Jerry D. McBride

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe interposers and methods of fabricating probe interposers
- Patent number 7,459,923
- Issue date Dec 2, 2008
- Micron Technology, Inc.
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Grant
System for storing device test information on a semiconductor devic...
- Patent number 7,194,667
- Issue date Mar 20, 2007
- Micron Technology, Inc.
- Jerry D. McBride
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for reducing test resources in testing DRAMs
- Patent number 7,168,018
- Issue date Jan 23, 2007
- Micron Technology, Inc.
- Chris Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for reducing test resources in testing DRAMS
- Patent number 6,986,084
- Issue date Jan 10, 2006
- Micron Technology, Inc.
- Chris Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for reducing test resources in testing Rambus...
- Patent number 6,854,079
- Issue date Feb 8, 2005
- Micron Technology, Inc.
- Chris Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for storing device test information on a semicond...
- Patent number 6,829,737
- Issue date Dec 7, 2004
- Micron Technology, Inc.
- Jerry D. McBride
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for testing rambus DRAMs
- Patent number 6,530,045
- Issue date Mar 4, 2003
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070245552
- Publication date Oct 25, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070236233
- Publication date Oct 11, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing test resources in testing drams
- Publication number 20070168790
- Publication date Jul 19, 2007
- Chris Cooper
- G01 - MEASURING TESTING
Information Patent Application
System for storing device test information on a semiconductor devic...
- Publication number 20060156136
- Publication date Jul 13, 2006
- Jerry D. McBride
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing test resources in testing DRAMs
- Publication number 20050262405
- Publication date Nov 24, 2005
- Chris Cooper
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing test resources in testing DRAMs
- Publication number 20040255211
- Publication date Dec 16, 2004
- Chris Cooper
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing test resources in testing DRAMS
- Publication number 20040233738
- Publication date Nov 25, 2004
- Chris Cooper
- G01 - MEASURING TESTING
Information Patent Application
System for storing device test information on a semiconductor devic...
- Publication number 20040181724
- Publication date Sep 16, 2004
- Jerry D. McBride
- G01 - MEASURING TESTING

Jerry D. McBride

Person

Patents Grantslast 30 patents

Probe interposers and methods of fabricating probe interposers

System for storing device test information on a semiconductor devic...

Apparatus and method for reducing test resources in testing DRAMs

Apparatus and method for reducing test resources in testing DRAMS

Apparatus and method for reducing test resources in testing Rambus...

Method and system for storing device test information on a semicond...

Apparatus and method for testing rambus DRAMs

Patents Applicationslast 30 patents

Probe interposers and methods of fabricating probe interposers

Probe interposers and methods of fabricating probe interposers

Apparatus and method for reducing test resources in testing drams

System for storing device test information on a semiconductor devic...

Apparatus and method for reducing test resources in testing DRAMs

Apparatus and method for reducing test resources in testing DRAMs

Apparatus and method for reducing test resources in testing DRAMS

System for storing device test information on a semiconductor devic...