Jim Hofmann

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of forming capacitors, and methods of utilizing silicon diox...
- Patent number 8,183,157
- Issue date May 22, 2012
- Micron Technology, Inc.
- Naraji B Rana
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods of utilizing silicon dioxide-containing masking structures
- Patent number 8,026,148
- Issue date Sep 27, 2011
- Micron Technology, Inc.
- Niraj B. Rana
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods and tools for controlling the removal of material from micr...
- Patent number 7,988,529
- Issue date Aug 2, 2011
- Micron Technology, Inc.
- Nagasubramaniyan Chandrasekaran
- B24 - GRINDING POLISHING
Information Patent Grant
Methods of forming capacitors
- Patent number 7,892,937
- Issue date Feb 22, 2011
- Micron Technology, Inc.
- Niraj Rana
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and device for preventing junction leakage in field emission...
- Patent number 7,629,736
- Issue date Dec 8, 2009
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for monitoring and controlling mechanical o...
- Patent number 7,625,495
- Issue date Dec 1, 2009
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Method for enhancing electrode surface area in DRAM cell capacitors
- Patent number 7,573,121
- Issue date Aug 11, 2009
- Micron Technology, Inc.
- Donald L Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and tools for controlling the removal of material from micr...
- Patent number 7,527,545
- Issue date May 5, 2009
- Micron Technology, Inc.
- Nagasubramaniyan Chandrasekaran
- B24 - GRINDING POLISHING
Information Patent Grant
Extended Kalman filter incorporating offline metrology
- Patent number 7,329,168
- Issue date Feb 12, 2008
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Preventing junction leakage in field emission devices
- Patent number 7,268,482
- Issue date Sep 11, 2007
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for monitoring and controlling mechanical o...
- Patent number 7,261,832
- Issue date Aug 28, 2007
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Method for enhancing electrode surface area in DRAM cell capacitors
- Patent number 7,148,555
- Issue date Dec 12, 2006
- Micron Technology, Inc.
- Donald L Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preventing junction leakage in field emission devices
- Patent number 7,098,587
- Issue date Aug 29, 2006
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended kalman filter incorporating offline metrology
- Patent number 7,087,527
- Issue date Aug 8, 2006
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Semiconductor processing methods
- Patent number 7,067,426
- Issue date Jun 27, 2006
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Molds configured to pattern masses associated with semiconductor co...
- Patent number 6,989,595
- Issue date Jan 24, 2006
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preventing junction leakage in field emission devices
- Patent number 6,987,352
- Issue date Jan 17, 2006
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anodically-bonded elements for flat panel displays
- Patent number 6,981,904
- Issue date Jan 3, 2006
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for monitoring and controlling mechanical o...
- Patent number 6,858,538
- Issue date Feb 22, 2005
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Anodic bonding
- Patent number 6,823,693
- Issue date Nov 30, 2004
- Micron Technology, Inc.
- James J. Hofmann
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Method for making sol gel spacers for flat panel displays
- Patent number 6,812,990
- Issue date Nov 2, 2004
- Micron Technology, Inc.
- James J. Hofmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method for enhancing electrode surface area in DRAM cell capacitors
- Patent number 6,794,704
- Issue date Sep 21, 2004
- Micron Technology, Inc.
- Donald L. Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anodically bonded elements for flat-panel displays
- Patent number 6,734,619
- Issue date May 11, 2004
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for monitoring and controlling mechanical o...
- Patent number 6,720,266
- Issue date Apr 13, 2004
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Methods of forming patterns and molds for semiconductor constructions
- Patent number 6,716,754
- Issue date Apr 6, 2004
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of preventing junction leakage in field emission devices
- Patent number 6,712,664
- Issue date Mar 30, 2004
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for monitoring and controlling mechanical o...
- Patent number 6,699,791
- Issue date Mar 2, 2004
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Grant
Methods for fabricating spacer support structures and flat panel di...
- Patent number 6,561,864
- Issue date May 13, 2003
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of anodically bonding elements for flat panel displays
- Patent number 6,554,671
- Issue date Apr 29, 2003
- Micron Technology, Inc.
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for in-situ control of mechanical or chemical-m...
- Patent number 6,547,640
- Issue date Apr 15, 2003
- Micron Technology, Inc.
- Jim Hofmann
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Method of Forming Capacitors, and Methods of Utilizing Silicon Diox...
- Publication number 20110143543
- Publication date Jun 16, 2011
- Micro Technology Inc.
- NIRAJ RANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Utilizing Silicon Dioxide-Containing Masking Structures
- Publication number 20110111597
- Publication date May 12, 2011
- Micron Technology, Inc.
- Niraj Rana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods Of Forming Capacitors, And Methods Of Utilizing Silicon Dio...
- Publication number 20100099232
- Publication date Apr 22, 2010
- Niraj Rana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND TOOLS FOR CONTROLLING THE REMOVAL OF MATERIAL FROM MICR...
- Publication number 20090181601
- Publication date Jul 16, 2009
- Micron Technology, Inc.
- Nagasubramaniyan Chandrasekaran
- B24 - GRINDING POLISHING
Information Patent Application
Methods and tools for controlling the removal of material from micr...
- Publication number 20080051007
- Publication date Feb 28, 2008
- Micron Technology, Inc.
- Nagasubramaniyan Chandrasekaran
- B24 - GRINDING POLISHING
Information Patent Application
Method for enhancing electrode surface area in DRAM cell capacitors
- Publication number 20070048955
- Publication date Mar 1, 2007
- Micron Technology, Inc.
- Donald L. Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for enhancing electrode surface area in DRAM cell capacitors
- Publication number 20060292875
- Publication date Dec 28, 2006
- Micron Technology, Inc.
- Donald L. Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED KALMAN FILTER INCORPORATING OFFLINE METROLOGY
- Publication number 20060246820
- Publication date Nov 2, 2006
- Micron Technology, Inc.
- Jim Hofmann
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of preventing junction leakage in field emission devices
- Publication number 20060226761
- Publication date Oct 12, 2006
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED KALMAN FILTER INCORPORATING OFFLINE METROLOGY
- Publication number 20060191870
- Publication date Aug 31, 2006
- Micron Technology, Inc.
- Jim Hofmann
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of preventing junction leakage in field emission devices
- Publication number 20060186790
- Publication date Aug 24, 2006
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for patterning dielectric material, and methods for alignin...
- Publication number 20060183331
- Publication date Aug 17, 2006
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Mold for forming spacers for flat panel displays
- Publication number 20060139561
- Publication date Jun 29, 2006
- James J. Hofmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Methods and apparatuses for monitoring and controlling mechanical o...
- Publication number 20060121632
- Publication date Jun 8, 2006
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Application
Methods for aligning semiconductor fabrication molds and semiconduc...
- Publication number 20060113621
- Publication date Jun 1, 2006
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Methods for forming molds
- Publication number 20060038316
- Publication date Feb 23, 2006
- Micron Technology, Inc.
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Extended kalman filter incorporating offline metrology
- Publication number 20050284569
- Publication date Dec 29, 2005
- Micron Technology, Inc.
- Jim Hofmann
- G05 - CONTROLLING REGULATING
Information Patent Application
Anodic bonding
- Publication number 20050161153
- Publication date Jul 28, 2005
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for making sol gel spacers for flat panel displays
- Publication number 20050112298
- Publication date May 26, 2005
- Micron Technology, Inc.
- James J. Hofmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Anodic bonding
- Publication number 20050082581
- Publication date Apr 21, 2005
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor processing methods
- Publication number 20050026438
- Publication date Feb 3, 2005
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Methods of forming patterns for semiconductor constructions; and mo...
- Publication number 20040214440
- Publication date Oct 28, 2004
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Anodically-bonded elements for flat panel displays
- Publication number 20040058613
- Publication date Mar 25, 2004
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Extended kalman filter incorporating offline metrology
- Publication number 20040043700
- Publication date Mar 4, 2004
- Jim Hofmann
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and apparatuses for monitoring and controlling mechanical o...
- Publication number 20030219962
- Publication date Nov 27, 2003
- Jim Hofmann
- B24 - GRINDING POLISHING
Information Patent Application
Method for enhancing electrode surface area in DRAM cell capacitors
- Publication number 20030203508
- Publication date Oct 30, 2003
- Micron Technology, Inc.
- Donald L. Yates
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of preventing junction leakage in field emission devices
- Publication number 20030184213
- Publication date Oct 2, 2003
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming patterns for semiconductor constructions; and mo...
- Publication number 20030176014
- Publication date Sep 18, 2003
- James J. Hofmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Anodically bonded elements for flat-panel displays
- Publication number 20030141806
- Publication date Jul 31, 2003
- James J. Hofmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for enhancing electrode surface area in DRAM cell capacitors
- Publication number 20030134436
- Publication date Jul 17, 2003
- Donald L. Yates
- H01 - BASIC ELECTRIC ELEMENTS

Jim Hofmann

Person

Patents Grantslast 30 patents

Method of forming capacitors, and methods of utilizing silicon diox...

Methods of utilizing silicon dioxide-containing masking structures

Methods and tools for controlling the removal of material from micr...

Methods of forming capacitors

Method and device for preventing junction leakage in field emission...

Methods and apparatuses for monitoring and controlling mechanical o...

Method for enhancing electrode surface area in DRAM cell capacitors

Methods and tools for controlling the removal of material from micr...

Extended Kalman filter incorporating offline metrology

Preventing junction leakage in field emission devices

Methods and apparatuses for monitoring and controlling mechanical o...

Method for enhancing electrode surface area in DRAM cell capacitors

Preventing junction leakage in field emission devices

Extended kalman filter incorporating offline metrology

Semiconductor processing methods

Molds configured to pattern masses associated with semiconductor co...

Method of preventing junction leakage in field emission devices

Anodically-bonded elements for flat panel displays

Methods and apparatuses for monitoring and controlling mechanical o...

Anodic bonding

Method for making sol gel spacers for flat panel displays

Method for enhancing electrode surface area in DRAM cell capacitors

Anodically bonded elements for flat-panel displays

Methods and apparatuses for monitoring and controlling mechanical o...

Methods of forming patterns and molds for semiconductor constructions

Process of preventing junction leakage in field emission devices

Methods and apparatuses for monitoring and controlling mechanical o...

Methods for fabricating spacer support structures and flat panel di...

Method of anodically bonding elements for flat panel displays

Devices and methods for in-situ control of mechanical or chemical-m...

Patents Applicationslast 30 patents

Method of Forming Capacitors, and Methods of Utilizing Silicon Diox...

Methods of Utilizing Silicon Dioxide-Containing Masking Structures

Methods Of Forming Capacitors, And Methods Of Utilizing Silicon Dio...

METHODS AND TOOLS FOR CONTROLLING THE REMOVAL OF MATERIAL FROM MICR...

Methods and tools for controlling the removal of material from micr...

Method for enhancing electrode surface area in DRAM cell capacitors

Method for enhancing electrode surface area in DRAM cell capacitors

EXTENDED KALMAN FILTER INCORPORATING OFFLINE METROLOGY

Method of preventing junction leakage in field emission devices

EXTENDED KALMAN FILTER INCORPORATING OFFLINE METROLOGY

Method of preventing junction leakage in field emission devices

Methods for patterning dielectric material, and methods for alignin...

Mold for forming spacers for flat panel displays

Methods and apparatuses for monitoring and controlling mechanical o...

Methods for aligning semiconductor fabrication molds and semiconduc...

Methods for forming molds

Extended kalman filter incorporating offline metrology

Anodic bonding

Method for making sol gel spacers for flat panel displays

Anodic bonding

Semiconductor processing methods

Methods of forming patterns for semiconductor constructions; and mo...

Anodically-bonded elements for flat panel displays

Extended kalman filter incorporating offline metrology

Methods and apparatuses for monitoring and controlling mechanical o...

Method for enhancing electrode surface area in DRAM cell capacitors

Method of preventing junction leakage in field emission devices

Methods of forming patterns for semiconductor constructions; and mo...

Anodically bonded elements for flat-panel displays

Method for enhancing electrode surface area in DRAM cell capacitors