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Heiji Kobayashi
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Hyogo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of manufacturing semiconductor device capable of suppressing...
Patent number
7,691,713
Issue date
Apr 6, 2010
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device capable of suppressing...
Patent number
7,244,655
Issue date
Jul 17, 2007
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device capable of suppressing...
Patent number
6,998,319
Issue date
Feb 14, 2006
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
6,864,580
Issue date
Mar 8, 2005
Renesas Technology Corp.
Shoichiro Nakazawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating a semiconductor device with a passivation film
Patent number
6,815,265
Issue date
Nov 9, 2004
Renesas Technology Corp.
Shinya Nakatani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
6,483,192
Issue date
Nov 19, 2002
Mitsubishi Denki Kabushiki Kiahsa
Heiji Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
6,229,172
Issue date
May 8, 2001
Mitsubishi Denki Kabushiki Kaisha
Heiji Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
6,215,187
Issue date
Apr 10, 2001
Mitsubishi Denki Kabushiki Kaisha
Kenichi Ooto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device with retrograde wells
Patent number
5,478,759
Issue date
Dec 26, 1995
Mitsubishi Denki Kabushiki Kaisha
Tomoharu Mametani
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE CAPABLE OF SUPPRESSING...
Publication number
20100190306
Publication date
Jul 29, 2010
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE CAPABLE OF SUPPRESSING...
Publication number
20070243687
Publication date
Oct 18, 2007
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device capable of suppressing...
Publication number
20060079061
Publication date
Apr 13, 2006
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device capable of suppressing...
Publication number
20040235255
Publication date
Nov 25, 2004
Renesas Technology Corp.
Yoshinori Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor chip mounting wafer
Publication number
20030160303
Publication date
Aug 28, 2003
Mitsubishi Denki Kabushiki Kaisha,
Taichi Hirokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of fabricating the same
Publication number
20030146514
Publication date
Aug 7, 2003
Mitsubishi Denki Kabushiki Kaisha And Ryoden Semiconductor System Engineering...
Shinya Nakatani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and fabrication process therefor
Publication number
20030073280
Publication date
Apr 17, 2003
Mitsubishi Denki Kabushiki Kaisha
Heiji Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device and semiconductor device
Publication number
20030008499
Publication date
Jan 9, 2003
Mitsubishi Denki Kabushiki Kaisha
Heiji Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test system and test method of semiconductor device
Publication number
20020109522
Publication date
Aug 15, 2002
Mitsubishi Denki Kabushiki Kaisha
Heiji Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and method of manufacturing the same
Publication number
20020096769
Publication date
Jul 25, 2002
MITSUBISHI DENKI KABUSHIKI KAISHA, AND RYODEN SEMICONDUCTOR SYSTEM ENGINEERIN...
Shoichiro Nakazawa
H01 - BASIC ELECTRIC ELEMENTS