oxide...
- Patent number 6,187,092
- Issue date Feb 13, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- C30 - CRYSTAL GROWTH
Information Patent Grant
On-chip transformers
- Patent number 6,188,306
- Issue date Feb 13, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench-gated vertical combination JFET and MOSFET devices
- Patent number 6,163,052
- Issue date Dec 19, 2000
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short channel non-self aligned VMOS field effect transistor
- Patent number 6,150,693
- Issue date Nov 21, 2000
- Advanced Micro Devices
- Donald L. Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fully recessed semiconductor device and method for low power applic...
- Patent number 6,147,378
- Issue date Nov 14, 2000
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low capacitance interconnection
- Patent number 6,146,985
- Issue date Nov 14, 2000
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming asymmetrically doped source/drain regions
- Patent number 6,140,186
- Issue date Oct 31, 2000
- Advanced Micro Devices, Inc.
- Ming-Ren Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile trench semiconductor device having a shallow drain region
- Patent number 6,124,608
- Issue date Sep 26, 2000
- Advanced Micro Devices, Inc.
- Yowjuang William Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trenched gate metal oxide semiconductor device and method
- Patent number 6,097,061
- Issue date Aug 1, 2000
- Advanced Micro Devices, Inc.
- Yowjuang W. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside silicon removal for face down chip analysis
- Patent number 6,093,331
- Issue date Jul 25, 2000
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- G01 - MEASURING TESTING
Information Patent Grant
Silicon oxide insulator (SOI) semiconductor having selectively link...
- Patent number 6,020,222
- Issue date Feb 1, 2000
- Advanced Micro Devices, Inc.
- Donald Wollesen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for controlling the thickness of a gate oxide...
- Publication number 20010042509
- Publication date Nov 22, 2001
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- C30 - CRYSTAL GROWTH
Information Patent Application
Non-uniform gate/dielectric field effect transistor
- Publication number 20010017390
- Publication date Aug 30, 2001
- Wei Long
- H01 - BASIC ELECTRIC ELEMENTS

Donald L. Wollesen

Person

Patents Grantslast 30 patents

Trenched gate non-volatile semiconductor method with the source/dra...

Non-uniform gate/dielectric field effect transistor

Trenched gate metal oxide semiconductor device and method

Method for profiling semiconductor device junctions using a voltage...

Silicon oxide insulator (SOI) semiconductor having selectively link...

Thin oxide anti-fuse

Leaky lower interface for reduction of floating body effect in SOI...

Junction profiling using a scanning voltage micrograph

Method and apparatus for determining the robustness of memory cells...

Method for fabricating a trench-gated vertical CMOS device

Trenched gate non-volatile semiconductor device with the source/dra...

Method and apparatus for controlling the thickness of a gate oxide...

Method for manufacturing asymmetric channel transistor

Leaky lower interface for reduction of floating body effect in SOI...

Non-uniform gate/dielectric field effect transistor

Fully recessed semiconductor method for low power applications with...

Silicon-on-insulator configuration which is compatible with bulk CM...

Method and apparatus for determining the robustness of memory cells...

Field effect transistor with controlled body bias

Method and apparatus for controlling the thickness of a gate oxide...

On-chip transformers

Trench-gated vertical combination JFET and MOSFET devices

Short channel non-self aligned VMOS field effect transistor

Fully recessed semiconductor device and method for low power applic...

Low capacitance interconnection

Method of forming asymmetrically doped source/drain regions

Non-volatile trench semiconductor device having a shallow drain region

Trenched gate metal oxide semiconductor device and method

Backside silicon removal for face down chip analysis

Silicon oxide insulator (SOI) semiconductor having selectively link...

Patents Applicationslast 30 patents

Method and apparatus for controlling the thickness of a gate oxide...

Non-uniform gate/dielectric field effect transistor