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Jeffrey A. Kash
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Pleasantville, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Photonic modulator with forward-and reverse-biased diodes for separ...
Patent number
8,805,126
Issue date
Aug 12, 2014
International Business Machines Corporation
Benjamin G. Lee
G02 - OPTICS
Information
Patent Grant
Method and apparatus for implementing non-blocking computer interco...
Patent number
8,121,478
Issue date
Feb 21, 2012
International Business Machines Corporation
Jeffrey Alan Kash
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
Patent number
7,883,277
Issue date
Feb 8, 2011
International Business Machines Corporation
Russell A. Budd
G02 - OPTICS
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
7,791,087
Issue date
Sep 7, 2010
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
7,791,086
Issue date
Sep 7, 2010
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
7,781,782
Issue date
Aug 24, 2010
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Method for defeating reverse engineering of integrated circuits by...
Patent number
7,612,382
Issue date
Nov 3, 2009
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
Patent number
7,474,815
Issue date
Jan 6, 2009
International Business Machines Corporation
Russell A. Budd
G02 - OPTICS
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
7,399,992
Issue date
Jul 15, 2008
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
7,115,912
Issue date
Oct 3, 2006
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Silicon carrier for optical interconnect modules
Patent number
7,058,247
Issue date
Jun 6, 2006
International Business Machines Corporation
John D. Crow
G02 - OPTICS
Information
Patent Grant
Redundant configurable VCSEL laser array optical light source
Patent number
6,821,026
Issue date
Nov 23, 2004
International Business Machines Corporation
William T. Devine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Noninvasive optical method and system for inspecting or testing CMO...
Patent number
6,774,647
Issue date
Aug 10, 2004
International Business Machines Corporation
Jeffrey Alan Kash
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit device defect detection method and apparatus emp...
Patent number
6,650,130
Issue date
Nov 18, 2003
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
Patent number
6,650,768
Issue date
Nov 18, 2003
International Business Machines Corporation
Richard James Evans
G01 - MEASURING TESTING
Information
Patent Grant
Device for defeating reverse engineering of integrated circuits by...
Patent number
6,515,304
Issue date
Feb 4, 2003
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reverse engineering integrated circuits by...
Patent number
6,496,022
Issue date
Dec 17, 2002
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Time correlated photon counting
Patent number
6,342,701
Issue date
Jan 29, 2002
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for deriving temporal delays in integrated cir...
Patent number
6,327,394
Issue date
Dec 4, 2001
International Business Machines Corporation
Jeffrey Alan Kash
G01 - MEASURING TESTING
Information
Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
Patent number
6,304,668
Issue date
Oct 16, 2001
International Business Machines Corporation
Richard James Evans
Information
Patent Grant
Image processing methods for the optical detection of dynamic error...
Patent number
6,172,512
Issue date
Jan 9, 2001
International Business Machines Corporation
Richard James Evans
G01 - MEASURING TESTING
Information
Patent Grant
System and method for compressing and analyzing time-resolved optic...
Patent number
6,028,952
Issue date
Feb 22, 2000
International Business Machines Corporation
Jeffrey Alan Kash
G01 - MEASURING TESTING
Information
Patent Grant
Noninvasive optical method for measuring internal switching and oth...
Patent number
5,940,545
Issue date
Aug 17, 1999
International Business Machines Corporation
Jeffrey Alan Kash
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength-selective devices using silicon-on-insulator
Patent number
5,559,912
Issue date
Sep 24, 1996
International Business Machines Corporation
Farid Agahi
G02 - OPTICS
Information
Patent Grant
Asymmetric dual waveguide laser
Patent number
5,528,616
Issue date
Jun 18, 1996
International Business Machines Corporation
Jeffrey A. Kash
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tapered Fabry-Perot multi-wavelength optical source
Patent number
5,422,898
Issue date
Jun 6, 1995
International Business Machines Corporation
Jeffrey A. Kash
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tapered fabry-perot waveguide optical demultiplexer
Patent number
5,343,542
Issue date
Aug 30, 1994
International Business Machines Corporation
Jeffrey A. Kash
G02 - OPTICS
Information
Patent Grant
Full chip integrated circuit tester
Patent number
4,845,425
Issue date
Jul 4, 1989
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Full chip integrated circuit tester
Patent number
4,703,260
Issue date
Oct 27, 1987
International Business Machines Corporation
Johannes G. Beha
G01 - MEASURING TESTING
Information
Patent Grant
Textured crystal picosecond photoresponsive element
Patent number
4,626,883
Issue date
Dec 2, 1986
International Business Machines Corporation
Jeffrey A. Kash
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PHOTONIC MODULATOR WITH FORWARD-AND REVERSE-BIASED DIODES FOR SEPAR...
Publication number
20140050436
Publication date
Feb 20, 2014
International Business Machines Corporation
Benjamin G. Lee
G02 - OPTICS
Information
Patent Application
METHOD AND APPARATUS FOR IMPLEMENTING NON-BLOCKING COMPUTER INTERCO...
Publication number
20100239266
Publication date
Sep 23, 2010
JEFFREY ALAN KASH
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
Publication number
20100044724
Publication date
Feb 25, 2010
International Business Machines Corp.
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
Publication number
20100046756
Publication date
Feb 25, 2010
JEFFREY A. KASH
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
Publication number
20100044725
Publication date
Feb 25, 2010
International Business Machines Corp.
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY...
Publication number
20080252331
Publication date
Oct 16, 2008
International Business Machines Corp.
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Application
INTERCONNECTING (MAPPING) A TWO-DIMENSIONAL OPTOELECTRONIC (OE) DEV...
Publication number
20080205817
Publication date
Aug 28, 2008
International Business Machines Corporation
Russell A. Budd
G02 - OPTICS
Information
Patent Application
Interconnecting (mapping) a two-dimensional optoelectronic (OE) dev...
Publication number
20070217750
Publication date
Sep 20, 2007
International Business Machines Corporation
Russell A. Budd
G02 - OPTICS
Information
Patent Application
Device for defeating reverse engineering of integrated circuits by...
Publication number
20070030022
Publication date
Feb 8, 2007
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING
Information
Patent Application
Silicon carrier for optical interconnect modules
Publication number
20050135732
Publication date
Jun 23, 2005
International Business Machine Corporation
John D. Crow
G02 - OPTICS
Information
Patent Application
Redundant configurable VCSEL laser array optical light source
Publication number
20040042737
Publication date
Mar 4, 2004
International Business Machines Corporation
William T. Devine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Noninvasive optical method and system for inspecting or testing CMO...
Publication number
20030146768
Publication date
Aug 7, 2003
International Business Machines Corporation
Jeffrey Alan Kash
G01 - MEASURING TESTING
Information
Patent Application
Device for defeating reverse engineering of integrated circuits by...
Publication number
20030122138
Publication date
Jul 3, 2003
International Business Machines Corporation
Jeffrey A. Kash
G01 - MEASURING TESTING