Gregory F. Taylor

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self-calibrated thermal sensors of an integrated circuit die
- Patent number 10,247,624
- Issue date Apr 2, 2019
- Intel Corporation
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to reduce memory power consumption by invertin...
- Patent number 9,720,484
- Issue date Aug 1, 2017
- Intel Corporation
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-calibrated thermal sensors of an integrated circuit die
- Patent number 9,702,769
- Issue date Jul 11, 2017
- Intel Corporation
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Grant
Self-calibrated thermal sensors of an integrated circuit die
- Patent number 9,470,586
- Issue date Oct 18, 2016
- Intel Corporation
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Grant
Thermal sensor device
- Patent number 9,121,768
- Issue date Sep 1, 2015
- Intel Corporation
- Arijit Raychowdhury
- G01 - MEASURING TESTING
Information Patent Grant
Memory data inversion for reducing power consumption
- Patent number 9,015,507
- Issue date Apr 21, 2015
- Intel Corporation
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal sensor using a vibrating MEMS resonator of a chip interconn...
- Patent number 8,827,550
- Issue date Sep 9, 2014
- Intel Corporation
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Grant
Data inversion based approaches for reducing memory power consumption
- Patent number 8,589,706
- Issue date Nov 19, 2013
- Intel Corporation
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fuse programming schemes for robust yield
- Patent number 8,331,186
- Issue date Dec 11, 2012
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die digital-to-analog conversion testing
- Patent number 8,314,725
- Issue date Nov 20, 2012
- Intel Corporation
- Paola Zepeda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Thermal sensor device
- Patent number 8,096,707
- Issue date Jan 17, 2012
- Intel Corporation
- Arijit Raychowdhury
- G01 - MEASURING TESTING
Information Patent Grant
Fuse programming schemes for robust yield
- Patent number 7,889,587
- Issue date Feb 15, 2011
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse cell array with redundancy features
- Patent number 7,602,663
- Issue date Oct 13, 2009
- Intel Corporation
- Zhanping Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip frequency degradation compensation
- Patent number 7,501,845
- Issue date Mar 10, 2009
- Intel Corporation
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring threshold voltage of transistors in a circuit
- Patent number 7,471,102
- Issue date Dec 30, 2008
- Intel Corporation
- Atul Maheshwari
- G01 - MEASURING TESTING
Information Patent Grant
On-die offset reference circuit block
- Patent number 7,417,459
- Issue date Aug 26, 2008
- Intel Corporation
- Timothy M. Wilson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip frequency degradation compensation
- Patent number 7,394,274
- Issue date Jul 1, 2008
- Intel Corporation
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 7,348,790
- Issue date Mar 25, 2008
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
On-chip frequency degradation compensation
- Patent number 7,282,937
- Issue date Oct 16, 2007
- Intel Corporation
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage control for clock generating circuit
- Patent number 7,242,261
- Issue date Jul 10, 2007
- Intel Corporation
- Keng L. Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arrangements having IC voltage and thermal resistance designated on...
- Patent number 7,233,162
- Issue date Jun 19, 2007
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase locked loop system capable of deskewing
- Patent number 7,199,624
- Issue date Apr 3, 2007
- Intel Corporation
- Keng L. Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for on-die voltage fluctuation detection
- Patent number 7,157,924
- Issue date Jan 2, 2007
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Grant
Resonance reduction arrangements
- Patent number 7,143,381
- Issue date Nov 28, 2006
- Intel Corporation
- Cangsang Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing arrangement to distribute integrated circuits
- Patent number 7,112,979
- Issue date Sep 26, 2006
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arrangements having IC voltage and thermal resistance designated on...
- Patent number 7,109,737
- Issue date Sep 19, 2006
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power-on detect circuit for use with multiple voltage domains
- Patent number 7,049,865
- Issue date May 23, 2006
- Intel Corporation
- Rachael J. Parker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Closed-loop independent DLL-controlled rise/fall time control circuit
- Patent number 7,038,513
- Issue date May 2, 2006
- Intel Corporation
- Timothy M. Wilson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Closed-loop independent DLL-controlled rise/fall time control circuit
- Patent number 7,038,512
- Issue date May 2, 2006
- Intel Corporation
- Timothy M Wilson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock generating circuit and method
- Patent number 6,985,041
- Issue date Jan 10, 2006
- Intel Corporation
- Keng L. Wong
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SELF-CALIBRATED THERMAL SENSORS OF AN INTEGRATED CIRCUIT DIE
- Publication number 20170038265
- Publication date Feb 9, 2017
- Intel Corporation
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Application
DATA INVERSION BASED APPROACHES FOR REDUCING MEMORY POWER CONSUMPTION
- Publication number 20150192977
- Publication date Jul 9, 2015
- Intel Corporation
- Ming ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-CALIBRATED THERMAL SENSORS OF AN INTEGRATED CIRCUIT DIE
- Publication number 20140365156
- Publication date Dec 11, 2014
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Application
DATA INVERSION BASED APPROACHES FOR REDUCING MEMORY POWER CONSUMPTION
- Publication number 20140032827
- Publication date Jan 30, 2014
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL SENSOR DEVICE
- Publication number 20120087390
- Publication date Apr 12, 2012
- Intel Corporation
- Arijit RAYCHOWDHURY
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE DIGITAL-TO-ANALOG CONVERSION TESTING
- Publication number 20120062401
- Publication date Mar 15, 2012
- Paola ZEPEDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THERMAL SENSOR USING A VIBRATING MEMS RESONATOR OF A CHIP INTERCONN...
- Publication number 20110150031
- Publication date Jun 23, 2011
- Mohamed A. Abdelmoneum
- G01 - MEASURING TESTING
Information Patent Application
NOVEL FUSE PROGRAMMING SCHEMES FOR ROBUST YIELD
- Publication number 20110103170
- Publication date May 5, 2011
- Intel Corporation
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Application
Thermal Sensor Device
- Publication number 20090323763
- Publication date Dec 31, 2009
- Arijit Raychowdhury
- G01 - MEASURING TESTING
Information Patent Application
High voltage compliant apparatus for semiconductor fabrication proc...
- Publication number 20090323235
- Publication date Dec 31, 2009
- Sangwoo Pae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM-DRIVEN TECHNIQUES TO REDUCE MEMORY OPERATING VOLTAGE
- Publication number 20090172449
- Publication date Jul 2, 2009
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE MEMORY ARRAY VOLTAGE ADJUSTMENT
- Publication number 20090168573
- Publication date Jul 2, 2009
- Ming Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Noise accommodating information storing apparatus
- Publication number 20090003111
- Publication date Jan 1, 2009
- Ming Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
On-chip frequency degradation compensation
- Publication number 20080252329
- Publication date Oct 16, 2008
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring threshold voltage of transistors in a circuit
- Publication number 20080204156
- Publication date Aug 28, 2008
- Atul Maheshwari
- G01 - MEASURING TESTING
Information Patent Application
Fuse cell array with redundancy features
- Publication number 20080151593
- Publication date Jun 26, 2008
- Zhanping Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Novel fuse programming schemes for robust yield
- Publication number 20080136496
- Publication date Jun 12, 2008
- Jun He
- G11 - INFORMATION STORAGE
Information Patent Application
On-chip frequency degradation compensation
- Publication number 20070257697
- Publication date Nov 8, 2007
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Shared sense amplifier for fuse cell
- Publication number 20070217247
- Publication date Sep 20, 2007
- Zhanping Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Adjusting input output timing
- Publication number 20070157049
- Publication date Jul 5, 2007
- Songmin Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-die offset reference circuit block
- Publication number 20060239051
- Publication date Oct 26, 2006
- Intel Corporation
- Timothy M. Wilson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20060033522
- Publication date Feb 16, 2006
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Closed-loop independent DLL-controlled rise/fall time control circuit
- Publication number 20050285647
- Publication date Dec 29, 2005
- Intel Corporation
- Timothy M. Wilson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Closed-loop independent DLL-controlled rise/fall time control circuit
- Publication number 20050285648
- Publication date Dec 29, 2005
- Intel Corporation
- Timothy M. Wilson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Arrangements having IC voltage and thermal resistance designated on...
- Publication number 20050247605
- Publication date Nov 10, 2005
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Power-on detect circuit for use with multiple voltage domains
- Publication number 20050195000
- Publication date Sep 8, 2005
- Rachael J. Parker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
On-chip frequency degradation compensation
- Publication number 20050140418
- Publication date Jun 30, 2005
- Ravisangar Muniandy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE DELAY ELEMENT FOR USE IN DELAY TUNING OF INTEGRATED CIRCUITS
- Publication number 20050001668
- Publication date Jan 6, 2005
- Ravishankar Kuppuswamy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20040246017
- Publication date Dec 9, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Arrangements having IC voltage and thermal resistance designated on...
- Publication number 20040224430
- Publication date Nov 11, 2004
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING

Gregory F. Taylor

Person

Patents Grantslast 30 patents

Self-calibrated thermal sensors of an integrated circuit die

Apparatus and method to reduce memory power consumption by invertin...

Self-calibrated thermal sensors of an integrated circuit die

Self-calibrated thermal sensors of an integrated circuit die

Thermal sensor device

Memory data inversion for reducing power consumption

Thermal sensor using a vibrating MEMS resonator of a chip interconn...

Data inversion based approaches for reducing memory power consumption

Fuse programming schemes for robust yield

On-die digital-to-analog conversion testing

Thermal sensor device

Fuse programming schemes for robust yield

Fuse cell array with redundancy features

On-chip frequency degradation compensation

Measuring threshold voltage of transistors in a circuit

On-die offset reference circuit block

On-chip frequency degradation compensation

AC testing of leakage current in integrated circuits using RC time...

On-chip frequency degradation compensation

Voltage control for clock generating circuit

Arrangements having IC voltage and thermal resistance designated on...

Phase locked loop system capable of deskewing

Method and apparatus for on-die voltage fluctuation detection

Resonance reduction arrangements

Testing arrangement to distribute integrated circuits

Arrangements having IC voltage and thermal resistance designated on...

Power-on detect circuit for use with multiple voltage domains

Closed-loop independent DLL-controlled rise/fall time control circuit

Closed-loop independent DLL-controlled rise/fall time control circuit

Clock generating circuit and method

Patents Applicationslast 30 patents

SELF-CALIBRATED THERMAL SENSORS OF AN INTEGRATED CIRCUIT DIE

DATA INVERSION BASED APPROACHES FOR REDUCING MEMORY POWER CONSUMPTION

SELF-CALIBRATED THERMAL SENSORS OF AN INTEGRATED CIRCUIT DIE

DATA INVERSION BASED APPROACHES FOR REDUCING MEMORY POWER CONSUMPTION

THERMAL SENSOR DEVICE

ON-DIE DIGITAL-TO-ANALOG CONVERSION TESTING

THERMAL SENSOR USING A VIBRATING MEMS RESONATOR OF A CHIP INTERCONN...

NOVEL FUSE PROGRAMMING SCHEMES FOR ROBUST YIELD

Thermal Sensor Device

High voltage compliant apparatus for semiconductor fabrication proc...

SYSTEM-DRIVEN TECHNIQUES TO REDUCE MEMORY OPERATING VOLTAGE

ADAPTIVE MEMORY ARRAY VOLTAGE ADJUSTMENT

Noise accommodating information storing apparatus

On-chip frequency degradation compensation

Measuring threshold voltage of transistors in a circuit

Fuse cell array with redundancy features

Novel fuse programming schemes for robust yield

On-chip frequency degradation compensation

Shared sense amplifier for fuse cell

Adjusting input output timing

On-die offset reference circuit block

AC testing of leakage current in integrated circuits using RC time...

Closed-loop independent DLL-controlled rise/fall time control circuit

Closed-loop independent DLL-controlled rise/fall time control circuit

Arrangements having IC voltage and thermal resistance designated on...

Power-on detect circuit for use with multiple voltage domains

On-chip frequency degradation compensation

VARIABLE DELAY ELEMENT FOR USE IN DELAY TUNING OF INTEGRATED CIRCUITS

AC testing of leakage current in integrated circuits using RC time...

Arrangements having IC voltage and thermal resistance designated on...