Eric W. Strid

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
High frequency interconnect structures, electronic assemblies that...
- Patent number 9,372,214
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 9,099,449
- Issue date Aug 4, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 8,970,240
- Issue date Mar 3, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneous optical testing of a plurality...
- Patent number 8,823,406
- Issue date Sep 2, 2014
- Cascade Micotech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal probing system
- Patent number 7,764,072
- Issue date Jul 27, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Active wafer probe
- Patent number 7,759,953
- Issue date Jul 20, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Calibration structures for differential signal probing
- Patent number 7,723,999
- Issue date May 25, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal probe with integral balun
- Patent number 7,609,077
- Issue date Oct 27, 2009
- Cascade Microtech, Inc.
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,518,387
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,489,149
- Issue date Feb 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,482,823
- Issue date Jan 27, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
On-wafer test structures for differential signals
- Patent number 7,443,186
- Issue date Oct 28, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe with low contact resistance for testing a device und...
- Patent number 7,436,194
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Active wafer probe
- Patent number 7,427,868
- Issue date Sep 23, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 7,321,233
- Issue date Jan 22, 2008
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for high-frequency testing of a device under test
- Patent number 7,304,488
- Issue date Dec 4, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 7,164,279
- Issue date Jan 16, 2007
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,161,363
- Issue date Jan 9, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 6,987,398
- Issue date Jan 17, 2006
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 6,815,963
- Issue date Nov 9, 2004
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect assembly for use in evaluating probing networks
- Patent number 6,803,779
- Issue date Oct 12, 2004
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Reference transmission line junction for probing device
- Patent number 6,608,496
- Issue date Aug 19, 2003
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 6,130,544
- Issue date Oct 10, 2000
- Cascade Microtech, Inc.
- Eric W. Strid
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for evaluating probing networks
- Patent number 5,973,505
- Issue date Oct 26, 1999
- Cascade Microtech, Inc.
- Eric W. Strid
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for evaluating probing networks that have multiple probing ends
- Patent number 5,869,975
- Issue date Feb 9, 1999
- Cascade Microtech, Inc.
- Eric W. Strid
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of evaluating signal conditions in a probe measurement netwo...
- Patent number 5,659,255
- Issue date Aug 19, 1997
- Cascade Microtech, Inc.
- Eric W. Strid
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coaxial wafer probe with tip shielding
- Patent number 5,565,788
- Issue date Oct 15, 1996
- Cascade Microtech, Inc.
- Jeremy Burr
- G01 - MEASURING TESTING
Information Patent Grant
System for evaluating probing networks
- Patent number 5,561,377
- Issue date Oct 1, 1996
- Cascade Microtech, Inc.
- Eric W. Strid
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Noise parameter test apparatus
- Patent number 5,068,615
- Issue date Nov 26, 1991
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Verification and correction method for an error model for a measure...
- Patent number 5,047,725
- Issue date Sep 10, 1991
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150301082
- Publication date Oct 22, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150114925
- Publication date Apr 30, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELEC...
- Publication number 20130183898
- Publication date Jul 18, 2013
- Cascade Microtech, Inc.
- Eric W. Strid
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...
- Publication number 20130015871
- Publication date Jan 17, 2013
- Cascade Microtech, Inc.
- Tim Cleary
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...
- Publication number 20120306587
- Publication date Dec 6, 2012
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20120112779
- Publication date May 10, 2012
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...
- Publication number 20120098559
- Publication date Apr 26, 2012
- Cascade Microtech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SIGNAL PROBING SYSTEM
- Publication number 20100264948
- Publication date Oct 21, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE WAFER PROBE
- Publication number 20100253377
- Publication date Oct 7, 2010
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Calibration technique
- Publication number 20100001742
- Publication date Jan 7, 2010
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
On-wafer test structures
- Publication number 20090021273
- Publication date Jan 22, 2009
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Active wafer probe
- Publication number 20080309358
- Publication date Dec 18, 2008
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054929
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054923
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080048692
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080024149
- Publication date Jan 31, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Differential signal probe with integral balun
- Publication number 20080012591
- Publication date Jan 17, 2008
- Richard Campbell
- G01 - MEASURING TESTING
Information Patent Application
On-wafer test structures
- Publication number 20070285112
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Differential signal probing system
- Publication number 20070285085
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
Calibration structures for differential signal probing
- Publication number 20070285107
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20070109001
- Publication date May 17, 2007
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070075716
- Publication date Apr 5, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20060103403
- Publication date May 18, 2006
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Active wafer probe
- Publication number 20050140386
- Publication date Jun 30, 2005
- Eric Strid
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20050040837
- Publication date Feb 24, 2005
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040232927
- Publication date Nov 25, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040004491
- Publication date Jan 8, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
System for evaluating probing networks
- Publication number 20030210033
- Publication date Nov 13, 2003
- Eric W. Strid
- G01 - MEASURING TESTING

Eric W. Strid

Person

Patents Grantslast 30 patents

High frequency interconnect structures, electronic assemblies that...

Resilient electrical interposers, systems that include the interpos...

Resilient electrical interposers, systems that include the interpos...

Systems and methods for simultaneous optical testing of a plurality...

Differential signal probing system

Active wafer probe

Calibration structures for differential signal probing

Differential signal probe with integral balun

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

On-wafer test structures for differential signals

Shielded probe with low contact resistance for testing a device und...

Active wafer probe

System for evaluating probing networks

Shielded probe for high-frequency testing of a device under test

System for evaluating probing networks

Probe for testing a device under test

System for evaluating probing networks

Probe for testing a device under test

Interconnect assembly for use in evaluating probing networks

Reference transmission line junction for probing device

System for evaluating probing networks

System for evaluating probing networks

System for evaluating probing networks that have multiple probing ends

Method of evaluating signal conditions in a probe measurement netwo...

Coaxial wafer probe with tip shielding

System for evaluating probing networks

Noise parameter test apparatus

Verification and correction method for an error model for a measure...

Patents Applicationslast 30 patents

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELEC...

SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...

HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT...

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...

DIFFERENTIAL SIGNAL PROBING SYSTEM

ACTIVE WAFER PROBE

Calibration technique

On-wafer test structures

Active wafer probe

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Differential signal probe with integral balun

On-wafer test structures

Differential signal probing system

Calibration structures for differential signal probing

System for evaluating probing networks

Probe for testing a device under test

System for evaluating probing networks

Active wafer probe

System for evaluating probing networks

Probe for testing a device under test

Probe for testing a device under test

System for evaluating probing networks