Jerry Ihor TUSTANIWSKYJ

Person

Mission Viejo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment mechanism
- Patent number 12,140,625
- Issue date Nov 12, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit testing device with coupled control of thermal s...
- Patent number 12,000,884
- Issue date Jun 4, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Socket side thermal system
- Patent number 11,879,910
- Issue date Jan 23, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mechanism
- Patent number 11,802,908
- Issue date Oct 31, 2023
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control system including contactor assembly
- Patent number 11,774,486
- Issue date Oct 3, 2023
- DELTA DESIGN INC.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Assembly and sub-assembly for thermal control of electronic devices
- Patent number 11,039,528
- Issue date Jun 15, 2021
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Socket side thermal system
- Patent number 10,782,316
- Issue date Sep 22, 2020
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Leak tolerant liquid cooling system employing improved air purging...
- Patent number 10,770,317
- Issue date Sep 8, 2020
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-vision alignment system with guiding rings for IC testing
- Patent number 9,857,419
- Issue date Jan 2, 2018
- Delta Design, Inc.
- Kexiang Ken Ding
- G01 - MEASURING TESTING
Information Patent Grant
System and method for accelerating a device
- Patent number 9,733,151
- Issue date Aug 15, 2017
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mechanism
- Patent number 9,500,701
- Issue date Nov 22, 2016
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for accelerating a device
- Patent number 9,010,188
- Issue date Apr 21, 2015
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement using a diode with saturation current cance...
- Patent number 8,628,240
- Issue date Jan 14, 2014
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical assembly, for regulating the temperature of an IC-Chip,...
- Patent number 7,373,967
- Issue date May 20, 2008
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Dual feedback control system for maintaining the temperature of an...
- Patent number 7,199,597
- Issue date Apr 3, 2007
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Method of extending the operational period of a heat-exchanger in a...
- Patent number 7,004,243
- Issue date Feb 28, 2006
- Unisys Corporation
- James Wittman Babcock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control system which sprays liquid coolant droplets aga...
- Patent number 6,995,980
- Issue date Feb 7, 2006
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Chip tester having a heat-exchanger with an extendable period of op...
- Patent number 6,914,446
- Issue date Jul 5, 2005
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Method of regulating the temperature of integrated circuit modules,...
- Patent number 6,822,465
- Issue date Nov 23, 2004
- Unisys Corporation
- James Wittman Babcock
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Abrupt power change method of preventing an integrated circuit chip...
- Patent number 6,809,543
- Issue date Oct 26, 2004
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Initial contact method of preventing an integrated circuit chip fro...
- Patent number 6,774,661
- Issue date Aug 10, 2004
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a heat exchanger, for regulating the temperat...
- Patent number 6,658,736
- Issue date Dec 9, 2003
- Unisys Corporation
- James Wittman Babcock
- G01 - MEASURING TESTING
Information Patent Grant
Planar subassembly for testing IC chips having faces with pressed e...
- Patent number 6,522,156
- Issue date Feb 18, 2003
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
System for regulating the temperature of IC-chips with a fluid whic...
- Patent number 6,412,551
- Issue date Jul 2, 2002
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for regulating the temperature of IC-chips with a fluid whos...
- Patent number 6,362,944
- Issue date Mar 26, 2002
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus for testing IC chips using a sliding springy mechanism wh...
- Patent number 6,325,662
- Issue date Dec 4, 2001
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Pivoting springy mechanism that opens and closes pressed electrical...
- Patent number 6,307,391
- Issue date Oct 23, 2001
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Electromechanical apparatus for testing IC chips using first and se...
- Patent number 6,307,388
- Issue date Oct 23, 2001
- Unisys Corporation
- Lawrence William Friedrich
- G01 - MEASURING TESTING
Information Patent Grant
Residue-free method of assembling and disassembling a pressed joint...
- Patent number 6,243,944
- Issue date Jun 12, 2001
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanical assembly for regulating the temperature of an electronic...
- Patent number 6,196,299
- Issue date Mar 6, 2001
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT MECHANISM
- Publication number 20240061036
- Publication date Feb 22, 2024
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL SYSTEM INCLUDING CONTACTOR ASSEMBLY
- Publication number 20230003786
- Publication date Jan 5, 2023
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT TESTING DEVICE WITH COUPLED CONTROL OF THERMAL S...
- Publication number 20220206060
- Publication date Jun 30, 2022
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT MECHANISM
- Publication number 20210088579
- Publication date Mar 25, 2021
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET SIDE THERMAL SYSTEM
- Publication number 20210063436
- Publication date Mar 4, 2021
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLY AND SUB-ASSEMBLY FOR THERMAL CONTROL OF ELECTRONIC DEVICES
- Publication number 20200060019
- Publication date Feb 20, 2020
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ACTIVE THERMAL CONTROL HEAD HAVING ACTUATABLE COLD CAPACITOR
- Publication number 20180218926
- Publication date Aug 2, 2018
- Delta Design, Inc.
- Larry Stuckey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET SIDE THERMAL SYSTEM
- Publication number 20180196084
- Publication date Jul 12, 2018
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT MECHANISM
- Publication number 20170067960
- Publication date Mar 9, 2017
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS FLUIDIC THERMAL INTERFACE MATERIAL DISPENSING
- Publication number 20170027084
- Publication date Jan 26, 2017
- Delta Design, Inc.
- Samer KABBANI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LEAK TOLERANT LIQUID COOLING SYSTEM EMPLOYING IMPROVED AIR PURGING...
- Publication number 20160379852
- Publication date Dec 29, 2016
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ACCELERATING DEVICE
- Publication number 20150300911
- Publication date Oct 22, 2015
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
MICRO-VISION ALIGNMENT SYSTEM WITH GUIDING RINGS FOR IC TESTING
- Publication number 20150015286
- Publication date Jan 15, 2015
- Delta Design, Inc.
- Kexiang Ken DING
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ACCELERATING A DEVICE
- Publication number 20120103094
- Publication date May 3, 2012
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT MECHANISM
- Publication number 20110226442
- Publication date Sep 22, 2011
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT USING A DIODE WITH SATURATION CURRENT CANCE...
- Publication number 20110013670
- Publication date Jan 20, 2011
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- G01 - MEASURING TESTING
Information Patent Application
DUAL FEEDBACK CONTROL SYSTEM FOR MAINTAINING THE TEMPERATURE OF AN...
- Publication number 20070013394
- Publication date Jan 18, 2007
- UNISYS CORPORATION
- Jerry Ihor Tustaniwskyj
- G05 - CONTROLLING REGULATING
Information Patent Application
Planar subassembly for testing IC chips having faces with pressed e...
- Publication number 20020109519
- Publication date Aug 15, 2002
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING

Jerry Ihor TUSTANIWSKYJ

Person

Patents Grantslast 30 patents

Alignment mechanism

Integrated circuit testing device with coupled control of thermal s...

Socket side thermal system

Alignment mechanism

Temperature control system including contactor assembly

Assembly and sub-assembly for thermal control of electronic devices

Socket side thermal system

Leak tolerant liquid cooling system employing improved air purging...

Micro-vision alignment system with guiding rings for IC testing

System and method for accelerating a device

Alignment mechanism

System and method for accelerating a device

Temperature measurement using a diode with saturation current cance...

Mechanical assembly, for regulating the temperature of an IC-Chip,...

Dual feedback control system for maintaining the temperature of an...

Method of extending the operational period of a heat-exchanger in a...

Temperature control system which sprays liquid coolant droplets aga...

Chip tester having a heat-exchanger with an extendable period of op...

Method of regulating the temperature of integrated circuit modules,...

Abrupt power change method of preventing an integrated circuit chip...

Initial contact method of preventing an integrated circuit chip fro...

Method of fabricating a heat exchanger, for regulating the temperat...

Planar subassembly for testing IC chips having faces with pressed e...

System for regulating the temperature of IC-chips with a fluid whic...

System for regulating the temperature of IC-chips with a fluid whos...

Apparatus for testing IC chips using a sliding springy mechanism wh...

Pivoting springy mechanism that opens and closes pressed electrical...

Electromechanical apparatus for testing IC chips using first and se...

Residue-free method of assembling and disassembling a pressed joint...

Mechanical assembly for regulating the temperature of an electronic...

Patents Applicationslast 30 patents

ALIGNMENT MECHANISM

TEMPERATURE CONTROL SYSTEM INCLUDING CONTACTOR ASSEMBLY

INTEGRATED CIRCUIT TESTING DEVICE WITH COUPLED CONTROL OF THERMAL S...

ALIGNMENT MECHANISM

SOCKET SIDE THERMAL SYSTEM

ASSEMBLY AND SUB-ASSEMBLY FOR THERMAL CONTROL OF ELECTRONIC DEVICES

ACTIVE THERMAL CONTROL HEAD HAVING ACTUATABLE COLD CAPACITOR

SOCKET SIDE THERMAL SYSTEM

ALIGNMENT MECHANISM

CONTINUOUS FLUIDIC THERMAL INTERFACE MATERIAL DISPENSING

LEAK TOLERANT LIQUID COOLING SYSTEM EMPLOYING IMPROVED AIR PURGING...

SYSTEM AND METHOD FOR ACCELERATING DEVICE

MICRO-VISION ALIGNMENT SYSTEM WITH GUIDING RINGS FOR IC TESTING

SYSTEM AND METHOD FOR ACCELERATING A DEVICE

ALIGNMENT MECHANISM

TEMPERATURE MEASUREMENT USING A DIODE WITH SATURATION CURRENT CANCE...

DUAL FEEDBACK CONTROL SYSTEM FOR MAINTAINING THE TEMPERATURE OF AN...

Planar subassembly for testing IC chips having faces with pressed e...