Gustavo A. Pinto

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for increasing productivity of combinatorial scre...
- Patent number 8,772,772
- Issue date Jul 8, 2014
- Intermolecular, Inc.
- Kurt H. Weiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,656,170
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical polishing test structures and methods for inspe...
- Patent number 7,655,482
- Issue date Feb 2, 2010
- KLA Tencor
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical polishing test structures and methods for inspe...
- Patent number 7,179,661
- Issue date Feb 20, 2007
- KLA Tencor
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,012,439
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Media servowriting system
- Patent number 6,977,791
- Issue date Dec 20, 2005
- KLA-Tencor Technologies Corporation
- Jun Zhu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,921,672
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,867,606
- Issue date Mar 15, 2005
- KLA-Tencor Technologies, Inc.
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Stepper type test structures and methods for inspection of semicond...
- Patent number 6,633,174
- Issue date Oct 14, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,576,923
- Issue date Jun 10, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,566,885
- Issue date May 20, 2003
- KLA Tencor
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,528,818
- Issue date Mar 4, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,509,197
- Issue date Jan 21, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for generating spatially resolved voltage con...
- Patent number 6,445,199
- Issue date Sep 3, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimizing semiconductor inspection tools
- Patent number 6,433,561
- Issue date Aug 13, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Increasing Productivity of Combinatorial Scre...
- Publication number 20140315332
- Publication date Oct 23, 2014
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
- Publication number 20080237487
- Publication date Oct 2, 2008
- KLA-TENCOR
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Increasing Productivity of Combinatorial Scre...
- Publication number 20070267631
- Publication date Nov 22, 2007
- Intermolecular, Inc.
- Kurt H. Weiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR COMBINATORIALLY VARYING MATERIALS, UNIT PR...
- Publication number 20070202610
- Publication date Aug 30, 2007
- Tony P. Chiang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR COMBINATORIALLY VARYING MATERIALS, UNIT PR...
- Publication number 20070202614
- Publication date Aug 30, 2007
- Tony P. Chiang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHEMICAL MECHANICAL POLISHING TEST STRUCTURES AND METHODS FOR INSPE...
- Publication number 20070111342
- Publication date May 17, 2007
- KLA-TENCOR
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material management in substrate processing
- Publication number 20060292846
- Publication date Dec 28, 2006
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Media servowriting system
- Publication number 20060119977
- Publication date Jun 8, 2006
- Jun Zhu
- G11 - INFORMATION STORAGE
Information Patent Application
Multiple directional scans of test structures on semiconductor inte...
- Publication number 20050139767
- Publication date Jun 30, 2005
- KLA-TENCOR
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Media servowriting system
- Publication number 20040125488
- Publication date Jul 1, 2004
- Jun Zhu
- G11 - INFORMATION STORAGE
Information Patent Application
Multiple directional scans of test structures on srmiconductor inte...
- Publication number 20030155927
- Publication date Aug 21, 2003
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Test structures and methods for inspection of semiconductor integra...
- Publication number 20030096436
- Publication date May 22, 2003
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Inspectable buried test structures and methods for inspecting the same
- Publication number 20020187582
- Publication date Dec 12, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS

Gustavo A. Pinto

Person

Patents Grantslast 30 patents

System and method for increasing productivity of combinatorial scre...

Multiple directional scans of test structures on semiconductor inte...

Chemical mechanical polishing test structures and methods for inspe...

Chemical mechanical polishing test structures and methods for inspe...

Multiple directional scans of test structures on semiconductor inte...

Media servowriting system

Test structures and methods for inspection of semiconductor integra...

Multiple directional scans of test structures on semiconductor inte...

Stepper type test structures and methods for inspection of semicond...

Inspectable buried test structures and methods for inspecting the same

Multiple directional scans of test structures on semiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Inspectable buried test structures and methods for inspecting the same

Methods and apparatus for generating spatially resolved voltage con...

Methods and apparatus for optimizing semiconductor inspection tools

Patents Applicationslast 30 patents

System and Method for Increasing Productivity of Combinatorial Scre...

TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...

MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...

System and Method for Increasing Productivity of Combinatorial Scre...

METHOD AND APPARATUS FOR COMBINATORIALLY VARYING MATERIALS, UNIT PR...

METHOD AND APPARATUS FOR COMBINATORIALLY VARYING MATERIALS, UNIT PR...

CHEMICAL MECHANICAL POLISHING TEST STRUCTURES AND METHODS FOR INSPE...

Material management in substrate processing

Media servowriting system

Multiple directional scans of test structures on semiconductor inte...

Media servowriting system

Multiple directional scans of test structures on srmiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Inspectable buried test structures and methods for inspecting the same